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MicroNews Nov 1996




Fall 1996 Newsletter

of the Microbeam Analysis Society

In this issue:


Dear Colleagues:

The first joint meeting between MAS and MSA under the new meeting format was held in Minneapolis. Microscopy and Microanalysis 1996, is now behind us and by all accounts was a great success. Minneapolis proved to be a very nice city for a meeting. I'd like to thank the MAS members who contributed many of the excellent papers presented at the meeting. Jon McCarthy, Dale Johnson and Ev Osten deserve a special thanks for arranging the MAS social in the Convention Center which was very successful. The Local Arrangements Committee and the Program Committee both did excellent jobs in putting the meeting together. Total scientific attendance was close to 1500, making this one of the largest joint meetings between MAS and MSA, second only to the Boston meeting in 1992. In conjunction with Microscopy and Microanalysis 1996, MAS held its first pre-meeting topical conference, "Microscopy and Microanalysis on the World Wide Web," which had over 50 participants and covered topics on using the web as a resource as well as how to create web pages. I would like to extend the Society's thanks to John Mansfield for organizing this conference and to the speakers for their high quality presentations.

It is appropriate at this time to thank our two outgoing directors, Carol Swyt and Paul Hlava for their three years of service on the council. As directors, they have contributed greatly to the council. Paul Hlava will remain as the Director of the Affiliated Regional Societies and will continue to take care of the MAS Tour Speaker Program. Paul has once again lined up some great speakers and is currently trying to schedule their trips to the local societies. I would also like to extend the Society's thanks to Dale Johnson for serving as President and look forward to his continued involvement with the society as Past-President.

Jack Worrall has served for many years now as the MAS sustaining members liaison. Jack has made the decision to step down and let someone else have some fun. On behalf of MAS, I would like to sincerely thank Jack for his time and efforts and for a job well done. Cathy Johnson has agreed to take over this task from Jack.

Our Nominating Committee has presented us with an outstanding slate of candidates for our fall election. The nominating committee had selected two strong candidates for President and these two individuals were approved at the business meeting this summer. Unfortunately, one of the candidates had to withdraw from the election. Thus, Ryna Marinenko will be running unopposed for President. Ryna has been active in electron probe microanalysis at NIST for many years. Ryna has served as an MAS Director and has edited MicroNews for the past year. Our four excellent candidates for the two Director positions are Edgar Etz, Cathy Johnson, Richard Leapman and Don Parker. Harvey Freeman has agreed to again be nominated for Treasurer. I encourage you to take a few minutes and read the candidates qualifications and return the MAS election ballot. This is your chance to directly influence the future directions of MAS.

A number of developments are in the works concerning MAS involvement in a scientific Journal. Recent negotiations with MSA have resulted in a change in the title of the MSA Journal to Microscopy and Microanalysis. MSA has agreed to include the wording "Official Journal of the Microscopy Society of America and the Microbeam Analysis Society" on the inside front cover. This new Journal will provide MAS members with a forum for presenting their work that targets other researchers in the area of microanalysis. MSA members will receive this Journal with their membership dues. Members of MAS, who are not members of MSA, will have the option of receiving the Journal for an additional $15, a significant savings over the normal subscription rate. I would like to thank Charlie Lyman for his help in negotiating these agreements with MSA and the journal publisher.

Planning for Microscopy and Microanalysis 1997 in Cleveland is in full swing. The MAS co-chair for the meeting is Jon McCarthy. He has put together symposia topics that are exciting and of great interest to MAS members.

I would like to thank the membership of MAS for providing me with this opportunity to serve MAS as President. I encourage all of you to feel free to contact me with any Society issues that you feel are important and need to be addressed.


Joe Michael


MAS membership numbers are growing and we are slowly but surely collecting members that had been lost from the rolls over the years. At the MAS booth in Minneapolis, we signed up 16 new members and had even more members renew their membership at the meeting. John Mansfields WWW topical conference also netted several new members for the society. A nice benefit of membership was the MAS social enjoyed by MAS members at the Horizons area in the Minneapolis Convention Center at the Microscopy and Microanalysis meeting. Look for another benefit of membership coming soon to your mailbox - MAS Members Directory. The directory will be handy to find fellow members and if you dont find a colleague in the directory send them a copy of the membership form at the back of this issue of micronews. Renewals will be sent out soon, look for them in the mail and please return them promptly. Information on membership can be found on the www at:

email:, or phone 800-4MASMEM
The proceedings of the Microscopy and Microanalysis 96 meeting (ISSN0424-8201) were published by:
San Francisco Press Inc.
Box 426800
San Francisco CA 94142-6800
Please direct any inquiries to the publisher.


As I assemble my second issue of MicroNews, I want to thank several people who have contributed significantly to making this job easier. Firstly, I want to thank Don Grimes, editor of Microscopy Today, who has been a tremendous help to me and MAS in the printing and mailing of MicroNews. His help and suggestions have helped us get an excellent job done at reasonable costs. Secondly, I want to thank Scott Wight, Membership Services, who has put the mailing lists together in a format that assures inexpensive mailing cost with rapid delivery to members. And thirdly, I'd like to thank Inga Holl Musselman, the former editor of MicroNews, who provided me with excellent guidance and tons of organized MicroNews history to enable me to easily slide into this new job.

I was able for this issue to solicit meeting news from our affiliated regional societies, but only received four responses. For those of you responsible for local meetings, if you want me to include future meetings in MicroNews, send me the information by the end of January, May, or September. For those who have not received my solicitation via email, please send me your correct address. And to all members, please feel free to send me suggestions or information that you'd like to be included in MicroNews.

Ryna Marinenko
(301)975-3901, FAX: (301)417-1321




Dec. 2-6, 1996, Boston, MA
Contact: MRS, (412)367-3003, FAX (412)367-4373

Dec. 4-6, 1996, Durban, South Africa
Contact: Dr. Fiona Graham +27 31 260 2174, FAX +27 31 261 6550

Dec, 12-13, 1996, Ghent.
Contact: Nich Schryers,"BVM_SBM/prgr_net.html

(SPIE), Feb. 8-14, l997, San Hose, CA.
Contact: Marilyn Gorsuch (360)676-3290,
FAX (360)647-1445.

Feb. 9-13, l997, Orlando, FL
Contact: (412)776-9000, ext. 270/D.Steighner, ext. 210

Mar. 16-21, l997, Atlanta, GA
Contact: (412)825-3220, FAX (412)825-3224

Apr. 16-22, Warsaw, Poland
Contact Drzysto Rozniatowski, +48 22-660-52-82,
FAX +48 22-48-48-75, email:

Apr. 19-22, 1997, Monterey, CA
Contact: M. Sullivan (201)818-1010,
FAX (201)818-0086, email:

May 11-15, Torquay, UK.
Contact: EMAS Secretariat, FAX +32-3-820-23-76, email:

Oct. 20-24, l997, San Jose, CA
Contact: Ms. Marion Churchill, AVS, 120 Wall St. 32nd Floor, New York, NY 10005

Aug. 10-14, l997, Cleveland, OH

July 26-30, l998, Atlanta, GA

Aug. 1-5, 1999 Portland, OR

July 30-Aug. 3, 2000, Phildelphia, PA

Short Courses

Nov. 6-22, 1996, Scottsdale, AZ
Contact: F. Schaapur, (602)949-4203, FAX (602)473-9421

Dec. 4, l996, Iowa City, IA
Contact: (319)337-2474

June 9-20, 1997, Lehigh U., Bethlehem, PA
Contact: Prof. David Williams, Dept. of Matls. Sci. and Engineering, Lehigh U., 5 E. Packer Ave., Bethelehem, PA 18015-3195 (610)758-5133, FAX (610)758-4244;
Scanning Electron Microscopy and X-ray Microanaly-sis, June 9-13
Advanced Scanning Electron Microscopy with Digital Image Processing, June 16-19
Quantitative X-ray Microanalysis of Bulk Specimens and Particles, June 16-20
Analytical Electron Microscopy, Analysis of TEM Specimens, June 16-19
Atomic force Microscopy and Other Scanned Probe Microscopies, June 17-20

Affiliated Societies Activities

Microbeam Analysis Society of Southern California (MASSoC)
Nov. 28, l996, Peppermill Rest., Pasadena,CA

Appalachian Region Electron Microscopy Society (AREMS),
Spring l997 Meeting, Ashville, NC
Contact: Susan Read,

Instrumental Analysis Society (IAS]
Dec. 1996, Holidaty Meeting, Alcoa Lab Center, Alcoa PA; March, 1997, Spring Meeting; June 1997, Summer Meeting

Mid-Atlantic Microbeam Analysis Society[MAMAS]
May 15, 1997 NIST, Gaithersburg, MD
Contact: R. Marinenko, (301)975-3901,FAX (301)417-1321;

New England Society for Electron Microscopy (NESEM)
Dec. 6-7, l996, Fall Symposium, Sheraton Ferncroft, Danvers, MA; Imaging Seminar, Sat. , Dec. 7, l996, 9-11 am.
Contact: Linda Kirstein, Secretary, (508)473-9673

SouthEastern Microscopy Society (SEMS) Ann. Mtg.
May 14-16, l997, Holiday Inn, Columbia, SC
Contact: Robert Price, (803)733-3393,


Hello Everyone,

The 1997 Tour Speaker program is in full swing and several societies have already been visited by our speakers. For those of you who don't know yet, there are three MAS Tour Speakers for 1997 are Mike Kersker of JEOL, Inga Musselman of the Univ. of Texas at Dallas, and Dale Newbury of NIST. Abstracts and bios for these people are available from Paul Hlava via return email. I have already connected with my usual society contacts and most societies are making plans to host a speaker this year.

I am planning to make a more concerted effort this year to plan tour speaker trips so that several societies are hit in one loop. As soon as possible, I would like to have input from all the societies letting me know when they plan to have their spring meetings, who they wish for a speaker, and if their timing is flexible (to help me schedule multi-society tours). If anyone has questions about the tour speaker program, affiliating with MAS, or whatever, my contact info is published under Additional MAS Representatives in this newsletter.

Paul F. Hlava
Director of the Affiliated Regional Societies

MAS Tour Speakers:

Michael Kersker
200 KV FEG: Refried Beans with a Fiery New Salsa

Inga Holl Musselman
Atomic Force Microscopy: Introduction and Industrial Applications

Dale E. Newbury
Lies, Damned Lies, and "Standardless Analysis"



Harvey Yakowitz, 57, a founding member of the Electron Probe Analysis Society of America (EPASA, now the Microbeam Analysis Society, MAS), died on March 24, 1996 in Paris, France.

Harvey was born Feb. 1, 1939 in Baltimore, Maryland. He was educated at the University of Maryland, receiving his BS, MS, and Ph.D. degrees from that institution. He joined the National Bureau of Standards (NBS, now the National Institute of Standards and Technology, NIST) in 1959 during his graduate study. Harvey had an outstanding research career in the Metallurgy Division of NBS, where he developed and applied electron beam techniques to problems in the characterization of the microstructure of metals and materials. In 1982 he was selected to head the NBS Program Office as a member of the NBS Director's staff, and later that same year he was appointed head of the NBS Office of Recycled Materials. In 1983 he moved to Paris to serve as a U.S. Government representative to the Office of European Community Development, with a specialty in recycled materials. He retired from US Government service in May, 1992.

Harvey was an original member of the teaching staff of the Lehigh University Summer Schools on Electron Microscopy and Microanalysis, which began in 1970, and an author and editor of the first dedicated textbook on the subject, Practical Scanning Electron Microscopy (Plenum Press, New York, 1975). Harvey was a major contributor to the development of procedures for electron beam X-ray techniques for characterization of materials on the micrometer scale, including quantitative elemental measurements by electron probe microanalysis and crystallography by electron-excited Kossel patterns. He published more than 50 papers on these and related subjects, maintaining active collaborations with numerous colleagues at the National Bureau of Standards (NBS, now the National Institute of Standards and Technology, NIST), academia, and industry. With Robert Myklebust and Kurt Heinrich of NBS, Harvey created FRAME, one of the first successful small computer software implementations of the complex mathematics of the matrix corrections necessary to achieve quantitative electron probe X-ray microanalysis. This seminal work led directly to many of the advanced software systems now routinely used in this widely applied technique.

Harvey was always known for his creative, informative, and amusing technical presentations. He kept an audience's attention with numerous witty comments, as well as his use of the occasional novelty slide, to which many in the audience looked forward with anticipation. An example of his wit is well illustrated by the following anecdote. In the mid 1960s, Harvey was involved with the first summer school on electron optics held at the Massachusetts Institute of Technology. A costume party was organized in which attendees were to dress according to a theme associated with electron beam techniques. (e. g., one notorious founding father came dressed as a turn-of-the-century Boston policeman, sporting a copper badge emblazoned "K-alpha". He was, of course, "Copper K-alpha".) Despite this heavy competition, Harvey won the prize to universal acclaim with a costume consisting of black clothing and a trash can lid for a hat. He was a contamination spot.

Harvey is survived by his wife, Marilyn Cohen of Paris, France, and two children of his first marriage, Sura Yakowitz of Silver Spring, Maryland and David Yakowitz of Chicago, Illinois.

Dale Newbury




 Member Dues (550 Regular, 32 Student, 9 Emeritus)  $13875
 Sustaining Members (35)  $12250
 Paper Award Reimbursements  $1500
 Investment Income (Schwab and Rochester bank)  $8500
 Total  $36125


 Accounting, Business, Dues, and Legal  $4500
Paper Awards  $1500
 Bank Service Charges, VISA/MC  $ 300
 Liability Insurance  $700
 Executive Council Expenses
Winter Council, Annual Meeting, Affiliates, Sustaining Members
 Miscellaneous Executive Council Expenses  $200
 Tour Speakers  $6000
 Membership Office  $1000
 WWW Annual Support  $1500
 MicroNews, printing & mailing  $4000
 Student Awards/Support at M and M '97  $6200
 Topical Conference at M and M '97  $2700
 Computer Workshop at M and M '97  $2000
 Social at M and M '97  $5000
 Journal: Associate Editor Expenses  $2000
 Total  $49600

Harvey A. Freeman, Treasurer





Ryna B. Marinenko

Ryna Marinenko has been a member of MAS since 1974 when she started working in the field of x-ray microanalysis in what was then the Microanalysis Section at the National Bureau of Standards (NBS). From 1990-1992 she served as an MAS director when timely issues were facing MAS including the beginning of our first journal, Microbeam Analysis. She was an MAS Tour Speaker in 1992 and served in 1994-5 on the MAS Meeting Committee which evaluated the future MAS national meeting commitments. She has attended MAS national meetings regularly where she has chaired sessions and presented papers. Since the spring of 1996 she has been the editor of MicroNews, and during the past four years she has organized meetings for the local affiliated regional society, the MAMAS (Mid-Atlantic Microbeam Analysis Society) in conjunction with the Surface and Microanalysis Science Division at NIST(formerly NBS).

Ryna's commitment to MAS has been and will be to support and maintain the financial and professional integrity of the organization. This includes supporting a strong technical program (with special topics and tutorials) and commercial exhibit at national meetings in cooperation with MSA and/or other professional organizations when necessary, supporting and encouraging the development of our affiliated regional societies as well as their participation at the national level, encouraging student participation in MAS, and supporting our new journal format. She believes MAS should reach out to all members of the society for new ideas and participation.

Her education includes a BA degree from Wells College, Aurora, NY in 1964 and a Ph.D. in Analytical Chemistry from Georgetown U. in 1974. She worked for two years (1964-66) in the Conservation Analytical Laboratory of the Smithsonian Institution before attending graduate school full time and returned to part-time work at the Smithsonian while still in graduate school. In 1972 she began working in what was then the Gas Analysis Group at NBS under a Presidential Internship until joining Kurt Heinrich's section in 1974. Her work and research has been concerned with quantitative WDS and EDS x-ray microanalysis with the electron microprobe for certifying standards for microanalysis, improving quantitative analysis procedures, developing digital WDS compositional mapping, and studying specimen homogeneity.


Harvey Freeman

Harvey Freeman retired in 1993 from an active career in microscopical research. He graduated from Haverford College and received an MS degree in geology and mineralogy from the University of Rochester. After teaching briefly at Bucknell University and with the evening school of the Pennsylvania State University, he conducted optical and electron microscopical research in ceramics at Harbison-Walker Refractories Company in Pittsburgh. Subsequently, he continued microscopical research at Dow Corning Corporation in Midland, Michigan. He is an author of 19 publications and 4 patents.

Harvey is an Emeritus member of both MAS and MSA. He served MAS as LAC Co-Chair of the 1988 joint meeting in Milwaukee and was for 10 years the liaison with Sustaining Members of the Society. He has been Treasurer of MAS and a member of the Executive Council since 1988. He was the recipient of the 1993 Presidential Service Award at the annual meeting in Los Angeles. Although presently retired on Cape Cod in Massachusetts, Harvey continues to be active in affairs of the Society.


Edgar S. Etz

Edgar Etz is a research chemist at the Chemical Science and Technology Laboratory of the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland. There he is a member of the Microanalysis Research Group within the Surface and Microanalysis Science Division. He came to NIST (then the National Bureau of Standards, NBS) in 1969 and worked for several years in electroanalytical chemistry. Beginning in 1974, he became involved in analytical spectroscopy through his role in the development of the NBS Raman microprobe. He has been in the Raman microanalysis field ever since, with focus on the advancement of optical microprobe instrumentation and methodology, and the integration of the optical methods with the electron- and ion-beam techniques.

Edgar has been an active member of the MAS since 1977. In large measure he has been responsible for introducing the optical microprobe techniques (initially micro-Raman and luminescence, later on FT-IR microspectroscopy) as a topical area into the scientific agenda of the MAS. In 1995, he was the Technical Program Chair of the MAS meeting in Breckenridge, Colorado. Presently, for next year's Microscopy & Microanalysis-97 joint MAS/MSA Conference in Cleveland, he is involved in the organization of the "Optical Microanalysis" symposium. He was for a number of years the North American Editor of Mikrochimica Acta and also served on the Editorial Advisory Board of the Society's journal Microbeam Analysis.

Edgar's research interests have focused on the application of micro-Raman techniques to problems in materials characterization. His work centers on environmental particulate pollution studies, compositional/structural analysis of high-tech materials, and molecular microanalysis of biological and pathological tissues. Various publications have resulted from his work. He received his Ph.D. degree in chemistry from Clarkson College of Technology (now Clarkson University), Potsdam, New York and spent a year as a postdoctoral research associate at the University of Florida, Gainesville. He is a member of several professional societies, among them the ACS, SAS, and ASTM.

Cathy Johnson

Cathy Johnson received a bachelor's degree in chemistry from the University of Colorado, Boulder in 1980. She spent three years in the field of geochemistry as an analytical chemist before accepting a position with the Gates Rubber Co. in 1983. She is currently a Sr. Research Chemist in the Adv.Tech.& Eng. Div., Materials Analysis Dept. She is the technical lead of the Microscopy Lab which includes light microscopy and SEM/EDS. Her current work focuses on polymer product failure analysis and new product development for automotive and industrial applications.

Cathy has been an active member of MAS since 1989. She has served as secretary ('90-'92) and president ('93-'96) of the local joint affiliate society, COMAS/MSSEM. She was also an LAC organizer and treasurer for the 1995 MAS Breckenridge meeting. She will be serving as the new MAS sustaining members chair in the coming year.

Cathy is interested in obtaining more society participation from students and analysts. She would like meetings to incorporate more presentations that address analytical methods for practical problem solving to provide for better training of laboratory analysts and support staff. Her other professional affiliations include the American Chemical Society and the American Institute of Chemists.

Richard Leapman

Richard Leapman is head of the Analytical Electron Microscopy Resource at the National Institutes of Health. He received a BA in natural sciences from the University of Cambridge in 1973 and a Ph.D. in physics from the Cavendish Laboratory, University of Cambridge in 1977. His dissertation demonstrated for the first time how electron energy-loss spectroscopy could be used for quantitative microanalysis of materials. He spent one year applying these methods at the Department of Metallurgy and Materials Science in Oxford University before moving to Prof. Silcox's group at the School of Applied and Engineering Physics in Cornell University (1977-1979) where he developed techniques for characterizing electronic structure of materials using EELS. Since moving to the NIH in 1980, Richard has been developing nano-spectroscopy combined with scanning transmission electron microscopy and applying these methods to analyze biological systems. In recent work he has demonstrated near single atom sensitivity with this approach.

Richard received the Burton Medal from the Microscopy Society of America in 1986, the Birks Award from MAS in 1986 and the Heinrich Award for the Outstanding Young MAS Scientist in 1989. He also received the Samuel Wesley Stratton Award from the National Institute of Standards & Technology in 1994 and the NIH Directors Award in 1995 for his work on high resolution microanalysis. Richard has been an active member of MAS since 1980 and has attended nearly every annual meeting over the past fifteen years. He has served on the MAS program committee and has frequently organized symposia at MAS meetings. If elected an MAS Director, he would encourage young scientists to join the society by helping to create strong programs at the annual meeting and at topical conferences.

Donald L. Parker

Don Parker is Technical Associate in Monsanto Company's Analytical Science Center, located in St.Louis, MO. He manages and specializes in the application of the electron microprobe along with coordination of analytical activities for ongoing refractory studies.

Educated in the University of Missouri system, he's been active in the field of electron beam techniques for over 30 years. He has been an active member of MAS going back to its predecessor organization EPASA. Quantitation of element mapping and imaging procedures has long been of keen interest. Techniques developed in this area at the Monsanto laboratories have been the subject of many presentations at national and local meetings.

Don is Chairman of the local society MIKMAS (Missouri, Illinois, Kansas MAS) and has served as Local Area Representative for MAS for the past three years. He has served as consultant to local forensic laboratories and recently participated on an NTSB investigation team. He has published 16 scientific publications on a range of topics including microbeam applications to alloy development and corrosion, quantitative imaging applications and x-ray diffraction techniques. Don has long been an advocate of expanding the influence of the local chapters in the society activities along with development of student activities within the microanalytical community.


Joe R. Michael
Sandia National Laboratories
P.O.Box 5800
Albuquerque, NM 87185-1405
(505)844-9115 FAX: (505)-844-2974

Dale E. Johnson
Graduate School AG-10
University of Washington
Seattle, WA 98195
(206)543-5900 FAX: (206)685-3234

Harvey A. Freeman
958 Long Pond Road
Brewster, MA 02631-1898
(508)896-9060 FAX: (508)432-8951

Inga Holl Musselman
Chemistry Program, BE 26
University of Texas at Dallas
P. O. Box 830688
Richardson, TX 75083-0688
(214)883-2706 FAX: (214)883-2925


Joseph D. Geller (1995-7)
426e Boston Street
Topsfield, MA 01983-1212
(508)887-7000 FAX: (508)887-7000

John F. Mansfield (1995-7)
U. of Michigan, North Campus EMAL, 417 SRB
2455 Hayward
Ann Arbor, MI 48109-2143
(313)936-3352 FAX: (313)936-3352

Greg Meeker (1996-8)
U. S. Geological Survey; MS 903
Denver Federal Center
Denver, CO 80225
(303) 236-1081 or -3188

Richard W. Linton (1996-8)
Department of Chemistry- CB3290
University of North Carolina
Chapel Hill, NC 27599-3290
Phone: 919-962-4619 FAX: 919-962-0488


Accountant, Dues and Mailing List
William S. Thompson
c/o Microbeam Analysis Society
P.O. Box 502
Fairport, NY 14450-0502

Affiliated Regional Societies
Paul Hlava
(505)844-1890 FAX: (505)844-2974

Awards Committee for MAS 1997
Joseph D. Geller (see Directors)
(508)887-7000 FAX: (508)887-7000
John F. Mansfield (see Directors)
(313)936-3352 FAX: (313)936-3352

Computer Activities Committee
John F. Mansfield (see Directors)
(313)936-3352 FAX: (313)763-5567
Paul Carpenter
(818)395-6126 FAX: (818)568-0935

Conference Proceedings Inventory
C. Susskind
San Francisco Press, Inc.
Box 6800
San Francisco, CA 94101-6800

Corporate Liason Committee
Thomas G. Huber
11 Dearborn Road
Peabody, MA 01960
(508)535-5900 FAX:(508)536-2205

Education Committee
Phillip E. Russell
Department of Materials Science and Engineering
P.O. Box 7916
North Carolina State University
Raleigh, NC 27695-7916
(919)515-7501 FAX: (919)515-2932

Finance Committee, Archivist
Gordon Cleaver
GE Vallecitos Nuclear Center
P. O. Box 460, MC V08
Pleasanton, CA 94566
(510)862-4320 FAX: (510)862-4244

Art Chodos
302 Acorn Circle
Monrovia, CA 91016-1807

International Liaison
David B. Williams
Department of Materials Science and Engineering
5 East Packer Avenue
Lehigh University
Bethlehem, PA 18015-3195
(610)758-4224 FAX: (610)758-4244

Long Range Planning Committee
John A. Small
National Institute of Standards and Technology
Bldg 222, Rm. A113
Gaithersburg, MD 20899
(301)975-3900 FAX: (301)216-1134

MAS-MSA Liason, Nominations and
Presidents Award
Joe R. Michael(see President)
(505)844-9115 FAX: (505)-844-2974

Membership Services
Scott Wight
P.O. Box 3552
Gaithersburg, MD 20885

MicroNews Editor
Ryna B. Marinenko
NIST; Bldg.222 Rm. A113
Gaithersburg, MD 20899
(301)975-3901 FAX (301)417-1321

Sustaining Membership Committee
Cathy Johnson
Gates Rubber Company
990 So. Broadway
Denver, CO 80217
(303)744-4592 FAX (303)744-5808


Appalachian Region Electron Microscopy Society (AREMS)
Denis Barr (President)
Eastman Chemical Company
Physical and Analytical Chemistry
PO Box 1972
Kingsport, TN 37662-5150
423/229-2188 FAX: 423/299-4558

Arizona Imaging and Microanalysis Society (AIMS)
Claire Payne (President)
Department of Micbiology & Immunology
Room 6111
College of Medicine
University of Arizona
Tucson, AZ 85724
(520)626-2870 FAX: (520)626-2100

Canadian Microbeam Analysis Society (CanMAS)
Rod Packwood
MTL - Canmet - EMR
555 Booth Street
Ottawa, Ontario K1A 091, Canada
(613)992-2288 FAX: (613)992-8735

Cleveland Microbeam Analysis Society (CleveMAS)
James D. Eisner
The Geon Co.
Avon Lake Technical Center
P. O. Box 122
Avon Lake, OH 44012
(216)930-1605 FAX: (216)930-1644

Colorado Microbeam Analysis Society (CoMAS)
Greg Meeker (MAS Rep)
US Geological SurveyMS903
Denver Federal Center
Box 25046
Denver, CO 80225
(303)236-1081 FAX: (303)236-1414
(303)236-3187 Probe Lab

Instrumental Analysis Society (IAS)
Liz Goodwin (Secretary)
R. J. Lee Instruments
515 Pleasant Valley Road
Trafford, PA 15085
(412)744-0100 FAX: (412)744-0506

Louisiana Society for Microscopy (LSM)
Joe Mascorro (President)
Department of Anatomy
Tulane University - School of Medicine
1430 Tulane Avenue
New Orleans, LA 70112
(504)584-2747 FAX: (504)584-1687

Metropolitan Microscopy Society (M2S)
Phillip L. Flaitz (Co-Chairman)
IBM Analytical Services Group
1580 Route 52 - Z/E40
Hopewell Junction, NY 12533
(914)892-3094 FAX: (914)892-2555

Michigan Electron Microscopy Society (MEMS)
John Blackson (President)
MEMS President
The Dow Chemical Company
Building 1897
Midland MI 48667
(517)636-6316 FAX: (517)638-6443

Microbeam Analysis Society of Australia (AusMAS)
Clive Nockolds
Electron Microscope Unit
University of Sydney
Sydney, NSW, Australia
61-02-351-2351 FAX: 61-02-552-1967

Microbeam Analysis Society of Southern California (MASSoC)
Jack Worrall
USC-CEMMA, University Park
Los Angeles, CA 90089-0539
FAX: 213/740-7797

Microscopy Society of the Ohio River Valley (MSORV)
Scott D. Walck
Materials Directorate
2941 P St Ste 1
Wright Patterson Air Force Base, OH 45433-7750
(513)255-5791 FAX: (513)255-2176

Mid-Atlantic Microbeam Analysis Society (MAMAS)
Ryna Beth Marinenko
National Institutes of Science and Technology
Bldg. 222, Room A113
Gaithersburg, MD 20899
(301)975-3901 FAX: (301)417-1321

Midwest Microscopy and Microanalysis Society (M3S)
Nestor J. Zaluzec
Electron Microscopy for Materials Research
Argonne National Laboratory
Material Science Division - Bldg. 212
9700 South Cass Ave.
Argonne, IL 60439
(708)252-5075 FAX: (708)252-4798

Minnesota Microscopy Society (MMS)
Michael Coscio (MAS Representataive)
C/O Medtronic Inc./Promeon Division
6700 Shingle Creek Drive
Brooklyn Center, MN 55430
(612)569-1331 FAX: (612)569-1284

Missouri-Illinois-Kansas Microbeam Analysis Society (MIKMAS)
Donald Parker (Chairman)
Monsanto Company
800 N. Lindbergh Blvd.
Mail Zone U1E
St. Louis, MO 63167
(314)694-4974 FAX: (314)694-6727

New England Society for Electron Microscopy (NESEM)
Ms. Rebecca Stearns (President-Elect)
New England Society for Electron Microscopy
P. O. Box 5067
Billerica, MA 01822
(617)432-1667 FAX: (617)432-0014

New Mexico Microbeam Users Group (NMMBUG)
Paul Frank Hlava
Department 1822, MS-1405
Sandia National Laboratories
Albuquerque, NM 87185-1405
(505)844-1890 FAX: (505)844-2974

North Carolina Society for Microscopy and Microbeam Analysis (NCSEMMA)
Phillip Russell
Department of Materials Science and Engineering
Campus Box 7916
North Carolina State University
Raleigh, NC 27695-7916
(919)515-7501 FAX: (919)515-6965

Oklahoma Microscopy Society (OMS)
Ginger Baker (Secretary-Treasurer)
Department of PHSI
264 Veterinary Medicine
Oklahoma State University
Stillwater, OK 74078-0353
(405)744-6765 FAX: (405)744-8263

SouthEastern Microscopy Society (SEMS)
W. Gray "Jay" Jerome (President)
Department of Pathology
Bowman Gray Medical School
Wake Forest University
Winston-Salem, NC 27157
(910)716-4972 FAX: (910)716-6174

West Coast Microbeam Analysis Society (WestMAS)
Charles Gordon Cleaver, Jr.
GE Vallecitos Nuclear Center
PO Box 460 MC V08
Pleasanton, CA 94566
(510)862-4320 FAX: (510)862-4516


Our Sustaining Members Contribute Substantial Support to MAS

4pi Analysis, Inc.
3500 Westgate Drive, Suite 403
Durham, NC 27707
(919)489-1757 FAX: (919)489-1487
Contact: Michael Czysz / Scott Davilla
Mac-based EDS & Imaging, Hard- and Software

Advanced MicroBeam, Inc.
4217 C Kings-Graves Road, P. O. Box 610
Vienna, OH 44473
(330)394-1255 FAX: (330)394-1834
Contact: Donald P. Lesher
Microprobe Service, Automation, Image Analysis

Amray, Inc.
160 Middlesex Turnpike
Bedford, MA 01730
(617)275-1400 FAX: (617)275-0740
Contact: Kenneth Benoit / Sheldon Moll
Manufacturer of Scanning Electron Microscopes

Cameca Instruments, Inc.
204 Spring Hill Road
Trumbull, CT 06611-1356
(203)459-0623 FAX: (203)261-5506
Contact: Andrew Davis /Don Jacobsin
EPMA, SIMS, Analytical SEM, and FE/Auger

Charles Evans & Associates
301 Chesapeake Drive
Redwood City, CA 94063
(415)369-4567 FAX: (415)369-7921
Contact: Jeff Kingsley / Mike Edgell
Service Analysis Lab., Mass Spec., RBS

Denton Vacuum, Inc.
1259 North Church Street
Moorestown, NJ 08057
(609)439-9100 FAX: (609)439-9111
Contact: George Lutz / James L. Campbell
Vacuum Coaters and Critical Point Dryers

EDAX International
91 McKee Drive
Mahwah, NJ 07430
(210)529-4880 FAX: (201)529-3156
Contact: Tony Williams / Paul Oravetz
Microanalysis Systems Utilizing PC or MAC

Electron Microscopy Sciences / Diatome US
321 Morris Road, P. O. Box 251
Fort Washington, PA 19034
(800)523-5874 (215)646-1566 FAX: (215)646-8931
Contact: Carole March / Stacie Kirsch
EM and LM Supplies and Diamond Knives

Electroscan Corporation
66 Concord St.
Wilmington, MA 01887
(508)988-0055 FAX (508)988-0062
Contact: Rich Melanson/Tom Hardt
Environmental Scanning Electron Microscopes

ETP-USA / Electron Detectors, Inc.
1650 Holmes Street, Building C
Livermore, CA 94550
(510)449-8534 FAX: (510)449-8996
Contact: Robert J. Ruscica
Robinson BSE Det. & Infrared Chamberview Sys.

FEI Company
7451 N.E. Evergreen Parkway
Hillsboro, OR 97124-5830
(503)640-7500 FAX: (503)640-7509
Contact: Andree Kraker / Doug Rathkey
LaB6 & CeB6 Tips, FIB & FIB/SEM Workstations

Gatan, Inc.
6678 Owens Drive
Pleasanton, CA 94588-3334
(510)463-0200 FAX: (510)463-0204
Contact: Alexander Gubbens/Peter Swann
TEM Accessories and Specimen Prep. Equipment

Geller MicroAnalytical Laboratory
426E Boston Stree
Topsfield, MA 01983-1200
(800)MICRO-LL (508)887-7000 FAX: (508)887-6671
Contact: Joseph D. Geller / Charles Herrington
EPMA,SEM/EDS,& Auger Services-EM Standards

Hessler Technical Services
44 Strawberry Hill Avenue, Suite 8G
Stamford, CT 06902
(203)358-0266 FAX: (203)358-0266
Contact: Robert Hessler
Sales and Marketing Representative

11 Dearborn Road
Peabody, MA 01960
(508)535-5900 FAX: (508)536-2205
Contact: Robert Santorelli / Charles Nielsen
EPMA, Auger, SEM, TEM, NMR, Mass Spec

Kevex Instruments
24911 Avenue Stanford
Valencia, CA 91355
(805)295-0019 FAX: (805)295-8714
Contact: Joe Robinson / Mike Davidson
Energy-dispersive X-ray Analysis Systems

RJ Lee Instruments Ltd.
515 Pleasant Valley Road
Trafford, PA 15085
(412)744-0100 FAX:(412)744-0506
Contact: Dr. Fred Schamber/David Crawford
PERSONAL SEM for failure analysis, QA, etc.

Lehigh University
Materials Science Department
5 East Packer Avenue
Bethlehem, PA 18015
(610)758-4249 FAX:(610)758-4244
Contact: David Williams / Charles Lyman
Education in SEM, AEM, AFM, & Microanalysis

Leo Electron Microscopy, Inc.
One Zeiss Drive
Thornwood, NY 10594
(914)747-7700 (800)356--1090 FAX: (914)681-7443
Contact: Frank Coccio/Jim Polcyn
SEM, Optical, & Scanning Confocal Microscopes

Materials Analytical Services, Inc.
3597 Parkway Lane, Suite 250
Norcross, GA 30092
(800)421-8451 (404)448-3200 FAX: (770)368-8256
Contact: Mark Rigler / Bill Longo

McCrone Associates, Inc.
850 Pasquinelli Drive
Westmont, IL 60559
(708)887-7100 FAX: (708)887-7417
Contact: Kent L. Rhodes / John Gavrilovic
Materials Characterization & Surface Analysis

Micron, Inc.
3815 Lancaster Pike
Wilmington, DE 19805-1599
(302)998-1184 FAX: (302)998-1836
Contact: James F. Ficca, Jr.
Analytical Services OM, SEM/EDS, TEM, & EPMA

Nissei Sangyo America, Ltd.
Hitachi Scientific Instruments
775 Ravendale Drive
Mountain View, CA 94043
(415)969-1100 FAX: (415)961-0368
Contact: Hideo Naito/Donna Armanino
SEM, TEM, & Field-Emission SEM and TEM

NORAN Instruments, Inc.
2551 W. Beltline Highway
Middleton, WI 53562
(608)831-6511 FAX: (608)836-7224
Contact: Gary Hawkinson / Mary Ales
Microanalysis Systems & Confocal Microscopes

Osmic, Inc.
1788 Northwood
Troy, MI 48084
(800)366-1299 (810)362-1290 FAX: (810)362-4043
Contact: Nick Grupido / George Gutman
Multilayer Crystals for WDS Spectrometers

Oxford Instruments, Inc.
Microanalysis Group
130 A Baker Avenue Ext.
Concord, MA 01742-2204
(508)369-9933 FAX: (508)369-8287
Contact: Helen Corry / John Benson
Link EDS Systems, Microspec WDS, EM Cryo
Access., CL & BSD

Park Scientific Instruments
1171 Borregas Avenue
Sunnyvalle, CA 94089
(408)747-1600 FAX: (408)747-1601
Contact: Dave Campbell / Stan Yarbro
A Complete Line of Scanning Probe Microscopes

Physical Electronics Inc.
6509 Flying Cloud Drive
Eden Prairie, MN 55344
(800)328-7515 (612)828-6100 FAX: (612)828-6322
Contact: Greg Carpenter/Larry Davis
Surface Analysis Inst., Auger, XPS, & SIMS

Philips Electronic Instruments
85 McKee Drive
Mahwah, NJ 07430
Contact: Nathan Little / John S. Fahy
XL Series SEMs and CM Series TEMs

Princeton Gamma-Tech
1200 State Road
Princeton, NJ 08540
(609)924-7310 FAX: (609)924-1729
Contact: Doug Skinner
EDS & Image Analysis for EM and OM

SEM / TEC Laboratories, Inc.
4824 South 35th Street
Phoenix, AZ 85040
(602)276-6138 FAX: (602)276-4558
Contact: Ed Holdsworth/Pat Clark
Materials & Failure Analysis Service Lab.

Spectra-Tech / Nicolet
652 Glenbrook Road, P. O. Box 2190-G
Stamford, CT 06906
(203)926-8998 FAX: (203)926-1297
Contact: Jerry Hare / John A. Reffner
FT-IR Microscopes, Spectrometers, & Access.

SPI Supplies / Structure Probe, Inc.
569 E. Gay Street, P. O. Box 656
West Chester, PA 19381-0656
(800)242-4774 (610)436-5400 FAX: (610)436-5755
Contact: Kim Royer / Andrew Blackwood
EM Prep. Equipment and Supplies / Service Lab

Topcon Technologies, Inc.
37 West Century Road
Paramus, NJ 07652
(201)261-9450 FAX: (201)262-1504
Contact: Michael McCarthy /Luci Merli
Digital SEM and UHR Digital SEM

Topometrix Corporation
5403 Betsy Ross Drive
Santa Clara, CA 95054
(800)538-6850 FAX: (408)982-9751
Contact: Tony Abbis / Paul West
Complete Line of Scanning Probe Microscopes

Beginning of Micro News

MAS Homepage

These pages created by:
The University of Michigan Electron Microbeam Analysis Laboratory
The Microbeam Analysis Society
Comments, criticisms, compliments,
etc. may be directed to:

John F. Mansfield (

This Page last updated:
Wednesday, March 19th, 1997

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