Personal tools
You are here: Home Awards M&M 2009 Awards MAS Outstanding Paper Awards - M&M 2009

MAS Outstanding Paper Awards - M&M 2009


 

M&M 2009 logo

 


Microscopy & Microanalysis 2009
Richmond, VA


 

Castaing Award       ♦       Best Student Paper
Sponsored by cameca-logo.gif
H. L. Xin, D. A. Muller, Cornell University
Aberration-corrected STEM Imaging and 2-D Elemental-resolved Valence-EELS Mapping of Ru-TaN Ultrathin Barrier Layer



Birks Award       ♦       Best Contributed Paper
Sponsored by jeol-logo.gif
M. Takeguchi, A. Hashimoto, K. Mitsuishi, National Institute for Materials Science, Tsukuba, Japan
M. Shimojo, Saitama Institute of Technology, Saitama, Japan

Development of Annular Dark Field Confocal Scanning Transmission Electron Microscopy



Cosslett Award       ♦       Best Invited Paper
Sponsored by MAS
E. Oltman, R. M. Ulfig, D. J. Larson, Imago Scientific Instruments
Background Removal Methods Applied to Atom Probe Data



Macres Award       ♦       Best Instrumentation/Software Paper
Sponsored by oxford-logo.gif
A. Winkelmann, Max-Planck-Institut fuer Mikrostrukturphysik, Germany
Information Depth and Kikuchi Band Contrast in Electron Backscatter Diffraction Patterns

 

Document Actions