Microbeam Analysis Society

Incorporated in New York, 1968       ♦       FEIN 23-7044608

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Pre-Conference Tutorial

Instructors:
      Andrew Deal
      General Electric Global Research Center
      Joseph R. Michael
      Sandia National Laboratories

This session will be geared towards newcomers to EBSD, and will feature:

• Fundamentals of the EBSD technique, including forming, collecting, and indexing patterns in the SEM;
• Application of EBSD for the measurement of microtexture in a variety of materials; and
• An “ask the experts” session, where experienced practitioners of EBSD answer your questions about its practical use. Panel members will include the instructors as well as L.N. Brewer (Sandia), S.I. Wright (EDAX), and S. Sitzman (Oxford).

Date: May 20, 2008