MAS Outstanding Paper Awards - M&M 2009

Microscopy & Microanalysis 2009
Richmond, VA

Castaing Award       ♦       Best Student Paper
Sponsored by
H. L. Xin, D. A. Muller, Cornell University
Aberration-corrected STEM Imaging and 2-D Elemental-resolved Valence-EELS Mapping of Ru-TaN Ultrathin Barrier Layer

Birks Award       ♦       Best Contributed Paper
Sponsored by
M. Takeguchi, A. Hashimoto, K. Mitsuishi, National Institute for Materials Science, Tsukuba, Japan
M. Shimojo, Saitama Institute of Technology, Saitama, Japan
Development of Annular Dark Field Confocal Scanning Transmission Electron Microscopy

Cosslett Award       ♦       Best Invited Paper
Sponsored by MAS
E. Oltman, R. M. Ulfig, D. J. Larson, Imago Scientific Instruments
Background Removal Methods Applied to Atom Probe Data

Macres Award       ♦       Best Instrumentation/Software Paper
Sponsored by
A. Winkelmann, Max-Planck-Institut fuer Mikrostrukturphysik, Germany
Information Depth and Kikuchi Band Contrast in Electron Backscatter Diffraction Patterns