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Peter Duncumb Award for Excellence in Microanalysis 2010


David Joy


 

David C. Joy

David Joy holds joint appointments as Distinguished Professor at the University of Tennessee, Knoxville and Distinguished Scientist at the Oak Ridge National Laboratory. Throughout his exceptional career he has been one of the most creative and productive researchers in the fields of scanning electron microscopy (SEM), analytical electron microscopy, and microanalysis based upon electron spectrometry and X-ray spectrometry. He has contributed in significant ways to the development of quantitative analysis with electron energy loss spectrometry, contributions to detectors in the SEM, the science involved with electron-beam interactions, contrast mechanisms and applications of SEM to the study of electronic materials.

In his very successful D. Phil. research program in the Dept. of Metallurgy and Materials Science at Oxford, David made many of the original observations and developed a theoretical understanding of magnetic contrast and electron channeling contrast in the scanning electron microscope. As an Oxford post-doctoral fellow, David led the project that resulted in the construction and operation of the first successful field emission scanning transmission electron microscope (STEM) in Europe. Upon emigrating to America, David joined the research staff of Bell Laboratories for its last glorious years, where he made numerous contributions to the development of high energy beam analytical electron microscopy. His achievements include some of the earliest quantitative elemental measurements of thin foils with energy dispersive X-ray spectrometry as well as practical analysis with electron energy loss spectrometry (EELS). He developed designs for scanning and parallel energy loss spectrometers as well as EELS spectral background correction and quantification procedures. Simultaneously, David maintained an extremely active program in scanning electron microscopy, especially for applications to semiconductor materials and devices, with broadly ranging contributions to beam-specimen interactions, detectors, contrast mechanisms, image interpretation, STEM-in-SEM, and X-ray microanalysis. David has been a lecturer at the Lehigh Microscopy Summer School for more than 30 years and is consistently rated as one of the best instructors demonstrating his ability to educate undergraduates, graduate students, and industrial participants is without comparison. His current research interests include Monte Carlo modeling for electron and ion imaging and microanalysis, high performance microscopy using both electron and ion beams, and nano-scale metrology.

Throughout his career, David has been an enormously prolific writer of highly regarded scientific papers as he has authored and/or edited nine books and published over 400 papers. He has given service to the community by serving as President of both MAS and MSA as well as Editor-in-Chief of Scanning. He is a Fellow of both The Microscopy Society of America and the Royal Microscopical Society. Importantly, he is known as willing to give of himself to provide education and leadership in his field. His quick mind and gracious personality have attracted him to his many colleagues and friends. In summary, the fields of scanning electron and ion microscopy and microanalysis have benefited enormously from the extraordinary research, teaching, and leadership of Prof. David C. Joy.

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