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MAS Outstanding Paper Awards - M&M 2009


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Microscopy & Microanalysis 2009
Richmond, VA


Castaing Award       ♦       Best Student Paper
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H. L. Xin, D. A. Muller, Cornell University
Aberration-corrected STEM Imaging and 2-D Elemental-resolved Valence-EELS Mapping of Ru-TaN Ultrathin Barrier Layer

Birks Award       ♦       Best Contributed Paper
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M. Takeguchi, A. Hashimoto, K. Mitsuishi, National Institute for Materials Science, Tsukuba, Japan
M. Shimojo, Saitama Institute of Technology, Saitama, Japan

Development of Annular Dark Field Confocal Scanning Transmission Electron Microscopy

Cosslett Award       ♦       Best Invited Paper
Sponsored by MAS
E. Oltman, R. M. Ulfig, D. J. Larson, Imago Scientific Instruments
Background Removal Methods Applied to Atom Probe Data

Macres Award       ♦       Best Instrumentation/Software Paper
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A. Winkelmann, Max-Planck-Institut fuer Mikrostrukturphysik, Germany
Information Depth and Kikuchi Band Contrast in Electron Backscatter Diffraction Patterns


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