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Microbeam Analysis Society |
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Incorporated in New York, 1968 ♦ FEIN 23-7044608 |
Our Topical ConferencesFor many years, MAS has co-sponsored topical conferences on subjects of interest to its membership, most notably at the National Institute of Standards and Technology (NIST) with workshops on Microanalysis Standards (2002), Spectrum Imaging (2003), Electron Transport (2004), Variable Pressure SEM (2005), and Particle Analysis (2006). In 2007, MAS launched a new topical conference series with the society as principle sponsor, with Hyperspectral Imaging II held at NIST in October. Starting in 2008, the MAS topical conference series will be held in different locales around the United States, beginning with EBSD 2008 in Madison, WI in May (see below). Details on upcoming topical conferences can be found on this site. |
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Updates
March 25, 2008:
Registration for EBSD 2008 CLOSED
February 19, 2008:
Registration for EBSD 2008 full
January 15, 2008:
Registration for EBSD 2008 now open |