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Microbeam Analysis Society |
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Incorporated in New York, 1968 ♦ FEIN 23-7044608 |
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Overview |
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EBSD 2008 is the latest in a topical conference series sponsored by the Microbeam Analysis Society (MAS), focusing on electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM), a technique that has been continually growing in use and provides the unique capability of linking microstructure to crystallography approaching the nanoscale. EBSD 2008 will be held on the campus of the University of Wisconsin in Madison from May 20 through May 22. This conference has something for all levels of experience. EBSD 2008 will start off with a day-long tutorial taught by experts in the field to introduce the technique, technologies and applications of EBSD to the unacquainted. The following two days of the conference will be filled with thought-provoking invited talks from the leaders in the EBSD field and complementary contributed talks representing the latest in technique development and applications of EBSD in materials science and geology. There will also be opportunities for poster presentations. Participants will be able to publish in a forthcoming issue of the journal Microscopy and Microanalysis. The EBSD 2008 Topical Conference is made possible through the generosity of our sponsors. In particular, student scholarships of up to $500 each are available to allow full-time students in accredited degree-granting institutions to defray the cost of attending. A complete list of our sponsors, and links to their web sites, can be found by clicking on the "Sponsors" link above. |