Personal tools
You are here: Home → Awards → M&M 2010 Awards → MAS Distinguished Scholar Award 2010
MAS Annual Meeting
MM2012-logo.jpg
 

MAS Distinguished Scholar Award 2010




MM2010-logo.jpg

Microscopy & Microanalysis 2010
Portland, OR


 

Peter J. Felfer       ♦       University of Sydney, Australia
Atomic Resolution Grain Boundary Analysis using Atom Probe Tomography

Kameswaran Jai Ganesh       ♦       University of Texas at Austin
Automated Local Texture and Stress Analysis in Cu Interconnects using D-STEM and Precession Microscopy

Julia A. Mundy       ♦       Cornell University
Spectroscopic Imaging of a Statistically Significant Ensemble of Pt-Co Nanoparticles by Aberration Corrected STEM

Philippe T. Pinard       ♦       McGill University, Canada
An API/GUI for Monte Carlo Simulation of EPMA Spectra using PENELOPE

Michael Robinson       ♦       University of Washington
3D Cellular Imaging using Time-of-Flight Secondary Ion Mass Spectrometry


Document Actions
Spotlight

Please thank our
Sustaining Members!