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			Micronews May/June 1993
	PRESIDENT'S MESSAGE Dear Colleagues: As has been said by all of the past presidents I can remember, it is indeed a very special privilege to single out members of our Microbeam Analysis Society to receive the Presidential Awards. These awards were reviewed and approved by our council at the Winter Council Meeting in January. It is my great pleasure to present to you here the following award recipients for 1993. The recipient of the 1993 Presidential Science Award is Dale E. Newbury, Group Leader of Microanalysis Research at NIST, Gaithersburg, Maryland. Dale's contribution to the field of science, as well as to MAS, speaks for itself. He served on our council as a director (1979-1981) and as our president in 1984. His many accomplishments include 5 books and 212 papers with 6 in progress. Dale modestly feels that he has made significant contributions in Monte Carlo electron trajectory simulations, quantitative compositional mapping, and nanoanalysis. Over the many years that I have known Dale, he has been available to help anyone regardless of the time consumed or how trivial the problem. I am certain that there are many long time members of our society who will be quite surprised to learn that Dale has not already received this recognition. It gives me great pleasure to present the 1993 Presidential Science Award to Dale. The recipient of the 1993 Presidential Service Award is Harvey A. Freeman. Harvey has been our MAS treasurer since 1989. Previous to that he had the distinction of being Chairman of the Sustaining Members Committee for over 10 years. As most of you know, this is a very critical relationship as our sustaining members are the lifeline of our existence. Harvey has recently retired from Dow Corning and is now a permanent resident of Brewster, MA on Cape Cod where he will have endless hours to devote to our MAS financial matters. It will be a great pleasure to present Harvey with the 1993 Presidential Service Award. The recipient of the 1993 Heinrich Award for outstanding contributions to the field of microanalysis by a person under the age of 40 is Phillip E. Russell. Phil is the director of the Analytical Instrumentation Facility and a professor in the Department of Materials Science and Engineering and the Precision Engineering Center at North Carolina		State University. In addition to being a director of MAS since 1991, Phil was the program chair of our 1989 meeting in Asheville, NC. He is currently President of the North Carolina Society of Electron Microscopy and Microbeam Analysis. In 1986, Phil received the President's Young Investigator Award from President Reagan. I have known Phil for over 10 years and respect him as an excellent and very dedicated teacher. I am indeed pleased to present this award to him. I want to thank the entire 1993 Local Arrangements Committee for what I know is going to be an excellent meeting. I am looking forward to seeing all of you at Loyola Marymount University in July. I would also like to say, as I begin to see the end of my presidency on the horizon, how very much I appreciate the confidence you have placed in my ability to serve, as well as the support and cooperation of our council and committee members. We have a wonderful society which, of course, is made up of truly capable and interesting individuals and to be made the society's president, even for a short time, is a real humbling experience, especially for me. Thanks go to so many of you for your very special help and to all of you for your support. I wish that each and every one of you might have such a magnificent experience sometime in your career. Thank you all once again for the opportunity to serve both you and our society. Thomas G. Huber President

			1993 PRESIDENTIAL AWARDS *Science Award - Dale E. Newbury* *Service Award - Harvey A. Freeman* *Heinrich Award - Phillip E. Russell*

MEETING CALENDAR

37TH INTERNATIONAL SYMPOSIUM ON ELECTRON, ION, AND PHOTON BEAMS

June 1-4, 1993

San Diego, CA

Contact: Dr. Fritz J. Hohn

IBM T.J. Watson Research Center

P.O. Box 218

Yorktown Heights, NY 10598

(914) 945-1608

(914) 945-2141 FAX

ATOMIC FORCE MICROSCOPY / SCANNING TUNNELING MICROSCOPY SYMPOSIUM

June 8-10, 1993

Natick, MA

Contact: Mona Bray

(508) 651-4705

(508) 651-5104 FAX

15TH SYMPOSIUM ON APPLIED SURFACE ANALYSIS

June 9-11, 1993

Cleveland, OH

Contact: Jeffrey Eldridge

NASA Lewis Research Center, M/S 23-2

21000 Brookpark Road

Cleveland, OH 44135

(216) 433-6074

(216) 433-5170 FAX

MAS MEETING

Microbeam Analysis Society

July 11-16, 1993

Marina del Rey / Los Angeles, CA

Contact: Jack Worrall

MAS 1993

P.O. Box 1014

Monrovia, CA 91017-1014

(213) 740-1990

MSA MEETING

Microscopy Society of America

August 1-6, 1993

Cincinnati, OH

Contact: MSA Meeting Office

P.O. Box MSA

Woods Hole, MA 02543

(800) 538-3672

(508) 548-9053 FAX

INTERNATIONAL CONFERENCE ON STM

August 9-13, 1993

Beijing, China

Contact: Chunli Bai

Inst. of Chem.

Chinese Academy of Sci.

Beijing 100080, China

86-1-2568158

86-1-2569564 FAX

5TH TOPICAL CONFERENCE ON

QUANTITATIVE SURFACE ANALYSIS

November 12-13, 1993

Clearwater Beach, FL

Contact: Cedric Powell

NIST, Chemistry B-248

Gaithersburg, MD 20899

(301)975-2534

(301)216-1134 FAX

AVS 4OTH NATIONAL SYMPOSIUM

November 15-19, 1993

Orlando, FL

Contact: AVS

335 E. 45th Street

New York, NY 10017

(212) 661-9404

MATERIALS RESEARCH SOCIETY

FALL MEETING

November 29 - December 3, 1993

Boston, MA

Contact: MRS

9800 McKnight Road

Pittsburgh, PA 15237

(412) 367-3003

(412) 367-4373 FAX

XIII INTERNATIONAL CONGRESS

ON ELECTRON MICROSCOPY

July 18-22, 1994

Paris, France

Contact: B. Jouffrey

SFME, 67

rue Maurice Gunsbourg

94205 Ivry sur Seine cedex

France

33-1-46702844

33-1-46708846 FAX

MAS / MSA 1994, New Orleans, LA

MAS 1995, Denver, CO

MAS / MSA 1996, Minneapolis, MN


			Lifshin, E. Microbeam analysis in the industrial research laboratory General Electric Corporate R&D, Schenectady, NY Romig, A.D., Jr. Microbeam analysis capabilities in the DOE national laboratories: current status and future opportunities Sandia Nat'l. Labs., Mater. & Process Sci., Albuquerque, NM Williams, D.B. IFMAS: an organization whose time has come? Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA Armstrong, J.T. Microbeam analysis of heavenly bodies Caltech, Geol. Dept. Wittry, D.B. New developments in hardware for microbeam analysis Dept. Materials Sci. & Engr., Univ. Southern California, L.A., CA Newbury, D.E. Microanalysis from the other side - relating microscopic measurements to bulk analysis NIST, Microanalysis Res. Group, Gaithersburg, MD Quantitative Microprobe Analysis Chairs: R. Marinenko, R. Myklebust, D. Newbury, D. Joy Marinenko, R.B. Has automation taken the worry out of quantitative wavelength dispersive microanalysis? Surf. & Microanalysis Sci. Div., NIST, Gaithersburg, MD Armstrong, J.T. Effects of carbon coat thickness and contamination on quantitative analysis: a new look at an old problem Caltech, Geol. Dept. Harrowfield, I.R. Comparison of measured and simulated Bremsstrahlung spectra to test electron energy loss expressions CSIRO, Dept. of Mineral Products, Port Melbourne, Vic., Australia Joy, D.C. A data base on electron-solid interactions Univ. Tenn., EM Facility

	27th MEETING OF THE MICROBEAM ANALYSIS SOCIETY Loyola Marymount University Marina del Rey / Los Angeles, California July 11-16, 1993 MAS-AEM Meeting Presentations (The presenting authors, listed below, will be contacted concerning the date, time, and location of their talks.) MAS Symposia and Sessions: Plenary Lecture Chairs: D. Wittry and T. Huber Scharf, D. Imagery, Art and the SRM David Scharf, Los Angeles, CA Presidential Symposium: MicrobeamsHere, There and Everywhere Chair: T. Huber Huber, T. The necessity of interaction between the scientific and commercial communities JEOL U.S.A., Inc. Ogilvie, R.E. Microanalysis of historical objects Museum of Fine Arts, Boston Goldstein, J.I. Microbeam analysis in the university Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA



	Gauvin, R. The transition between persistent and random walk process to describe electron scattering in solids: a status report Univ. Sherbrooke, Genie mecanique, Quebec Sartore, R.G. Effect of accelerating voltage on spatial resolution of linewidth measurements on an IC using energy dispersive x-ray analysis US Army Res. Lab., Fort Monmouth, NJ Waldo, R.A. Applications of the electron probe to thin film analysis GM Res. & Dev. Center, Anal. Chem., Warren, MI Armstrong, J.T. Experimental determination of polynomial a-factors for quantitative electron microbeam analysis of silicates and oxides Caltech, Geol. Dept. Nockolds, C.E. Low voltage x-ray microanalysis using a UTW EDS in an in-lens FEGSEM Univ. Sydney, E.M. Unit, Sidney, NSW, Australia Griffin, B. EDS detectors: long term performance and procedures for minimizing window contamination in the analytical SEM Centre for Micros. & Microanal., Univ. of W. Australia, Nedlands, WA Cousens, D.R. The light element analysis performance of the JEOL 8800L electron microprobe Centre for Micros. & Microanal., Univ. of Queensland, Brisbane, Aust Ross, D.K. Oxygen analysis by EPMA: the need for internally consistent mass absorption coefficients Univ. Houston, Texas Center for Superconductivity, Houston TX Quantitation in the Environmental SEM Chair: D. Newbury and D. Joy Doehne, E. Empirical evaluation of the electron skirt in the environmental SEM: implications for energy dispersive x-ray analysis Getty Conservation Institute, Marina del Rey, CA		Griffin, B. X-ray resolution at low chamber pressures and chamber gas fluorescence in the Electroscan ESEM Centre for Micros. & Microanal., Univ. of W. Australia, Nedlands, WA Doehne, E. Experimental conditions for semi-quantitative SEM/EDS of painting cross sections using the environmental scanning electron microscope Getty Conservation Institute, Marina del Rey, CA Image Analysis and Compositional Mapping Chairs: J. Porter and P. Carpenter Adams, B.L. Orientation imaging microscopy: A new tool for interogating the fields of lattice orientation in polycrystalline materials Brigham Young Univ., Man. Engr., Provo, UT Morris, W. and James, M. High resolution deformation and strain field analysis using HASMAP Rockwell International Science Center, Thousand Oaks, CA Kobayashi, T. Use of fracture surface topography in fracture analyses Dept. Metallurgy & Frac. Mech., SRI International, Menlo Park, CA Harrowfield, I.R. Chemical imaging on electron microprobes CSIRO, Dept. of Mineral Products, Port Melbourne, Vic., Australia Browning, R. Re-defining signal-to-noise in multi-spectral images Dept. of Electrical Engr., Stanford Univ., Stanford, CA New and Emerging Techniques Chair: D. Wittry Atwater, H.A. In situ surface chemical analysis during molecular beam epitaxy by reflection electron energy loss spectroscopy Div. of Appl. Phys., Caltech, Pasadena, CA Moyer, P.J. Sheer force/reflection near-field scanning optical microscopy (NSOM) Topometrix, Santa Clara, CA



	STM/AFM Chair: P. Russell Campbell, J.B. and Lankford, J. Atomic force microscopy of surfaces Southwest Res. Inst., San Antonio, TX Prater, C. AC methods in atomic force microscopy Digital Instruments, Inc., Santa Barbara, CA Mooney, C.B. Effects of deformation of electron beam grown microtips on measurements taken with the atomic force microscope Dept. Materials Sci. & Engr., North Carolina State Univ., Raleigh, NC Micro-FTIR Analysis Chairs: J. Reffner and S. Hill Reffner, J.A. Infrared microprobe analysis: its capabilities and limitations for materials characterization Spectra-Tech, Inc., Stamford, CT Katon, J.E. Quantitative analysis of colorants in single polypropylene fibers using molecular microspectroscopy Miami Univ., Chem. Dept., Oxford, OH Derrick, M. Applications of IR microspectrometry to the analysis of binding media in paint layers on easel paintings and polychrome sculptures Getty Conservation Institute, Marina del Rey, CA Hill, S.L. IR microreflectance principal component analysis: detection and resolution below the diffraction limit Bio-Rad Laboratories, Digilab Division, Cambridge, MA Martoglio, P.A. Quantitative infrared microprobe analysis of biological tissue using a synthetic model Spectra-Tech, Inc., Stamford, CT Hill, S.L. The selective analysis of anisotropic species using infrared microdichroic polarization Bio-Rad Laboratories, Digilab Division, Cambridge, MA		Micro-X-ray Diffraction and Fluorescence Chair: B. York Carpenter, D.A. Nondestructive microanalysis with a laboratory-based x-ray microprobe Martin Marietta Energy Systems, Oak Ridge, TN Lai, B. Microfocusing using phase zone plates in the hard x-ray regime and its applications Adv. Photon Source Dept., Argonne Nat'l. Lab., Argonne, IL Pianetta, P. Detection limits for aluminum on silicon using synchrotron radiation total reflection x-ray fluorescence SLAC, Stanford Synchrotron Radiation Laboratory, Stanford, CA Rivers, M. L. Synchrotron x-ray microprobe techniques Brookhaven Nat'l. Lab., Upton, NY Boehme, D.R. Mineralogical analysis of soils and other geologic specimens using x-ray micro-fluorescence techniques Materials Diagnostics Dept., Sandia Nat'l. Lab./CA, Livermore, CA Jacobsen, C. Generating high resolution microprobes with soft and not-so-soft x-rays Dept. Phys., SUNY, Stony Brook, NY DeHaven, P.W. Stress mapping of patterned thin film structures using x-ray microbeam diffraction IBM Corp., Hopewell Junction, NY Bilderback, D.H. X-ray diffraction and fluorescence applications with submicron beams made with glass capillary optics CHESS, Cornell Univ., Ithaca, NY Thompson, A.C. Microanalysis with a synchroton-based x-ray microprobe Centre for X-ray Optics, Lawrence Berkeley Lab., Berkeley, CA

York, B.R.

Analytical challenges in laboratory-based x-ray diffraction and fluorescence systems using micron scale beams with capillary optics

X-ray Materials Lab., IBM, San Jose, CA

Wherry, D.C. and Wong, R.

X-ray microfluorescence chemical imaging with analytical image processing and materials uniformity applications

Fisons Instruments, San Carlos, CA

Strategies of Surface Analysis

Chair: D. Simons

Simons, D.S.

Assessment of silicon wafer cleaning procedures by secondary ion mass spectrometry

National Inst. of Standards & Technology, Gaithersburg, MD

Chakel, J.A.

Microanalysis of surfaces with time-of-flight secondary ion mass spectrometry (TOF-SIMS)

Charles Evans & Associates, Redwood City, CA

Gijbels, R.

A laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis

Dept. of Chemistry, Univer. of Antwerp, Antwerp-Wilrijk, Belgium

Evans, C.A.

Strategies for surface and microanalysis: semiconductors

Charles Evans & Associates, Redwood City, CA

Odom, R.W.

Strategies for surface analysis: polymers, organics and biomaterials

Charles Evans and Assoc., Redwood City, CA

Joshi, A.

Surface and interface analysis of metallic materials

Lockeed R&D Division, Palo Alto, CA

Palenik, S.

The forensic examination of particles recovered from surfaces

Microtrace, Elgin, IL

Hurd, J.L.

Auger, EPMA, XPS and EBSP analysis of discolored Au/Ti/Cu multilayer thin film I/O pads

IBM Analytical Services, Hopewell Junction, NY

Biological Microanalysis: I. X-ray Microanalysis

Chairs: R. Warner and P. Ingram

Ingram, P.

Analytical imaging of the mitochondrion: probes of form and function

Div. of Physiology, Dept. of Cell Biology, Duke University Medical Center, Durham, NC

Saubermann, A.J.

Direct intracellular injection of Rb as a K tracer using electron probe x-ray microanalysis and digital imaging

SUNY Stony Brook, Dept. of Anesthesiology

Andrews, S.B.

Characterization of calcium release organelles in Purkinje cells by combined x-ray and mass analysis

Lab. of Neurobiology, DIR, INIDS, NIH, Bethesda, MD

Kirk, R.G.

The use of x-ray microanalysis to measure distribution of labeled molecules in cells

West Virginia Univ., Dept. Anatomy, Morgantown, WV

Biological Microanalysis: II. Imaging SIMS

Chairs: R. Warner and P. Ingram

Lazof, D.B.

SIMS determination of metal contamination and nutrient tracers in freeze-dried cryosections of plant roots

U.S. Dept. of Agriculture, Agric. Res. Serv., Oxford, NC

Chabala, J.M.

Analysis of biological materials with a scanning ion probe

Enrico Fermi Inst., Univ. of Chicago, Chicago, IL

Wood, M.C.

Molecular imaging with ion beams and lasers

Dept. of Chemistry, Princeton Univ., University Park, PA

Chandra, S.

Application of ion microscopy to biomedical studies

Dept. Chemistry, Cornell Univ., Ithaca, NY

Severin, K.

Extracting information from incrementally-grown biological structures

Dept. Geol. & Geophys., Univ. of Alaska, Fairbanks, AK


	Materials Applications Chairs: J. Friel and M. McCartney Chen, W. Use of focussed ion beam (FIB) in creating arrays of two- and three- dimensional structures in semiconductors: Ga+ FIB and Si USC, Mater. Sci. Dept., L.A., CA Chen, J-S Interfacial reaction of Pt thin films on single-crystal (001) b-SiC Caltech, Electrical Engineering Evans, N.D. Ion mixing of thin ZrO2 films on sapphire Metals & Ceramics Div., Oak Ridge Nat'l. Lab., Oak Ridge, TN Jayaram, R. Applications of the atom probe field ion microscope to the atomic level characterization of metals and alloys Metals & Ceramics Div., Oak Ridge Nat'l. Lab., Oak Ridge, TN Reucroft, P.J. A study on Al doped ZnO films grown by a low pressure metal organic chemical vapor deposition technique Univ. Kentucky, Mat. Sci. & Engr., Lexington Mosley, W.C. Scanning electron microscopy in development of palladium deposited on Kieselguhr (Pd/K) Westinghouse Savannah River Co. Liu, D.R. Influence of sample porosity on accuracy of microprobe analysis of major and minor elements in Cu-ZSM-5 zeolite Ford Motor Co., Ford Res. Lab., West Bloomfield, MI Warner, R.P. Polymer localization within grafted cellulose fibers: Chemical and morphological alterations enhance absorbancy Miami Valley Labs., Procter & Gamble Co., Cincinnati, OH Cole, M.W. Surface characterization of magnetron-ion-etched GaAs Army Research Lab., Ft. Monmouth, NJ		Aerospace Materials Chairs: D. Hardwick and K. Vecchio Vecchio, K.S. Microchemistry of aluminum metal-matrix composites Dept. Appl. Mechanics & Engr. Sci., Univ. of Calif., San Diego, CA Soni, K.K. SIMS analysis of aerospace materials Enrico Fermi Inst., Univ. of Chicago, Chicago, IL Rhodes, C.G. Transmission electron microscopy characterization of fiber/matrix interfaces in titanium/aluminide/SiC composites Rockwell International Science Center, Thousand Oaks, CA Vecchio, K.S. Planar faults in plasma spray deposited MoS2 Dept. Appl. Mechanics & Engr. Sci., Univ. of Calif., San Diego, CA Particles, Geological and Environmental Applications Chairs: J. Small and J. Bradley Raymond, R. Application of scanning and transmission electron microscopies to understanding the dynamics of rock varnish formation Los Alamos Nat'l., Lab., Los Alamos, NM Hietala, S.L. Observation of phases in hydrothermally treated aluminosilicate Dept. Chem. & Nuclear Engr., Univ. New Mexico, Albuquerque, NM Mikula, R.J. Characterization of fine particulate suspensions: correlated confocal and cryo-SEM observation of oil sands tailings CANMET, Western Research Centre, Devon, Alberta Lee, R.J. and Kennedy, S.K. Computer controlled SEM/EDS and spectrographic cathodoluminescence analysis of quartz silt RJ Lee Group, Inc., Monroeville, PA Small, J.A. An evaluation of particle correction procedures applied to automated particle analysis NIST, Chem. Sci. and Tech. Lab., Gaithersburg, MD



	Zevenbergen C., Bradley, J.P. and Van Reeuwijk, L.P. Mobility of heavy metals during leaching of municiple solid waste ash MVA Inc., Norcross, GA Kim, H.S. The investigation of particulates collected after space shuttle landing at Dryden Flight Research Facility, CA NASA, Kennedy Space Center Joint MAS-AEM Symposium Chuck Fiori Memorial Symposium: X-ray Spectrometry Electron Beam Instruments Chairs: D. Williams, J. Goldstein and D. Newbury Fiori Memorial Symposium: I. EDS Heinrich, K.F.J. A history of energy dispersive electron probe microanalysis Rockville, MD Joy, D.C. Modelling the Si(Li) energy dispersive x-ray detector Univ. Tenn., EM Facility Statham, P.J. Quantifying benefits of resolution and count rate in EDX microanalysis Microanalysis Group, Oxford Instruments, High Wycombe, Bucks., UK Sareen, R.A. Properties of germanium detectors The University, Schuster Labs., Manchester, England Iwanczyk, J.S. and Dabrowski, A.J. Status of mercuric iodide x-ray technology Xsirius, Inc., Marina del Rey, CA Lund, M.W. Current trends in Si(Li) detector windows for light element analysis Moxtek, Orem, UT Mott, R.A. High count rate light-element EDS PGT, Princeton, NY McCarthy, J. The effect of detector dead layers on light element detection in EDS Noran Instruments, Middleton, WI		Newbury, D.E. Artifacts in energy dispersive x-ray spectrometry NIST, Microanalysis Res. Group, Gaithersburg, MD Zemyan, S.M. Characterizing an energy dispersive spectrometer on an analytical electron microscope Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA Michael, J.R. Energy dispersive x-ray spectrometers in ultra-high vacuum environments Sandia Nat'l. Labs., Div. 1822, Albuquerque, NM Fiori Memorial Symposium: II. WDS Reed, S.J.B. Wavelength dispersive spectrometrypast, present and future Univ. of Cambridge, Dept. of Earth Sciences Bastin, G.F. Synthetic multilayer crystals for EPMA of ultra-light elements Lab. Sol. State Chem. & Mat. Sci., Univ. of Tech., Eindhoven, Neth. Rybka, R. and Wolf, R.C. Application of layered synthetic microstructured crystals for WDX microanalysis of ultra-light elements Microspec Corp., Fremont, CA Wittry, D.B. New developments in curved diffractor geometries for x-ray microanalysis Dept. Materials Sci. & Engr., Univ. Southern California, L.A., CA Panin, A.M. Von Hamoss type parallel collection wavelength dispersive spectrometer for microbeam analysis Brigham Young Univ., Dept. Phys. & Astronomy, Provo UT Moll, S.H. Wavelength dispersive x-ray analysis in AMRAY field emission SEMs AMRAY, Inc. Franco, E.D. An emerging wavelength dispersive technology for AEM ARACOR, Sunnyvale, CA



	Myklebust, R.L. Fitting wavelength dispersive spectra in the NIST/NIH DTSA program NIST, Gaithersburg, MD Labar, J., Remond, G. and Myklebust, R.L. Accurate separation of x-ray lines in measurement of relative intensities with wavelength dispersive spectrometers Res. Inst. Tech. Phys., Hungarian Academy of Sci., Budapest, Hungary AEM WORKSHOP Quantitative STEM Imaging Chairs: J. Chapman and S. Pennycook Rodenburg, J.M. Reducing uncertainties and improving resolution in coherent STEM imaging Dept. Physics, Cavendish Lab., Cambridge, UK Chapman, J.N. STEM imaging with a segmented detector Univ. of Glasgow, Dept. of Physics & Astronomy Liu, J. High-resolution STEM imaging Arizona State Univ., Center for Solid State Sci., Tempe Pennycook, S.J. Z-contrast imaging with a 300 kV STEM Oak Ridge Nat'l. Lab., Oak Ridge, TN Hillyard, S. and Silcox, J. Quantitative annular dark field STEM images Cornell Univ., Dept. of Appl. & Eng. Physics, Ithaca, NY Bonnet, N. Applications of multivariate statistical analysis in microanalysis Univ. of Reims, Inserm U314, Reims, France Warner, R.P. Qualitative water measurements from STEM images of biological tissue Miami Valley Labs., Procter & Gamble Co., Cincinnati, OH		CBED Symposium Chairs: K. Vecchio and J. Mansfield Saunders, M. Determination of bonding charge densities in silicon Univ. of Bath, School of Physics Swaminathan, S. and Fraser, H.L. Measurement of low order structure factors in intermetallic compound TiAl using quantitative CBED method Materials Sci. & Engr., Ohio State Univ., Columbus, OH Lin, X. and Dravid, V.P. Quantitative electron nanodiffraction from interfaces Dept. Materials Sci. & Engr., Northwestern Univ., Evanston, IL Burgess, W.G. Polarity determination in semiconductors by zone-axis CBED Univ. of Cambridge, Dept. Mat. Sci. & Engr. Vecchio, K.S. Dilatation versus shear effects in CBED techniques applied to TiAl-based lamellar composites Dept. Appl. Mechanics & Engr. Sci., Univ. of Calif., San Diego, CA Quantitative EDS Chairs: J. Michael and G. L'Esperance Hovington, P. Processing and quantification of low energy EDS spectra and modeling of the decrease of detection efficiency with time Ecole Polytechnique de Montreal, Cen. Char. & Micr. of Mat., Quebec Gauvin, R. Multifractal behavior of the effect of fast secondary electrons on spatial resolution of x-ray microanalysis in the TEM Univ. Sherbrooke, Genie mecanique, Quebec Anderson, I.M. Correction of secondary fluorescence in the AEM for common specimen geometries Univ. Minn., Chem. Engr. & Mat. Sci., Minneapolis, MN McCarthy, J. EDS artifacts in AEM revisited Noran Instruments, Middleton, WI



	Williams, D.B. A new analytical electron microscope Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA Lyman, C.E. Improved x-ray throughput by fast beam blanking in a 300 kV field emission AEM Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA Romig, A.D., Jr. Spatial resolution in the AEM: measurement of and comparison with Monte Carlo calculations Sandia Nat'l. Labs., Mater. & Process Sci., Albuquerque, NM Ingram, P. Quantitative EDS imaging in biology Dept. Chem. & Life Sci., Research Triangle Inst., Res. Tri. Pk, NC Zemyan, S.M. Variables in calculated k-factors for AEM Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA Zemyan, S.M. K-shell ionization cross sections for AEM Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA Solorzano, G. High resolution observations of segregation in oxide grain boundaries Center for Materials Sci. & Engr., MIT, Cambridge, MA Koppel, E.D. An emerging wavelength dispersive technology for AEM ARACOR, Sunnyvale, CA Alani, R. Very low angle ion milling: an overview Gatan, Inc. Biological Microanalysis Chairs: D. Johnson and R. Leapman Andrews, S.B. Characterization of cryosections in the FE-STEM: specimen damage during freeze-drying and analysis Lab. of Neurobiology, DIR, INIDS, NIH, Bethesda, MD
			Ingram, P. Cryofixation of kidney for electron probe x-ray microanalysis Dept. Chem. & Life Sci., Research Triangle Inst., Res. Tri. Pk, NC Bond, M. Statistical design and analysis in quantitative electron probe microanalysis in biology Cardiovasc. Biol. Dept., Cleveland Clinic Foundation, Cleveland, OH Cantino, M.E. Radiation damage in biological freeze dried cryosections during electron probe x-ray microanalysis Dept. of Physiology & Neurobiology, Univ. of Connecticut, Storrs, CT Leapman, R.D. Use of EELS to assess beam damage in biological microanalysis Biomedical Engr. & Instrum. Program, NIH, Bethesda, MD Shi, S. EELS measurement of hydrated cryosection thickness Biomedical Engr. & Instrum. Program, NIH, Bethesda, MD Sun, S. Parallel-EELS mapping of water distribution in cryosectioned cells Biomedical Engr. & Instrum. Program, NIH, Bethesda, MD Quantitative EELS Chairs: J. Hunt and O. Krivanek Rightor, E. Polymer characterization in the STEM by EELS and comparison to synchrotron and gas phase EELS results Dow Chemical U.S.A., Freeport, TX Leapman, R.D. Biological microanalysis by parallel-EELS Biomedical Engr. & Instrum. Program, NIH, Bethesda, MD Thiel, B. EELS observations on natural silk fibers Dept. Materials Sci. & Engr., Univ. of Washington, Seattle, WA



	Browning, N.D. Atomic resolution EELS in the STEM Oak Ridge Nat'l. Lab., TN Hunt, J. Low-dose EELS and imaging strategies in STEM Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA Ahn, C. Energy filtered imaging and RHEED Dept. Materials Sci., Caltech, Pasadena, CA Kundmann, M.K. Processing of energy-filtered images for reduced noise in elemental maps Gatan Inc., Downers Grove, IL Dravid, V. P. Quantitative EELS fine structure analysis of oxide superconductors Dept. Materials Sci. & Engr., Northwestern Univ., Evanston, IL Hunt, J. Chemical microanalysis using EELS fingerprinting Dept. Materials Sci. & Engr., Lehigh Univ., Bethlehem, PA Joy, D.C. Quantitative analysis of the electron energy loss spectrum Univ. Tenn., EM Facility Bentley, J. Microanalysis of directionally solidified cobalt oxide-zirconia eutectic Metals & Ceramics Div., Oak Ridge Nat'l. Lab., Oak Ridge, TN Newbury, D.E. Trace nanoanalysis of nanophase magnetic ceramics by analytical electron microscopy with parallel detection EELS NIST, Microanalysis Res. Group, Gaithersburg, MD Wang, S.S. and Atwater, H. Sn(3x1)/Si(110) reconstruction studies by reflection EELS and EXELFS analysis Dept. Appl. Phys., Caltech, Pasadena, CA
			CHUCK FIORI MEMORIAL SCHOLARSHIP FUND The Chuck Fiori Memorial Scholarship Fund has been enthusiastically responded to by many contributors, both individual and corporate. At current writing, there have been 35 such contributors and a total of $4255 given for this purpose. Notes accompanying the contributions have frequently expressed tragic personal loss at Chuck's passing as well as support for the Scholarship Fund as a way of ensuring continuation of Chuck's work and interests. Harvey Freeman, Treasurer

			TECHNICAL VIDEOTAPES MAS members may rent the following technical videotapes. If you are interested, please contact: Claudia Baker, Tape Librarian Industrial Extension Service North Carolina State University Raleigh, NC (919) 515-5358 EDS: The System and the Detector (Russell) EDS: The Electronics (Russell) Transmission Electron Microscopy of Crystals: Genesis (Howie) Spatially Localized Valence Electron Spectroscopy (Howie) Surface Imaging in Electron Microscopy (Howie) Convergent Beam Diffraction (Eades) AES, SAM, XPS (Hofmeister, MacKay) SIMS, RBS (Griffis, Ray, Swanson) IR, Raman, Ellipsometry (Irene, Lucovsky, Nemanich) LEED, RHEED (Nemanich, Rozgonyi) BSE, SE, ECP (Radzimski) Photoluminescence, Photoconductivity, Photoreflectance (Bachman) TEM, SAD, EDS (Chevacharoenkul, Hren) CBED, HREM, STEM (Maher, Narayan, Posthill) IV, DLTS (Massoud, McLarty) Channel Hot Electron, Junction Leakage, Oxide Integrity, Electrically Active Defects (Nicollian, Osburn, Reisman) EBIC, BIV, CL, LBIC (Maher, Radzimski) STM, FIM/AP, FEM (Hren, Russell)



				3. The MAS 1993 Computer Workshop. There will be a Computer Workshop and Software Exchange at this year's meeting. It will be slightly smaller in scale than the joint meetings with MSA. There will, however, be 3 MS-DOS computers and 3 Apple Macintoshes available for attendees to access the MAS Software Library. These computers will also be available for demonstrations of software written by attendees of the meeting. The same rules apply to the software used in these demonstrations as to that submitted to the library: they must be free or low-cost shareware (<$100 shareware fee). The MS-DOS computers at the meeting will be equipped with at least 4 megabytes of memory, VGA monitors, 3.5 inch floppy disk drives and large hard drives. The Macintoshes will have at least 4 megabytes of memory, 256 color monitors, 3.5 inch floppy disk drives and large hard drives. If any member wishes to demonstrate software that has special requirements, they should contact me as soon as possible and I will try to ensure that their needs are satisfied. John F. Mansfield, Computer Committee Chair North Campus Electron Microbeam Analysis Lab. University of Michigan 2455 Hayward Ann Arbor, MI 48109-2143 Phone: (313) 936-3352 FAX: (313) 763-5567 Email: John.F.Mansfield@umich.edu
	MOUSIN' AROUND COMPUTER ACTIVITIES I have three quick topics to discuss in this issue: 1. The MSA-MAS Computer Bulletin Board. 2. Programs in the MAS Library. 3. The MAS 1993 Computer Workshop. 1. The MSA-MAS Computer Bulletin Board. The joint MSA-MAS computer bulletin board system (BBS), that was started in July 1991 has been a great success. In fact, it has been so successful that it is proving to be too expensive for the society to support! No, that doesn't mean that the system is going to be closed down! It merely means that the toll-free 800 number that was initially used to access the BBS has been replaced by a regular phone number. The phone number for access is now: (708) 252-7917. The communications protocol for connecting to the BBS remains unchanged and is listed in Table 1. I apologize for any inconvenience that this number change may cause. 2. Programs in the MAS Library. In an earlier article of Mousin' Around, I asked authors of programs in the MAS Software Library to send me updated documentation for their software, including a small abstract explaining exactly what their program does. I have not exactly been inundated by responses. In fact, I have not received any replies at all! Since MAS 1993 is fast approaching, I would appreciate some input from authors so that attendees of this year's Computer Workshop can more readily see what each program in the library is supposed to do. Many thanks in advance.


	Table 1. MSA-MAS BBS Communications Protocols



	MISSOURI, ILLINOIS, AND KANSAS MICROBEAM ANALYSIS SOCIETY MIKMAS, the Missouri, Illinois and Kansas Microbeam Analysis Society, officially adopted its name during their second gathering in St. Louis last October. It was held at Monsanto Corporation and hosted by Don Parker. A tour of the electron beam instrumentation laboratories followed the business meeting where Louis Ross of the University of Missouri-Columbia was elected President. Other business topics included holding an annual meeting with CSEMS (the local MSA affiliate), soliciting corporate sponsors for financial support instead of individual dues as a measure to increase membership and encouraging students to participate by holding a presentation competition. Glen Franti of Allied-Signal in Kansas City, Mike Hafften of 3M in Columbia, Dan Krimser of Washington University in St. Louis and Don Parker have been appointed as Directors of MIKMAS. Along with helping the President to organize our group, they have approved a recent suggestion by Don to award the outstanding student presentation with a trip to the national MAS meeting to present their paper. The next meeting will be jointly held with CSEMS on the campus of Sangamon State University in Springfield, IL on May 20th. John Friel will be our keynote speaker. For more information on this meeting or joining MIKMAS, contact Lou at (314) 882-4777 or write him at 101 Geological Sciences Bldg., Univ. of Missouri, Columbia, MO 65211. Louis Ross, President, MIKMAS		1992 awardees are Stephen D. Fields, of the Botany-Microbiology Department of the University of Oklahoma, for his presentation entitled "Development of a spray freezing apparatus for the rapid cryofixation of a fragile, unicellular alga," and Jonathan Icenhower, of the School of Geology and Geophysics of the University of Oklahoma, for his presentation entitled "Behavior of lithophile trace elements and F in peraluminous granitic systems: an experimental study." Each student will receive $600 to support his studies and attendance at the national meetings. Mr. Fields has chosen to attend the 1993 MSA meeting and Mr. Icenhower will attend the 1993 MAS meeting. OkSEM is currently considering a name change to embrace the widening spectrum of optical technologies. Scott D. Russell, Secretary-Treasurer, OkSEM

			METROPOLITAN MICROSCOPY SOCIETY The Metropolitan Section of the Microbeam Analysis Society has officially changed its name to "The Metropolitan Microscopy Society" (M2S). This was the result of a vote taken at their December 9th meeting. David S. Bright (NIST), Steven J. Pennycook (ORNL) and Nestor J. Zaluzec (ANL) were speakers at an M2S meeting held March 31st. The M2S officers for the 1992-1993 season are: Idajean M. Fisher, Chairman IBM: T. J. Watson Research Center P.O. Box 218, MS 30-008 Yorktown Heights, NY 10598 Jerry L. Lehman, Co-Chairman Carl Zeiss Incorporated #1 Zeiss Drive Thornwood, NY 10594 John Weakliem, Secretary / Treasurer Princeton Gamma-Tech Inc., Sales & Marketing 1200 State Road Princeton, NJ 08540 Patricia M. Brady, Special Activities Committee Hoechst Celanese Corporation Technical Center P.O. Box 3700 Somerville, NJ 08876-1252 Idajean M. Fisher, Chairman 1992-1993, M2S

	OKLAHOMA SOCIETY FOR ELECTRON MICROSCOPY On April 16th and 17th, OkSEM conducted its annual spring workshop addressing the topic of confocal scanning microscopy. Dr. Keith McClung, a research scientist with the Noble Foundation and the Oklahoma Medical Research Foundation, presented lectures covering instrument theory, practice and applications. He also conducted an operational demonstration of the CSM using his Meridian Axis argon laser-equipped confocal microscope. In November, OkSEM held its fourth annual student competition for the Timpano Award which provides funds to attend the national meetings of MSA or MAS. In the competition, the judges graded each candidate on the basis of seven major criteria and two candidates tied exactly! We are therefore pleased to support two first prizes. The



	THE MICROBEAM ANALYSIS SOCIETY'S TOUR SPEAKER SCHEDULE FOR 1993


	Respectfully submitted, Paul F. Hlava, MAS Tour Speaker Coordinator Dept. 1822, Sandia National Laboratories, Albuquerque, NM 87185 Phone (505) 844-1890, FAX (505) 844-1778



	NEW SUSTAINING MEMBER 4pi Analysis, Inc. high-performance low-cost scientific innovators 3500 Westgate Drive, Suite 403 Durham, North Carolina 27707 Phone: (919) 489-1757 Fax: (919) 489-1487 Email: go4pi@applelink.apple.com 4pi Analysis develops and markets Macintosh-based hardware and software tools for energy dispersive x-ray spectroscopy and imaging. Now in its third year, 4pi is entering a phase of controlled growth to expand customer support and facilitate new product development.
				4pi's benchmark product, the Spectral Engine, was developed by Scott Davilla, 4pi founder, to enable users of the NIST/NIH Desktop Spectrum Analyzer software program to acquire spectra directly into their Macintosh computers. With ten plus years of experience in EDS hardware and software, Davilla was well qualified to undertake this project. Each of the first eight boards sold was painstakingly wire wrapped. The printed circuit board version of the Spectral Engine, in full production since January, 1992, has been sold to researchers in eight countries. With the success of the Spectral Engine, 4pi will continue its Macintosh-based product development. New products are scheduled for introduction later this year and in early 1994.



	MAS EXECUTIVE COUNCIL

			Treasurer Harvey A. Freeman 958 Long Pond Road Brewster, MA 02631-1898 (508)896-9060 Secretary David S. Simons National Institute of Standards and Technology Bldg. 222, Rm. A113 Gaithersburg, MD 20899 (301)975-3903 FAX: (301)216-1134
	President Thomas G. Huber JEOL (USA) Inc. 11 Dearborn Road Peabody, MA 01960 (508)535-5900 FAX:(508)536-2205 President-Elect John A. Small National Institute of Standards and Technology Bldg. 222, Rm. A113 Gaithersburg, MD 20899 (301)975-3900 FAX: (301)216-1134 Past-President David B. Williams Department of Materials Science and Engineering Whitaker Laboratory 5 East Packer Avenue Lehigh University Bethlehem, PA 18015-3195 (215)758-4224 FAX: (215)758-4244


	DIRECTORS

			Joseph R. Michael (1992-1994) Sandia National Laboratories Org. 1822 P.O. Box 5800 Albuquerque, NM 87185 (505)844-9115 FAX: (505)844-1778 Joanna L. Batstone (1993-1995) IBM T.J. Watson Research Center P.O. Box 218 Yorktown Heights, NY 10598 (914) 945-3778 Charles E. Lyman (1993-1995) Department of Materials Science and Engineering Whitaker Lab 5 East Packer Avenue Lehigh University Bethlehem, PA 18015 (215)758-4249 FAX: (215)258-4244
	John R. Porter (1991-1993) Rockwell International Science Center P.O. Box 1085 Thousand Oaks, CA 91360 (805)373-4702 FAX: (805)373-4775 Phillip E. Russell (1991-1993) Department of Materials Science and Engineering P.O. Box 7916 North Carolina State University Raleigh, NC 27695-7916 (919)515-7501 FAX: (919)515-2932 Dale E. Johnson (1992-1994) Graduate School AG-10 University of Washington Seattle, WA 98195 (206)543-5900 FAX: (206)685-3234



	SUSTAINING MEMBERS Our Sustaining Members Contribute Substantial Support to MAS

			ElectroScan Corporation 66 Concord Street Wilmington, MA 01887 (508)988-0055 FAX: (508)988-0062 Contact: Marshall W. Bates, Jr. / Tom Hardt Energy Beam Sciences P.O. Box 468, 11 Bowles Road Agawam, MA 01001 (800)992-9037 (413)786-9322 FAX: (413)789-2786 Contact: Jeffrey A. Ballou / Steven E. Slap ETP-USA / Electron Detectors, Inc. 1650 Holmes Street, Building C Livermore, CA 94550 (510)449-8534 FAX: (510)449-8996 Contact: Robert J. Ruscica FEI Company 19500 N. W. Gibbs Drive, Suite 100 Beaverton, OR 97006-6907 (503)690-1500 FAX: (503)690-1519 Contact: Andree Kraker / Doug Rathkey Fisons Instruments P.O. Box 1409 San Carlos, CA 94070-1409 (415)591-3600 (508)524-1000 Contact: Joe Robinson / Mike Weiss Gatan, Inc. 6678 Owens Drive Pleasanton, CA 94588-3334 (510)463-0200 FAX: (510)463-0204 Contact: Larry Kolodziejski / Christopher Byrne Geller Microanalytical Laboratory One Intercontinental Way Peabody, MA 01960 (508)535-5595 FAX: (508)535-7653 Contact: Joseph D. Geller HNU X-ray Systems, Inc. 160 Charlemont Street Newton, MA 02161-9987 (800)724-5600 (617)964-6690 FAX: (617)965-5812 Contact: Therese Hipple / Eugene Martin
	4pi Analysis, Inc. 3500 Westgate Drive, Suite 403 Durham, NC 27707 (919)489-1757 FAX: (919)489-1487 Contact: Elizabeth Gregory / Scott Davilla Advanced Microbeam, Inc. 4217 C Kings-Graves Road Vienna, OH 44473 (216)394-1255 FAX: (216)394-1834 Contact: Pamela J. Lesher / Donald P. Lesher Amray, Inc. 160 Middlesex Turnpike Bedford, MA 01730 (617)275-1400 FAX: (617)275-0740 Contact: Kenneth Benoit / Sheldon Moll Cameca Instruments, Inc. 2001 West Main Street Stamford, CT 06902-4853 (203)348-5252 FAX: (203)348-5516 Contact: Andrew Davis / Sam Pindrys Charles Evans & Associates 301 Chesapeake Drive Redwood City, CA 94063 (415)369-4567 Contact: Donald H. Wayne / David A. Reed Dapple Systems 355 West Olive, Suite 100 Sunnyvale, CA 94086 (408)733-3283 FAX: (408)736-2350 Contact: William Stewart Denton Vacuum, Inc. 2 Pin Oak Avenue Cherry Hill, NJ 08003 (609)424-1012 FAX: (609)424-0395 Contact: George Lutz / James L. Campbell Electron Microscopy Sciences / Diatome US 321 Morris Road, P.O. Box 251 Fort Washington, PA 19034 (800)523-5874 (215)646-1566 FAX: (215)646-8931 Contact: Bang Nguyen / Stacie Kirsch



	Horiba Instruments, Inc. Micro-Analytical Division 1080 East Duane, Suite A Sunnyvale, CA 94086 (408)730-4772 FAX: (408)730-8975 Contact: Nancy A. Wolfe JEOL USA, Inc. 11 Dearborn Road Peabody, MA 01960 (508)535-5900 FAX: (508)536-2205 Contact: Robert Santorelli / Charles Nielsen Kratos Analytical, Inc. 535 E. Crescent Avenue Ramsey, NJ 07446 (201)825-7500 FAX: (201)825-8659 Contact: David Surman R. J. Lee Group, Inc. 350 Hochberg Road Monroeville, PA 15146 (412)325-1776 FAX: (412)733-1799 Contact: David Crawford / Albert H. Beebe Leica Instruments, Inc. 111 Deer Lake Road Deerfield, IL 60015 (800)248-0123 (708)405-0123 FAX: (708)405-8139 Contact: Larry Bruder / Robert Brandom Materials Analytical Services, Inc. 3597 Parkway Lane, Suite 250 Norcross, GA 30092 (800)421-8451 (404)448-3200 FAX: (404)368-8256 Contact: Mark Rigler / Bill Longo McCrone Associates, Inc. 850 Pasquinelli Drive Westmont, IL 60559 (708)887-7100 FAX: (708)887-7417 Contact: Kent L. Rhodes / John Gavrilovic Micron, Inc. 3815 Lancaster Pike Wilmington, DE 19805 (302)998-1184 FAX: (302)998-1836 Contact: James F. Ficca, Jr. Microspec Corporation 45950 Hotchkiss Street Fremont, CA 94539 (510)656-8820 FAX: (510)656-8944 Contact: Joseph Carr / William D. Donnelly		Nissei Sangyo America, Ltd. Hitachi Scientific Instruments 460 E. Middlefield Road Mountain View, CA 94043 (415)969-1100 FAX: (415)961-7259 Contact: Donna Armanino / Hideo Naito NORAN Instruments, Inc. 2551 W. Beltline Highway Middleton, WI 53562 (608)831-6511 FAX: (608)836-7224 Contact: Karen Roscoe / Mary Ales Ovonic Synthetic Materials Co., Inc. 1788 Northwood Troy, MI 48084 (800)366-1299 (313)362-1290 FAX: (313)362-4043 Contact: Susan Mamros / Nick Grupido Oxford Instruments, Inc. Microanalysis Group 601 Oak Ridge Turnpike Oak Ridge, TN 37830 (800)769-3673 (615)483-8405 FAX: (615)483-5891 Contact: Graham Bird / Ron Sartin Ted Pella, Inc. P.O. Box 492477 Redding, CA 96049-2477 (916)243-2200 Contact: Robert B. Evans Perkin-Elmer Physical Electronics Division 6509 Flying Cloud Drive Eden Prairie, MN 55344 (800)328-7515 (612)828-6100 FAX: (612)828-6322 Contact: Greg Carpenter Philips Electronic Instruments 85 McKee Drive Mahwah, NJ 07430 (201)529-3800 Contact: Nathan Little / John S. Fahy Princeton Gamma-Tech 1200 State Road Princeton, NJ 08540 (609)924-7310 FAX: (609)924-1729 Contact: Doug Skinner



	SEM / TEC Laboratories, Inc. 4824 South 35th Street Phoenix, AZ 85040 (602)276-6138 FAX: (602)276-4558 Contact: Sam Giallanza / Ed Holdsworth Spectra-Tech / Nicolet 652 Glenbrook Road, P.O. Box 2190-G Stamford, CT 06906 (203)357-7055 Contact: Jerry Hare / John A. Reffner SPI Supplies / Structure Probe, Inc. 569 E. Gay Street, P.O. Box 656 West Chester, PA 19381-0656 (800)242-4774 (215)436-5400 FAX: (215)436-5755 Contact: Kim Royer / Andrew Blackwood		Topcon Technologies, Inc. 6940 Koll Center Parkway Pleasanton, CA 94566-3100 (800)538-6850 (510)462-2212 FAX: (510)846-2803 Contact: Michael McCarthy / Bernard Sherman Topometrix Corporation 1505 Wyatt Drive Santa Clara, CA 95054 (408)982-9700 FAX: (408)982-9751 Contact: Tony Abbis / Paul West Carl Zeiss, Inc. Electron Optical Division One Zeiss Drive Thornwood, NY 10594 (800)356-1090 Contact: Art Dewey / Jerry Lehman