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M&M 2015 Best Paper Awards

Castaing, Birks, Cosslett and Macres Award winners


Microscopy & Microanalysis 2015

Portland, OR


Awarded at M&M 2016, Columbus, OH


Castaing Award       ♦       Best Student Paper 
Sponsored by cameca-logo.gif 

J. B. Lewis, Laboratory for Space Sciences, Physics Department, Washington University, St. Louis, MO, USA.

Atom-Probe Tomography Measurements of Isotopic Ratios of High-field Materials with Corrections and Standardization: a Case Study of the 12C/13C of Meteoritic Nanodiamonds


Birks Award       ♦       Best Contributed Paper 
Sponsored by jeol-logo.gif 

Jorg M. Wiezorek1, K. W. Zweiacker1, M. A. Gordillo1, C. Liu1, J. T. McKeown2, G. H. Campbell2, T. LaGrange3, B. W. Reed3

1. University of Pittsburgh, Pittsburgh, PA, USA
2. Lawrence Livermore National Laboratory, Livermore, CA, USA
3. Integrated Dynamic Electron Solution, Inc, Pleasanton, CA, USA
Quantitative Phase Analysis of Rapid Solidification Products in Al-Cu Alloys by Automated Crystal Orientation Mapping in the TEM.

Cosslett Award       ♦       Best Invited Paper 
Sponsored by MAS 

Alexander S Eggeman1, Duncan Johnstone1, Robert Krakow1, Jing Hu2, Sergio Lozano-Perez2 Chris Grovenor2 and Paul A. Midgley1
1. Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK
2. Department of Materials Science, University of Oxford, Oxford, UK

Decomposing Electron Diffraction Signals in Multi-Component Microstructures

Macres Award       ♦       Best Instrumentation/Software Paper 

Sponsored by oxford-logo.gif 

Alexi Valery1,2, E. F. Rauch2, A. Pofelski1, L. Clément1, F. Lorut1
1. STMicroelectronics, 850 rue Jean Monnet, F-38920 Crolles, France.
2. SIMAP/GPM2 laboratory, 101 rue de la Physique, 38402 Saint Martin d'Hères, France.
Dealing With Multiple Grains in TEM Lamellae Thickness for Microstructure Analysis Using Scanning Precession Electron Diffraction
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