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International Microscopy Congress 17
Rio de Janeiro, Brazil,
Sep 19, 2010
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MMMS 4th Annual Optical Microscopy Workshop
Hooke College of Applied Sciences, Westmont, IL,
Sep 28, 2010
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Reaching New Peaks in Geoscience
Denver, CO,
Oct 31, 2010
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AMAS XI
Canberra, Australia,
Feb 09, 2011
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4th Annual Washington DC Focused Ion Beam User Group Meeting
Mason Hall, Homewood Campus, Johns Hopkins University,
Feb 25, 2011
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Topical Conferences
Here is a list of past MAS Topical Conferences.
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Electron Backscatter Diffraction (EBSD 2010)
May 24-26, 2010 ♦ Madison, WI
Luke N. Brewer, Chair
Sandia National Laboratories
PO Box 5800, MS 1411
Albuquerque, NM 87185-1411
Tel: +1 505 284 2816
Fax: +1 505 844 9781
Email: lnbrewe-at-sandia.gov
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Microanalysis of Particles (Particles 2009)
April 20-23, 2009 ♦ Westmont IL
Craig Schwandt, Chair
McCrone Associates, Inc.
850 Pasquinelli Drive
Westmont IL 60559-5539
Tel: +1 630 734 2422
Fax: +1 630 887 7417
Email: cschwandt-at-mccrone.com
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Electron Backscattered Diffraction (EBSD)
May 20-22, 2008 ♦ Madison, WI
John Fournelle, Chair
University of Wisconsin-Madison
306a Weeks Hall for Geologic Science
1215 W Dayton Street
Madison WI 53706
Tel: +1 608 262 7964
Fax: +1 608 262 0693
Email: johnf-at-geology.wisc.edu
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Hyperspectral Imaging II (HI-II)
October 23-26, 2007 ♦ Gaithersburg, MD
Ed Vicenzi, Chair
Smithsonian Institution
National Museum of Natural History
PO Box 37012, NHB-119
Washington DC 20013-7012
Tel: +1 202 633 1824
Fax: +1 202 357 2476
Email: vicenzie-at-si.edu
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Particle Workshop 2006
April 24-26, 2006 ♦ Gaithersburg, MD
Nicholas Ritchie, Chair
National Institute of Standards and Technology
100 Bureau Drive, MS 8371
Gaithersburg MD 20899-8371
Tel: +1 301 975 3929
Fax: +1 301 417 1321
Email: nicholas.ritchie-at-nist.gov
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Variable Pressure and Environmental SEM
for Imaging and Microanalysis
November 2-4, 2005 ♦ Gaithersburg, MD
Dale Newbury and Scott Wight, Chairs
National Institute of Standards and Technology
100 Bureau Drive, MS 8371
Gaithersburg MD 20899-8371
Tel: +1 301 975 3921;
+1 301 975 3949
Fax: +1 301 417 1321
Email: dale.newbury-at-nist.gov;
scott.wight-at-nist.gov
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Modeling Electron Transport for Applications
in Electron and X-ray Analysis and Metrology
November 8-10, 2004 ♦ Gaithersburg, MD
Dale Newbury and Cedric Powell, Chairs
National Institute of Standards and Technology
100 Bureau Drive, MS 8371
Gaithersburg MD 20899-8371
Tel: +1 301 975 3921;
+1 301 975 2534
Fax: +1 301 417 1321
Email: dale.newbury-at-nist.gov;
cedric.powell-at-nist.gov
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Spectrum Imaging and Multispectral /
Hyperspectral Data Analysis
April 28 - May 1, 2003 ♦ Gaithersburg, MD
John Henry Scott, Chair
National Institute of Standards and Technology
100 Bureau Drive, MS 8371
Gaithersburg MD 20899-8371
Tel: +1 301 975 4981
Fax: +1 301 417 1321
Email: johnhenry.scott-at-nist.gov
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Understanding the Accuracy Barrier of
Quantitative Electron Beam X-ray Microanalysis
and the Role of Standards
April 8-11, 2002 ♦ Gaithersburg, MD
Dale Newbury and Ryna Marinenko, Chairs
National Institute of Standards and Technology
100 Bureau Drive, MS 8371
Gaithersburg MD 20899-8371
Tel: +1 301 975 3921;
+1 301 975 3901
Fax: +1 301 417 1321
Email: dale.newbury-at-nist.gov;
ryna.marinenko-at-nist.gov
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