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Micronews

September/October 1993

PRESIDENT'S MESSAGE

Dear Colleagues:

As incoming president, and on behalf of everyone in MAS, I would like to thank Tom Huber for the excellent job he did as the 1993 president. I know that Tom had some reservations when he accepted the job, especially when he found out that he had to deliver, as he put it, his first and last scientific talk at the 1993 MAS meeting.

The 1993 MAS meeting at Loyola Marymount University was a success. I would like to thank the Los Angeles local arrangements and program committees for the excellent scientific program and beautiful meeting locations. I would particularly like to thank Jack Worrall, the LAC chair, for all his efforts in keeping everything running smoothly. In addition to the meeting committees, I would also like to recognize the support of our sustaining members. Without their efforts, it would be difficult to hold successful meetings like the one in LA.

We were honored to have Chuck Fiori's widow, Virginia Fiori, with us during the week. On Monday, I presented Virginia with a plaque in recognition of Chuck's election to honorary membership in the Microbeam Analysis Society. Attending with Virginia were Chuck's daughter, Alice, and his maternal aunt, Agnes Tuberville. Honorary membership is the most prestigious award of our society and is reserved for recognition of those individuals who have made significant scientific contributions to the field of microbeam analysis. We have had only 15 members elected to honorary status and this was only the second time in the 27 year history of the society that we have awarded honorary membership posthumously. Chuck was elected to honorary membership in recognition of his fundamental and practical contributions to x-ray spectrometry particularly with the Si-Li solid state detectors, quantitative analysis with Si-Li detectors, analytical electron microscopy, biological microanalysis and quantitative x-ray mapping; and finally in recognition of Chuck as a great friend to everyone in MAS, always ready with a helpful hand and a good joke.

At the summer council meeting, we passed a motion presented by the Chuck Fiori Scholarship Committee to establish a Chuck Fiori Memorial Tour Speaker Program. A speaker, financed by the Chuck Fiori Memorial Fund, which totals in excess of 4,000 dollars, and the MAS tourspeaker budget,will be available to our local affiliate societies. The topics for the Fiori speaker will be practical in nature and will address the needs of technicians through lectures, workshops and other related activities. The first Fiori speaker, Cindy Zeissler, will be presenting a tutorial on sample preparation for microbeam analysis.

The council is also working to develop closer ties with microbeam analysis communities in the rest of the world. Dave Williams has worked closely with representatives from the European, Australian, and Asian societies to establish an international federation for microbeam analysis. The first international meeting is being planned for Australia in 1995.

The council also established a committee to propose ethical guidelines for financial support of invited speakers at our annual meetings. The committee is scheduled to make a report at the next winter council meeting.

I am pleased to announce that at the annual business meeting we approved the addition of two new local affiliates: the SouthEastern Electron Microscopy Society (SEEMS) and the Microscopy Society of the Ohio River Valley (MSORV). We also approved the slate of nominees for 1994 officers which includes Jon McCarthy as president-elect, David Simons as secretary, and Paul Hlava, Inga Musselman, Carol Swyt, and Nestor Zaluzec as directors.

As the journal, Microbeam Analysis, begins its 2nd year of publication, I would like to thank Rich Linton for his efforts as Editor-in-Chief. The journal is on schedule with respect to the number of submitted papers and the number of pages allocated for MicroNews. We, as MAS members, need to continue to submit our scientific papers for publication in Microbeam Analysis and to request our libraries to obtain journal subscriptions.

In looking forward to this next year as your president, I am pleased to see that the society has a very active and growing membership with the addition of two new local affiliates. It is my hope as president that we continue to expand our services to our members through programs like the Fiori Tour Speaker, the MAS distinguished scholars awards for students, and our interactions with other microbeam communities worldwide through the international federation.

John A. Small

President


	MEETING CALENDAR 5TH TOPICAL CONFERENCE ON QUANTITATIVE SURFACE ANALYSIS November 12-13, 1993 Clearwater Beach, FL Contact: Paul Holloway University of Florida 258A Rhines Hall Gainesville, FL 32611 (904) 392-6664 (904) 392-4911 FAX AVS 4OTH NATIONAL SYMPOSIUM November 15-19, 1993 Orlando, FL Contact: AVS 335 E. 45th Street New York, NY 10017 (212) 661-9404 MATERIALS RESEARCH SOCIETY FALL MEETING November 29 - December 3, 1993 Boston, MA Contact: MRS 9800 McKnight Road Pittsburgh, PA 15237 (412) 367-3003 (412) 367-4373 FAX PITTCON '94 February 27 - March 4, 1994 Chicago, IL Contact: Alma Johnson (412) 825-3220		XIII INTERNATIONAL CONGRESS ON ELECTRON MICROSCOPY July 18-22, 1994 Paris, France Contact: B. Jouffrey SFME, 67 rue Maurice Gunsbourg 94205 Ivry sur Seine cedex France 33-1-46702844 33-1-46708846 FAX MAS / MSA 1994 July 31 - August 5, 1994 New Orleans, LA Contact: MSA Meeting Office P.O. Box MSA Woods Hole, MA 02543 (800) 538-3672 (508) 548-9053 MAS 1995, Denver, CO MAS / MSA 1996, Minneapolis, MN 16TH SYMPOSIUM ON APPLIED SURFACE ANALYSIS (ASSD) June 15 - 17, 1994 Burlington, MA Contact: Joseph Geller Geller Microanalytical One Intercontinental Way Peabody, MA 01960 (508) 535-5595
	MAS / MSA MEETING MAS 1993 The 27th Annual Meeting and AEM Workshop July 11-16 Loyola Marymount University Report by Thomas G. Huber, Past President The MAS council met Saturday, July 10, 1993. Of particular interest was council's decision to dedicate all donations to "The Chuck Fiori Memorial Fund", approximately $4,600, to advancing the education of technicians in our field. This year, an appropriate speaker will be placed on our tour to address matters of interest to our technicians. We are all quite sure that Chuck would have very much agreed with this decision. Council also confirmed Chuck's honorary membership and a plaque was handed to Ginny, Chuck's wife, and to his daughter Alice, both attending the meeting for the week.		Our nominating committee, chaired by then President-elect John Small, offered the following slate for consideration in our fall elections: President - elect Jon McCarthy, NORAN Secretary Dave Simons, NIST Director (2 positions) Paul Hlava, Sandia Inga Musselman, UT-Dallas Carol Swyt, NIST Nestor Zaluzek, ANL

27th MEETING OF THE

MICROBEAM ANALYSIS SOCIETY

Loyola Marymount University

Marina del Rey / Los Angeles, California

July 11-16, 1993

I would like to take this opportunity to give you a quick update on some of the numbers for MAS 1993. We had a total of 317 registrations for the meeting. Of this number, 201 were full registrations, 10 were students, 37 were one day registrations, and 69 were exhibitors. We also had 19 guests and 20 children registered for the meeting. While this number was somewhat below our expectations, it is actually quite close to the number attending previous MAS only meetings. Given the current conditions weprobably did quite well. While the final financial numbers will not be available until all of the bills are cleared, the meeting is extremely close to breaking even. We owe a big thank you to the exhibitors who contributed to our success by having a booth, and a very special thanks to those who added to the success of our program by their contributions.

I hope all of you who came to Loyola this year enjoyed your visit and the excellent meeting we had. I assure all of you who have made comments to me on how well the meeting went, that I have forwarded those comments to the committee. The LAC was a wonderful group of people who worked very hard to put this meeting together. I would like to take this opportunity to thank them all for their hard work and commitment to MAS 1993 (Please see list). It is with mixed feelings that I leave this task behind. While it was a bit of a strain, it was also a very rewarding experience working with the LAC and seeing all of the planning come to such a fantastic ending. Did I really say I had a good time? Absolutely. Thanks again for coming.

Jack L. Worrall

LAC Chair MAS 1993

P.S. All non member attendees at this years meeting will become members automatically. The success of our meeting, and for that matter the society in general, depends on participation. I believe that we all know at least one person who would benefit by receiving the journal and attending our meetings. With a little extra effort I think I can get that one person I know to join MAS. How about you??

Local Arrangements Committee

Program Chair: John Armstrong - Caltech

John Porter - Rockwell Science Ctr.

Dave Williams - Lehigh University

Al Romig - Sandia

Treasurer: Art Chodos - MAS

Secretary: Carol Garland - Caltech

Activities: Paul Carpenter - Caltech

Site Coordinator Phil Whitesmith - TRW

& Registration: Bob Jones - UCLA

Housing & Brad Lawrence - Bio-Rad

Registration: Carol Garland - Caltech

Exhibitors: Carol Burbridge - ARCO

Publications: Don Dietrich - Rockwell

Workshops: Roland Marti - SEAL

As has been said many times before, it is indeed a very special privilege to single out members of our Microbeam Analysis Society to receive Presidential Awards. This year the Presidential Award was presented to Dale Newbury, NIST, the Service Award was presented to Harvey Freeman, MAS Treasurer, and the Heinrich Young Scientist Award was presented to Phillip Russell, NCSU.

I am deeply indebted to all of the speakers taking part in the Presidential Symposium. Your presentations brought forth so many very positive comments for which I was able to take credit. Thank you one and all and a special thanks to all of you who filled the hall.

Last, but not least, all of us wish to thank the local arrangements committee, chaired by Jack Worrall, John Armstrong and John Porter, program co-chairs, and all of the committee members for a great meeting. The program was excellent and the socials were just great. The Mexican buffet and the Inca Peruvian folk music were outstanding. But Montazumas Revenge at Knotts Berry Farm truly took our breath away. It was a very nice afternoon. Thanks again LA Committee, you provided a real family environment both for young and old all week long. You were great. Thank you.

Finally, one last time, I must say thank you to our membership and to our council and committee chairs for giving me this wonderful opportunity to serve you and our society. Its been a very rewarding and memorable experience for me and I do hope a pleasant one for you.

Very Sincerely,

Thomas G. Huber

Past President, MAS



	MAS 1993 - COMPUTER WORKSHOP AND SOFTWARE EXCHANGE John Mansfield, MAS Computers Activities Chair In conjunction with this year's MAS only meeting at Loyola Marymount University in Los Angeles, The Microbeam Analysis Software Library Computer Workshop and Software Exchange was held. The workshop was located this year in the registration area, a good location to welcome workshop attendees, as they were able to easily determine its location whilst waiting to register. The equipment available this year comprised three Apple Macintosh systems and two MS-DOS systems and an Apple LaserWriter. The free loan of the Apple computers was negotiated by John Mansfield and was courtesy of Rani Kelly the local Apple Higher Educational Representative. The MS-DOS equipment and the Apple LaserWriter were rented from a local rental company by Brad Lawrence. The LaserWriter proved invaluable in saving a number of attendees talks, since they were able to make last minute changes and additions to their view graphs. A number of new programs were added to the MASSL this year. Four Macintosh programs from the University of Michigan were added, three of which related to SEM diffraction pattern analysis and one was an image processing utility. ECPOrient performs crystal orientation determinations on electron channeling patterns. MisMat and FindCSL further process the outputs from ECPOrient to determine crystal texture and coincident site lattices. TiffMaker is a small utility to convert Tracor/Noran TN5500 images and X-ray maps and Kevex images and X-ray maps to TIFF images. Rich Waldo from GM		Research in Warren, Michigan updated his thin film X-ray analysis program. John Armstrong of Caltech updated his program CITZAF. Paul Carpenter, also from Caltech, has been busy converting CITZAF to run on the Macintosh and in the process has been porting it to C, thus enabling the program to be compiled on a wide variety of UNIX workstations in addition to PCs and Macs. A beta version of his code was added to the library and a full release version should be available soon (watch the readme files on the MASSL ftp server, freebie.engin.umich.edu, for details). The dispersed nature of this years conference, i.e. the fact that the sessions were located in lecture theaters all over campus, meant that there was a decrease in the attendance at the workshop compared to other years. However, it is estimated that there were over 50 of the conference registrants who took advantage of the workshop and in all the workshop was a success. Next years workshop will be held jointly with MSA and should feature a number of live demonstrations of microscopy and image analysis software and also a primer to computer communications. Further information will be made available in a later issue of MicroNews.



	MAS / MSA Joint Meeting Ernest N. Morial Convention Center New Orleans, Louisiana July 31 - August 5, 1994 LAC Chair: Joe A. Mascorro (504) 584-2747; (504) 584-1687 FAX LAC Co-chair, MAS Liaison G. W. Bailey (504) 275-8581; (504) 275-8581 FAX Program Co-chairs: John J. Friel, PGT MAS Program Chair (609) 924-7310; (609) 924-1729 FAX Tony Garratt Reed, MIT MSA Program Chair The 1994 meeting of the Microscopy Society of America and the Microbeam Analysis Society will be held in New Orleans from July 31st through August 5th. The scientific program and corporate exhibits show will take place in the Ernest N. Morial Convention Center located at the foot of Canal Street in the "hub" of activity in downtown New Orleans. The Sunday Opening Reception will be held July 31st at the Aquarium of the Americas which is adjacent to Woldenberg Park, a beautiful green space overlooking the Mississippi River. The evening will include leisure tours of the aquarium, spicy New Orleans food, and great jazz music. The Exhibitor's Mixer will take place on Wednesday afternoon, August 3rd, in the exhibit hall of the convention center. A riverboat excursion with hors d'oeuvres or dinner buffet is being considered for theMAS social function. The MSA Annual Golf Tournament will take place at the Audubon Golf Course located in uptown New Orleans, immediately across the street from Tulane University. Many possibilities exist for specialized tours including plantation trips, bayou and swamp boat cruises, Cajun cooking and dancing classes, jazz breakfasts at French Quarter courtyard restaurants, zoo cruises via riverboat, and dinner/jazz cruises. In addition, riverboat gambling boats will probably be operating and docking at the foot of Canal Street. Call and Instruction for Papers The Registration Bulletin / Call for Abstracts will be mailed in early December 1993. The deadline for abstracts is March 15, 1994. Preliminary Technical Program Joint MAS / MSA Symposia: Merging Advanced Computing with Microscopy J. McCarthy, NORAN / W. Carrington Scanned Probe Microscopies I. Musselman, UT-Dallas / J. Hoh Low-Voltage and FEG-SEM M. Rosenfield / K. Alexander Analytical Electron Microscopy J. Michael, Sandia / M. Libera MAS Techniques Sessions: Presidential Symposim on Chemical Microanalysis J. Small, NIST Quantitative Microanalysis E. Lifshin, GE Optical Microanalysis J. Reffner, Spectra-Tech SEM Environmental R. Bolon, GE Microbeam Mass Spectrometry S. Novak, Evans East New or Emerging Techniques D. Newbury, NIST Instrumentation F. Schamber, RJ Lee Micro XRD / XRF B. York, IBM		MAS Applications Sessions: Materials Applications B. Carter, U. Minn. Semiconductor and Microelectronics Applications J. Batstone, IBM Geological S. Mehta, Arco / Paul Hlava, Sandia Biological M. Bond, Cleveland Clinic MAS Topical Sessions: X-ray and Image Analysis in the Petroleum Industry E. Prestridge, PGT Microanalysis of Coatings and Interfaces J. Goldstein, U. Mass. ISO TC 202 Microanalysis Standards R. Myklebust, NIST MSA General Symposia: Presidential Symposium: Microscopy Towards the 21st Century X-ray Microscopy Direct Digital Imaging Energy Filtered Imaging and EELS Advances in Instrumentation for Light Microscopy Computational Methods in Microscopy MSA Physical Symposia: Atom Probe and 3-D Atom Probe Microscopy UHR SEM Self-assembled Materials Microscopy of Ferro-electric Materials Crystallographic and Texture Analysis Using Electron Diffraction in the SEM Developments and Applications of HREM MSA Biological Symposia: Advances in Macromolecular Microscopy Advances in Fluorescence Probes for Microscopy Advances in Diagnostic Imaging Organization of the Cell Nucleus Microanalytical Approaches to Systems Neurobiology Cellular Neurobiology
			NEWS RELEASE The American Society for Testing and Materials (ASTM) has recently published a "Standard Guide to Quantitative Analysis by Energy Dispersive Spectroscopy". John Friel of PGT, who chairs the subcommittee that wrote it, said the Standard Guide is designated E 1508 and covers many aspects of good microanalysis practice from specimen preparation through spectrum collection and data reduction. It also includes a section of the precision and bias of the technique based on an interlaboratory round-robin test program. The Standard Guide is published in the 1993 edition of Vol. 03.01 of the ASTM Annual Book of Standards



	ELECTION OF OFFICERS President Jon J. McCarthy Jon J. McCarthy is currently the Director of Technology for NORAN Instruments, Inc. Jon received a B.S. in Physics and Mathematics (double major) from the University of Wisconsin-Eau Claire in 1968 and his Ph.D. degree in Physics from Iowa State University in 1973. From 1973 to 1975 he held a postdoctoral appointment at the Center for Radiation Research at NBS (now NIST). Since 1975, Jon has been developing instrumentation for microanalysis as an instrument designer, senior scientist, and in various management roles. Jon's technical interests have spanned a broad range of problems in analytical microscopy, including electron microprobe automation, algorithms for spectral processing and quantitative analysis, automated image analysis in SEM, and confocal microscopy. Current efforts have focused on development of very high performance Si(Li) and HPGe detectors for applications in AEM and SEM. Jon has authored or co-authored over 40 technical publications and holds four patents related to instrumentation. In addition to MAS, Jon is a member of the American Physical Society, the Materials Research Society and the Microscopy Society of America. An MAS member since 1980, Jon has served the society in several different capacities. Jon has been a session chairman in 1986 and 1992, is a member of the program committee for the 1994 meeting and will serve as the MAS co-program chair for the 1996 meeting in Minneapolis. Jon was an MAS tour speaker in 1987 and will fill that role again in 1994. Jon was an MAS Director from 1989-1991 and is currently the MAS Corporate Liaison. As a Director, Jon's contributions included the design of the new MAS logo, membership brochure, and sustaining member plaques. Secretary David Simons David Simons is a research physicist in the Microanalysis Research Group at the National Institute of Standards and Technology. He received his Ph.D. in solid state physics from the University of Illinois in 1973. A post-doctoral appointment with Charles Evans in the Materials Research Lab at the U of I introduced him to analytical chemistry and to secondary ion mass spectrometry. From 1976 to 1979 he was a chemist in the mass spectrometry group at the Knolls Atomic Power Laboratory in Schenectady, New York. From there, he moved to his present position at NIST, where he is currently a project leader for microbeam mass spectrometry. Dave has specialized in the applications of microbeam mass spectrometry (laser microprobe mass spectrometry, dynamic SIMS and time-of-flight SIMS) to microelectronic materials and to particle analysis. He has served as a session chairman for SIMS and LAMMS at numerous MAS meetings, and he was a national tour speaker for the society on the subject of laser microprobe mass spectrometry in 1984-85. Dave has been the secretary of MAS since January, 1992.		Jon J. McCarthy David Simons Paul F. Hlava Inga H. Musselman Carol Swyt Nestor J. Zaluzec

Director

Paul F. Hlava

Inga H. Musselman

Carol Swyt

Nestor J. Zaluzec

Paul F. Hlava

Paul F. Hlava is a senior member of the technical staff at Sandia National Laboratories in Albuquerque, NM where he is in charge of the electron microprobe laboratory. An MAS member since 1976, Paul has coordinated the MAS Tour Speaker Program for the past three years. He is currently president of the New Mexico Microbeam Users Group. Paul has served on the program committee of several MAS conferences and he served on the local arrangements committee of the 1986 MAS/EMSA meeting in Albuquerque. He is also a member of several geologically oriented societies (Mineralogical Society of America, Friends of Mineralogy, etc.)

Paul's research interests lie in solving analytical problems associated with microprobing materials containing exotic elements such as unusual minerals, especially those containing rare earths or platinoids, etc., as well as similar ceramics, alloys, brazes, solders, etc. He has published over 60 papers and given over 70 presentations on a wide variety of materials problems.

He received his B.S. in Geology from the University of Wisconsin - Madison in 1964 and his M.S. in Geology from the University of New Mexico in 1974.

Inga H. Musselman

Inga H. Musselman is an Assistant Professor of Chemistry at the University of Texas at Dallas. She received her B.A. degree in chemistry from Gettysburg College in 1982 and her Ph.D. degree in analytical chemistry from the University of North Carolina at Chapel Hill (UNC-CH) in 1988. Her dissertation, under the direction of Rich Linton, was concerned with the application of laser microprobe mass spectrometry for the quantitation and chemical speciation of microscopic particles, involving collaborative studies with the microanalysis group at the National Institute of Standards and Technology. From 1988-1991, she had a postdoctoral appointment in Phil Russell's group in the Department of Materials Science and Engineering at North Carolina State University. There, she developed a patented technique to fabricate controlled geometry tips for the scanning tunneling microscope and also applied scanning probe techniques to the study of polymer surfaces. In 1991-1992, she was a visiting lecturer in the Department of Chemistry at UNC-CH. Her current research interests include the study of polymeric thin films, Langmuir-Blodgett films and self-assembled monolayers using scanning probe microscopies.

Dr. Musselman has been a member of MAS since 1984 and is currently the MicroNews Editor for Microbeam Analysis. In 1985, she received the Castaing Award for the best student paper at the national MAS meeting. She is serving as co-chair of the Scanned Probe Microscopies Symposium for the 1994 MAS/MSA meeting in New Orleans. In addition to MAS, she is a member of the American Chemical Society and the American Vacuum Society.

Nestor J. Zaluzec

Nestor J. Zaluzec is currently the Scientific Director of the Electron Microscopy Center for Materials Research at Argonne National Laboratory. He received his BS in Physics from Illinois Institute of Technology in 1973 and his PhD in Metallurgy from the University of Illinois - Champaign-Urbana in 1978. As an instrument scientist, Nestor's main research interests are divided into technique development and applications to materials science. They include: microcharacterization of materials via Analytical Electron Microscopy, Electron and Ion Optics, X-ray and Electron Spectroscopy, Convergent Beam Electron Diffraction, Structural Phase Transformations, Electron Irradiation Effects/Damage, and Charge Density Measurements.

Nestor has been a member of MAS and MSA since 1979, the Midwest Society for EM, the Australian EM Society, the Royal Microscopical Society, the Microscopical Society of Canada, as well as the ASTM. He serves on multiple committees including: MAS Journal, MSA Bulletin, ASTM E-42, ASTM-TC-202 (chairman of the subcommittee's on Analytical Electron Microscopy, Data Management and Treatment), MSA Education Committee, MSA Standards Committee, and is also currently the Materials Science Program Director for the MSEM. He has organized the Electron Microscopy and Microanalysis Public Domain Software Library, and is the SysOp for the MSA/MAS Electronic Bulletin Board. He has also kept involved with both MAS and MSA annual meetings being on the Program Committee for the annual meetings for one or the other of the two societies for the last 6 years, and is the 1993 MAS Tour Speaker.

Nestor was awarded the Eugene P. Wigner Research Fellowship at Oak Ridge National Laboratory in 1978, the E.G. Burton Medal in EM from (E)MSA in 1982, and was selected as one of the 100 Brightest Scientists in the US by Science Digest in 1984. He has held adjunct Associate Professorships at both IIT and University of Illinois, and is also on the advisory board of the Illinois Junior Academy of Science which is involved with fostering the sciences in Middle and High School Students. He has taught short courses on AEM in the US, Japan, Europe, & Australia, written a "few" papers and book chapters, and serves as a reviewer and member of technical advisory panels for NSF and DoE. He has been an invited speaker at numerous meetings and is hard to miss seeing even in a crowd.

EMERITUS MEMBERSHIP

Emeritus membership is available to current members of MAS who have retired from remunerative professional work and who have been full members of the society for at least ten consecutive years immediately prior to retirement, or who have otherwise provided distinguished service to the society. The current dues for emeritus members are $5.00 per year, which includes the MicroNews section of the journal. Emeritus members can receive the full Microbeam Analysis journal for an additional $25.00 per year. Applications for emeritus membership should be made in writing to the secretary of MAS, indicating dates of full membership in the society and of retirement. Applications will be considered at the next meeting of the executive council following receipt.

Prepared by David Simons

Secretary, MAS

July 26, 1993

NEW MAS AFFILIATES

The MAS council, at its summer meeting, voted to approve the affiliation of the SouthEastern Electron Microscopy Society (SEEMS) and the Microscopy Society of the Ohio River Valley (MSORV). We welcome these two new affiliate members.

The SouthEastern Electron Microscopy Society was formed in 1965 in response to a need for support and diffusion of knowledge in the southeast about the new field of electron microscopy. Today we are a regional society representing over ten states with a membership of over 300. We are one of the largest and most supportive LAS's of the MSA and will be hosting the MSA 1998 meeting in Atlanta. Our 1994 meeting will be a joint meeting with Scanning 94 in Charleston, SC (May 16-20). Over the past few years our membership has evidenced a strong desire to expand our society to cover all fields of microscopy and analysis. To these ends we are very pleased to have become one of the newest LAS's of the MAS. We are looking forward to an equally long and prosperous association with MAS.

Sandra H. Silvers, President, SEEMS

The Microscopy Society of the Ohio River Valley was formed in 1981 to meet the needs of microscopists in the tri-state area of Ohio, Indiana, and Kentucky which share the watershed of the scenic Ohio River Valley. It is also affiliated with the Microscopy Society of America (MSA). The society, with about 150 regular members and 30 corporate members, is well balanced in its mixture of members in the physical and life sciences. At the 1993 spring meeting in Louisville which was held in conjunction with the Louisville Advanced Technology Council, the members voted to drop "Electron" from the society's name. At that meeting, it was also decided to petition MAS for affiliation because of the large number of members that are performing microanalysis. Many of its members are members of MAS and are excited about the new affiliation. MSORV is an active local society; it holds two meetings a year and a newsletter is put out on a regular basis. The society plans to take advantage of the MAS tour speaker program. MSORV is the host for the 1993 51st Annual Meeting of MSA in Cincinnati with Ruth V. W. Dimlich chairing the Local Arrangements Committee. The current MSORV officers are Robert R. Cardell, Jr. (who is the 1993 President of MSA), President; Scott D. Walck, President-Elect; Ann B. Kier, Secretary; and Ray Boissy, Treasurer

Scott D. Walck, President-Elect, MSORV

EMPLOYMENT:

OFFERED AND WANTED

MICROPROBE ANALYST

Twenty five years experience in microprobe analysis operation and maintenance. Experienced with five different probes plus EDS applications. Able to provide support programming in FORTRAN, BASIC, and FLEXTRAN. If interested, please contact:

Robert Heyman

4410 Anice

Houston, TX 77039

(713) 449-9743

MATERIALS SCIENTIST / MICROSCOPIST

Seeking employment in either industry or university in the general field of Materials Science and specifically in the area of analysis and characterization of inorganic materials.

Have had extensive experience in the use of electron microscopy for the characterization of all types of materials associated with data storage, including polymers. Expert in the various applications of SEM, TEM and optical microscopy along with associated tools, including EDS, EELS and image processing, as well as XRD and XRF. Developed computer programs for the analysis of the complex data typically found in many of the spectroscopies.

Presently a part time instructor at Gavilan College, Gilroy, CA, teaching courses in the Physical Sciences Department.

Took early retirement, after 19 years, from IBM Research, San Jose, CA, where I was involved in the micro characterization of all types of magnetic and optical materials and associated artifacts, including lube and other overcoat materials, and the analysis of component failures. Pioneered many techniques for the analysis and understanding of storage media. Major resource person for electron beam analysis problems.

Roy H. Geiss

15575 Via Veneto

Morgan Hill, CA 95037

(408) 778-0102

THE MAS TOUR SPEAKER PROGRAM FOR 1993-1994

As everyone should know, MAS sponsors a yearly visit by a nationally recognized expert in some facet of microbeam analysis to each of the affiliated societies. These Tour Speakers give a presentation on their special field of research at the affiliated society's home and at a mutually agreed time and date: MAS pays the expenses. During the Affiliated Societies Committee meeting of Tuesday, July 13, 1993 (at Loyola Marymount University in Los Angeles, during the MAS Conference) three people were selected as candidate Tour Speakers for MAS this year. These people, their affiliations, and their topics are:

Dave Bright, NIST

Image Processing and Free Software for the Microscopist

Jon McCarthy, NORAN

The Effect of Detector Dead Layer on Light

Element Detection

Cindy Zeissler, NIST

Preparation Methods for Particle Analysis: Picking Particle Preparation Procedures to Prevent Painful Problems

Enclosed are short abstracts and biographies for the three speakers. I would appreciate the various program chairs presenting this information to their societies and getting back to me as soon as they have decided upon a speaker and/or an approximate to definite date. I will try to arrange schedules so that the tour speaker program doesn't bankrupt the society. When enough of the societies have responded for me to schedule some tentative tour swings, I will chase after some of the laggard societies and twist some arms. I also want to add that we are always open to suggestions for future tour speaker authors and topics and even to alternate speakers in lieu of our list. If we think we can accommodate you, we will try.

If you have any questions, do not hesitate to contact me.

Sincerely,

Paul F. Hlava

MAS Tour Speaker Coordinator

Dept. 1822

Sandia National Laboratories

Albuquerque, NM 87185

(505) 844-1890 (office)

(505) 844-6174 (lab)

(505) 844-1778 (FAX)

TOUR SPEAKER ABSTRACTS

AND BIOGRAPHIES

Image Processing and Free Software for the Microscopist

David S. Bright

Surface and Microanalysis Science Division

National Institute of Standards and Technology

Gaithersburg, MD 20899

(301) 975-3911

bright@enh.nist.gov

Abstract:

This tutorial will review some of the basic principles of image processing using example micrographs, and will illustrate the advantages and disadvantages of various algorithms and image processing operations. The talk can be slanted to the interests of the audience, and include examples from x-ray mapping, for example. Images and imaging problems from the audience can be discussed if I'm given them in advance. The talk can include an overview of image processing techniques, discussions of free software, review books, journals and network mailing lists.

Biographical sketch:

Dr. Bright has been a research chemist at the National Institute of Standards and Technology since 1976. In 1984, he joined the Microanalysis Group of the Center for Analytical Chemistry to develop an image analysis system, and apply image analysis techniques to various research problems of the group. Researchers use the system to automate electron microscopes, identify arrays in electron diffraction patterns, and examine x-ray maps. Dr. Bright has authored several dozen papers on image analysis since 1983, including an Interface article in Analytical Chemistry, and has given over twenty invited talks on the subject. He received his Ph.D. in Biophysics from Colorado State University in 1975, and is married with four children.

The Effect of Detector Dead Layer on Light Element Detection

Jon J. McCarthy, Ph.D.

NORAN Instruments, Inc.

2551 W. Beltline Highway

Middleton, WI 53562

(608)831-6511

(608)831-2313 FAX

Abstract:

Many factors influence the performance of EDS systems in the detection of photons below 1 keV. The major factors are the electronic noise of the system, the properties of the semiconductor material used as the detecting element, photon absorption by the vacuum window of the system, the metals used as voltage contact, and the "dead layer" associated with the front surface of the detector diode.

In the last five years, much progress has been reported in reducing the effect of several of these factors. Reduction of electronic noise of EDS system, and the use of new vacuum window materials are well known. The use of alternative semiconductor materials for detectors, specifically high purity germanium, in place of lithium drifted silicon has also met with some success. However, the subject of the dead layer has not been explored in much detail in the recent literature. After a brief review of the state of the art in electronic noise reduction and window technologies, this paper will discuss the spectral characteristics caused by the detector dead layer and the efforts made to minimize these effects. The results of these studies has lead to a better understanding of the detector dead layer and to significant improvements in light element sensitivity of EDS systems.

Biographical sketch:

Jon J. McCarthy is currently the Director of Technology for NORAN Instruments. Jon received a B.S. in Physics and Mathematics (double major) from the University of Wisconsin - Eau Claire in 1968 and his Ph.D. degree in Physics from Iowa State University in 1973. From 1973 to 1975 he held a postdoctoral appointment at the Center for Radiation Research at NBS (now NIST). Since 1975, Jon has been at NORAN (previously Tracor Northern) where he has been involved with developing instrumentation for microanalysis. Jon's current technical interests have focused on development of very high performance Si(Li) and HPGe detectors for applications in AEM and SEM. Jon has authored or co-authored over 40 technical publications, and holds four patents related to instrumentation. In addition to MAS, Jon is a member of the American Physical Society, the Materials Research Society, and the Microscopy Society of America.

An MAS member since 1980, Jon has served the society in several different capacities. Jon has been a session chair in 1986 and 1992, is a member of the program committee for the 1994 meeting, and will serve as the MAS co-program chair for the 1996 meeting in Minneapolis. Jon was an MAS Director from 1989-1991, and is currently serving as the MAS Corporate Liaison. As a Director, Jon's contributions included the design of the new MAS logo, membership brochure, and sustaining member plaques. Preparation Methods for Particle Analysis (Picking Particle Preparation Procedures to Prevent Painful Problems)


	Cindy Zeissler (Fiori Memorial Speaker) Surface and Microanalysis Science Division National Institute of Standards and Technology Gaithersburg, MD 20899 (301) 975-3910 Abstract: Particle preparation for electron or ion beam analysis can require special methods and tricks. One may need to worry about how to distribute a heterogeneous powder evenly on a substrate without biasing the results, or one may wish to mount a single precious particle without losing or altering it. Methods such as static control, ultrasonification, suspension dispersion and evaporation, filtration, film casting tricks, and micromanipulation can be utilized to achieve these goals. Trace analysis or single particle work may require the use of light microscopy and clean room practices. The choice of liquid reagent used for dispersion or various handling and preparation methods can also be an important factor to consider to avoid chemical and morphologic artifacts. This talk will discuss a broad range of practical topics pertinent to both bulk and single particle preparation: equipment, reagents, methods, artifacts, and results. Micrographs will be used to help elucidate the special behavior and problems of particles in the microworld and how to handle them. Tricks and tips will be offered for problems such as avoiding "tiddleywinks" or static-induced losses, how to turn a single or an entire field of particles upside down to analyze the other side, "quickie" preparation methods, clean methods for trace analysis, and others.		Biographical sketch: Cynthia Zeissler began work at NIST in 1985. She holds a B.S. in Geology from the University of Maryland, College Park. Her specialties include neutron-induced radiography and autoradiography using track-etch and semiconductor detectors, light and electron microscopy as applied to particle analysis for materials science problems, and clean room operations for trace analysis. Recent areas of research include ppm-level microscale mapping of uranium in minerals, and the co-development of a novel video radiation imager. The sample preparation skills developed to support these and other analytical methods have emphasized particulate samples, with special attention to clean, nondestructive micromanipulation and preparation methods of single microscopic particles.

	MAS EXECUTIVE COUNCIL
	President John A. Small National Institute of Standards and Technology Bldg. 222, Rm. A113 Gaithersburg, MD 20899 (301)975-3900 FAX: (301)216-1134 Past-President Thomas G. Huber JEOL (USA) Inc. 11 Dearborn Road Peabody, MA 01960 (508)535-5900 FAX:(508)536-2205		Treasurer Harvey A. Freeman 958 Long Pond Road Brewster, MA 02631-1898 (508)896-9060 Secretary David S. Simons National Institute of Standards and Technology Bldg. 222, Rm. A113 Gaithersburg, MD 20899 (301)975-3903 FAX: (301)216-1134


	DIRECTORS
	John R. Porter (1991-1993) Rockwell International Science Center P. O. Box 1085 Thousand Oaks, CA 91360 (805)373-4702 FAX: (805)373-4775 Phillip E. Russell (1991-1993) Department of Materials Science and Engineering P. O. Box 7916 North Carolina State University Raleigh, NC 27695-7916 (919)515-7501 FAX: (919)515-2932 Dale E. Johnson (1992-1994) Graduate School AG-10 University of Washington Seattle, WA 98195 (206)543-5900 FAX: (206)685-3234		Joseph R. Michael (1992-1994) Sandia National Laboratories Org. 1822, P. O. Box 5800 Albuquerque, NM 87185 (505)844-9115 FAX: (505)844-1778 Joanna L. Batstone (1993-1995) IBM T. J. Watson Research Center P. O. Box 218 Yorktown Heights, NY 10598 (914)945-3778 Charles E. Lyman (1993-1995) Department of Materials Science and Engineering Whitaker Lab 5 East Packer Avenue Lehigh University Bethlehem, PA 18015 (215)758-4249 FAX: (215)258-4244

	ADDITIONAL MAS REPRESENTATIVES
	Accountant, Dues and Mailing List VCH Publishers, Inc. 303 NW 12th Avenue Deerfield Beach, FL 33422-8824 (800)367-8249 FAX: (305)428-8201 Affiliated Groups V. E. Shull (517)355-2252 Paul Hlava (Vice-Chair) Sandia National Labs., Div. 1822 Albuquerque, NM 87185 (505)844-1890 FAX: (505)844-1778 Awards Committee for MAS 1994 Dale E. Johnson (see Directors) (206)543-5900 FAX: (206)685-3234 Joseph R. Michael (see Directors) (505)844-9115 FAX: (505)844-1778 Computer Activities Committee John F. Mansfield University of Michigan, North Campus 2455 Hayward Ann Arbor, MI 48109-2143 (313)936-3352 FAX: (313)763-5567 Email: jfm@ruddles.sprl.umich.edu		Paul Carpenter (818)356-6126 FAX: (818)568-0935 Conference Proceedings Inventory C. Susskind San Francisco Press, Inc. Box 6800 San Francisco, CA 94101-6800 (510)524-1000 Corporate Liason Committee Jon McCarthy NORAN Instruments, Inc. 2551 W. Beltline Highway Middleton, WI 53562 (608)831-6511 FAX: (608)831-2313 Education Committee Phillip E. Russell (see Directors) (919)515-7501 FAX: (919)515-2932 Finance Committee, Archivist Gordon Cleaver GE Vallecitos Nuclear Center P. O. Box 460, MC V08 Pleasanton, CA 94566 (510)862-4320 FAX: (510)862-4244


	Historian, Membership Services, Publicity, and Sustaining Membership Committee Art Chodos P. O. Box 1014 Monrovia, CA 91017-1014 (818)357-0183 FAX: (818)568-0935 (for Federal Express or UPS) 302 Acorn Circle Monrovia, CA 91016-1807 International Liaison David B. Williams Department of Materials Science and Engineering Whitaker Laboratory 5 East Packer Avenue Lehigh University Bethlehem, PA 18015-3195 (215)758-4224 FAX: (215)758-4244 Long Range Planning Committee Alton D. Romig, Jr. Material and Process Sciences Sandia National Laboratories Albuquerque, NM 87185-5800 (505)844-8558 MAS-MSA Liason, Nominations and Presidents Award John A. Small (see President) (301)975-3900 FAX: (301)216-1134 Membership Chairman Robert W. Warner GE Vallecitos Nuclear Center P. O. Box 460 MC V03 Pleasanton, CA 94566 (510)862-4389 FAX: (510)862-4515		Memberships Lists John Friel PGT 1200 State Road Princeton, NJ 08540 (609)924-7310 FAX: (609)924-1729 Microbeam Analysis Journal Richard W. Linton, Editor-in-Chief Department of Chemistry - CB3290 University of North Carolina Chapel Hill, NC 27599-3290 (919)962-2152 FAX: (919)962-1547 MicroNews Editor Inga Holl Musselman Chemistry Program, BE 26 University of Texas at Dallas P. O. Box 830688 Richardson, TX 75083-0688 (214)690-2706 FAX: (214)690-2925 (for Federal Express or UPS) Chemistry Program, BE 26 University of Texas at Dallas 2601 North Floyd Road Richardson, TX 75083 Tour Speakers Coordinator Paul Hlava (see Affiliated Groups)

	HONORARY MEMBERS

	L. S. Birks (Deceased) I. B. Borovskii (Deceased) Raimond Castaing Arthur A. Chodos V. E. Cosslett (Deceased) Peter Duncumb Charles E. Fiori (Deceased) Theodore Hall K. F. J. Heinrich James Hillier		L. L. Marton (Deceased) Robert E. Ogilvie Jean Philibert Stephen J. B. Reed Gunji Shinoda (Deceased) David B. Wittry Georges Slodzian
	EMERITUS MEMBERS
	G. W. Bailey Harvey Freeman William Fricke		Paul Lublin J. Williams

MAS AFFILIATED GROUPS

ASEMMA

David L. Bentley

ARL EM Core Facility

University of Arizona

Tucson, AZ 85721

(602)621-5097 FAX: (602)621-1364

AusMAS

Clive Nockolds

Electron Microscope Unit

University of Sydney

Sydney, NSW, Australia, 2006

61-02-692-2351 FAX: 61-02-692-4671

CanMAS

Rod Packwood

MTL - Canmet - EMR

555 Booth Street

Ottawa, Ontario K1A 091, Canada

(613)992-2288 FAX: (613)992-8735

CleveMAS

James D. Isner

The Geon Co.

Avon Lake Technical Center

P. O. Box 122

Avon Lake, OH 44012

(216)933-1605 FAX: (216)933-0563

CoMAS

Greg Meeker

US Geological SurveyMS903

Denver Federal Center

Box 25046

Denver, CO 80225

(303)236-1081 FAX: (303)236-1414

HoustonMAS

Ted Anastas

Anastas Technical Services

17300 Mercury

Houston, TX 77058

(713)488-9736 FAX: (713)488-8543

IAS

Thomas Parayil

Allegheny Ludlum Steel

Technical Center

Alabama and Pacific Avenues

Brackenridge, PA 15014

(412)226-6290 FAX: (412)226-6452

M2S

Idajean (Jean) Fisher

IBM Thomas J. Watson Research Center

P. O. Box 218, MS 30-008

Yorktown Heights, NY 10598

(914)945-3071 FAX: (914)945-2141

MAMAS

Ryna Beth Marinenko

National Institute of Standards and Technology

Bldg. 222, Rm. A113

Gaithersburg, MD 20899

(301)975-3901 FAX: (301)216-1134

MASSoC

Paul Carpenter

Department of Geology

Caltech

Pasadena, CA 91125

(818)356-6126 FAX: (818)568-0935

MEMS

Mike Coscio

c/o Medtronic / Promeon Division

6700 Shingle Creek Parkway

Brooklyn Center, MN 55430

(612)569-1331 FAX: (612)569-3885

MIKMAS

Lou Ross

Department of Geological Sciences

University of Missouri - Columbia

101 Geological Sciences Building

Columbia, MO 65211

(314)882-4777 FAX: (314)882-5458

MIMAS

John Mansfield

University of Michigan

North Campus-E.M.A.L.

2455 Hayward Street

Ann Arbor, MI 48109-2143

(313)936-3352 FAX: (313)763-5567

MSORV

Scott Walck

Wright Patterson Air Force Base

Ohio

(513)255-5791 FAX: (513)255-9019


	NCSEMMA Phillip E. Russell Department of Materials Science and Engineering Campus Box 7916 North Carolina State University Raleigh, NC 27695-7916 (919)515-7501 FAX: (919)515-6965 NESEM Linda Melanson Rosenstiel Basic Medical Sciences Research Center P. O. Box 9110 Brandeis University Waltham, MA 02254-9110 (617)736-2469 FAX: (617)736-2405 NMMBUG Paul Frank Hlava Division 1822 Sandia National Laboratories Albuquerque, NM 87185 (505)844-1890 FAX: (505)844-1778		OKSEM Scott Russell Department of Botany and Microbiology University of Oklahoma 770 Van Vleet Oval Norman, OK 73019 (405)325-6234 FAX: (405)325-7619 SEEMS Sandra H. Silvers EM Complex, USDA, ARS, RRC P. O. Box 5677 Athens, GA 30613 (706)546-3471 FAX: (706)546-3452 WestMAS Charles Gordon Cleaver, Jr. GE Vallecitos Nuclear Center P. O. Box 460 MC V08 Pleasanton, CA 94566 (415)862-4320 FAX: (415)862-4516

	SUSTAINING MEMBERS Our Sustaining Members Contribute Substantial Support to MAS
	4pi Analysis, Inc. 3500 Westgate Drive, Suite 403 Durham, NC 27707 (919)489-1757 FAX: (919)489-1487 Contact: Elizabeth Gregory / Scott Davilla Advanced MicroBeam, Inc. 4217 C Kings-Graves Road Vienna, OH 44473 (216)394-1255 FAX: (216)394-1834 Contact: Donald P. Lesher Amray, Inc. 160 Middlesex Turnpike Bedford, MA 01730 (617)275-1400 FAX: (617)275-0740 Contact: Kenneth Benoit / Sheldon Moll Cameca Instruments, Inc. 2001 West Main Street Stamford, CT 06902-4853 (203)348-5252 FAX: (203)348-5516 Contact: Andrew Davis / Sam Pindrys Charles Evans & Associates 301 Chesapeake Drive Redwood City, CA 94063 (415)369-4567 Contact: Donald H. Wayne / David A. Reed		Dapple Systems 355 West Olive, Suite 100 Sunnyvale, CA 94086 (408)733-3283 FAX: (408)736-2350 Contact: William Stewart Denton Vacuum, Inc. 2 Pin Oak Avenue Cherry Hill, NJ 08003 (609)424-1012 FAX: (609)424-0395 Contact: George Lutz / James L. Campbell Electron Microscopy Sciences / Diatome US 321 Morris Road, P. O. Box 251 Fort Washington, PA 19034 (800)523-5874 (215)646-1566 FAX: (215)646-8931 Contact: Bang Nguyen / Stacie Kirsch ElectroScan Corporation 66 Concord Street Wilmington, MA 01887 (508)988-0055 FAX: (508)988-0062 Contact: Marshall W. Bates, Jr. / Tom Hardt Energy Beam Sciences P. O. Box 468, 11 Bowles Road Agawam, MA 01001 (800)992-9037 (413)786-9322 FAX: (413)789-2786 Contact: Jeffrey A. Ballou / Steven E. Slap

ETP-USA / Electron Detectors, Inc.

1650 Holmes Street, Building C

Livermore, CA 94550

(510)449-8534 FAX: (510)449-8996

Contact: Robert J. Ruscica

FEI Company

19500 N. W. Gibbs Drive, Suite 100

Beaverton, OR 97006-6907

(503)690-1500 FAX: (503)690-1519

Contact: Andree Kraker / Doug Rathkey

Fisons Instruments

P. O. Box 1409

San Carlos, CA 94070-1409

(415)591-3600 (508)524-1000

Contact: Joe Robinson / Mike Weiss

Gatan, Inc.

6678 Owens Drive

Pleasanton, CA 94588-3334

(510)463-0200 FAX: (510)463-0204

Contact: Larry Kolodziejski / Christopher Byrne

Geller Microanalytical Laboratory

One Intercontinental Way

Peabody, MA 01960

(508)535-5595 FAX: (508)535-7653

Contact: Joseph D. Geller

HNU X-ray Systems, Inc.

160 Charlemont Street

Newton, MA 02161-9987

(800)724-5600 (617)964-6690 FAX: (617)965-5812

Contact: Therese Hipple / Eugene Martin

Horiba Instruments, Inc.

Micro-Analytical Division

1080 East Duane, Suite A

Sunnyvale, CA 94086

(408)730-4772 FAX: (408)730-8975

Contact: Nancy A. Wolfe

JEOL USA, Inc.

11 Dearborn Road

Peabody, MA 01960

(508)535-5900 FAX: (508)536-2205

Contact: Robert Santorelli / Charles Nielsen

Kratos Analytical, Inc.

535 E. Crescent Avenue

Ramsey, NJ 07446

(201)825-7500 FAX: (201)825-8659

Contact: David Surman

R. J. Lee Group, Inc.

350 Hochberg Road

Monroeville, PA 15146

(412)325-1776 FAX: (412)733-1799

Contact: David Crawford / Albert H. Beebe

Leica Instruments, Inc.

111 Deer Lake Road

Deerfield, IL 60015

(800)248-0123 (708)405-0123 FAX: (708)405-8139

Contact: Larry Bruder / Robert Brandom

Materials Analytical Services, Inc.

3597 Parkway Lane, Suite 250

Norcross, GA 30092

(800)421-8451 (404)448-3200 FAX: (404)368-8256

Contact: Mark Rigler / Bill Longo

McCrone Associates, Inc.

850 Pasquinelli Drive

Westmont, IL 60559

(708)887-7100 FAX: (708)887-7417

Contact: Kent L. Rhodes / John Gavrilovic

Micron, Inc.

3815 Lancaster Pike

Wilmington, DE 19805

(302)998-1184 FAX: (302)998-1836

Contact: James F. Ficca, Jr.

Microspec Corporation

45950 Hotchkiss Street

Fremont, CA 94539

(510)656-8820 FAX: (510)656-8944

Contact: Joseph Carr / William D. Donnelly

Nissei Sangyo America, Ltd.

Hitachi Scientific Instruments

460 E. Middlefield Road

Mountain View, CA 94043

(415)969-1100 FAX: (415)961-7259

Contact: Donna Armanino / Hideo Naito

NORAN Instruments, Inc.

2551 W. Beltline Highway

Middleton, WI 53562

(608)831-6511 FAX: (608)836-7224

Contact: Karen Roscoe / Mary Ales

Ovonic Synthetic Materials Co., Inc.

1788 Northwood

Troy, MI 48084

(800)366-1299 (313)362-1290 FAX: (313)362-4043

Contact: Susan Mamros / Nick Grupido

Oxford Instruments, Inc.

Microanalysis Group

601 Oak Ridge Turnpike

Oak Ridge, TN 37830

(800)769-3673 (615)483-8405 FAX: (615)483-5891

Contact: Graham Bird / Ron Sartin

Ted Pella, Inc.

P. O. Box 492477

Redding, CA 96049-2477

(916)243-2200

Contact: Robert B. Evans

Perkin-Elmer

Physical Electronics Division

6509 Flying Cloud Drive

Eden Prairie, MN 55344

(800)328-7515 (612)828-6100 FAX: (612)828-6322

Contact: Greg Carpenter

Philips Electronic Instruments

85 McKee Drive

Mahwah, NJ 07430

(201)529-3800

Contact: Nathan Little / John S. Fahy

Princeton Gamma-Tech

1200 State Road

Princeton, NJ 08540

(609)924-7310 FAX: (609)924-1729

Contact: Doug Skinner

SEM / TEC Laboratories, Inc.

4824 South 35th Street

Phoenix, AZ 85040

(602)276-6138 FAX: (602)276-4558

Contact: Sam Giallanza / Ed Holdsworth

Spectra-Tech / Nicolet

652 Glenbrook Road, P. O. Box 2190-G

Stamford, CT 06906

(203)357-7055

Contact: Jerry Hare / John A. Reffner

SPI Supplies / Structure Probe, Inc.

569 E. Gay Street, P. O. Box 656

West Chester, PA 19381-0656

(800)242-4774 (215)436-5400 FAX: (215)436-5755

Contact: Kim Royer / Andrew Blackwood

Topcon Technologies, Inc.

6940 Koll Center Parkway

Pleasanton, CA 94566-3100

(800)538-6850 (510)462-2212 FAX: (510)846-2803

Contact: Michael McCarthy / Paul Iwasaki

Topometrix Corporation

1505 Wyatt Drive

Santa Clara, CA 95054

(408)982-9700 FAX: (408)982-9751

Contact: Tony Abbis / Paul West

Carl Zeiss, Inc.

Electron Optical Division

One Zeiss Drive

Thornwood, NY 10594

(800)356-1090

Contact: Art Dewey / Jerry Lehman