MicroNews |
accessible to his readers and listeners. He has been a tireless educator, and a large fraction of active microscopists/microanalysts have learned their skills from him.
The 1994 K. F. J. Heinrich Young Scientist Award is given to Dr. Joseph R. Michael, a member of the research staff of the Sandia National Laboratory. Joe has made significant contributions to the field of analytical electron microscopy, especially regarding issues of the limits of spatial resolution, probe size measurement, quantitative analysis, limits of detection, and the use of massively parallel computing to support basic AEM studies. He has also contributed to the field of scanning electron microscopy, where he has developed techniques to measure solid specimen crystallography by electron backscatter patterns. In addition to his work to advance analytical methodologies, he has made important applications of the techniques to problems in materials science, including grain boundary segregation and diffusion.
The 1994 MAS Presidential Service Award is given to Dr. Jack Worrall, Director of Operations for the Center of Electron Microscopy and Microanalysis at the University of Southern California. Jack has served MAS for several years as our chairperson of the Sustaining Members Committee. A few years ago Jack resigned this position to take on the job/career as local arrangements chair for the 1993 Los Angeles meeting. The overall success of the 1993 meeting was due in large part to Jack's efforts in coordinating the many complex aspects of the meeting. The social arrangements for the meeting were outstanding, beginning with the Peruvian folk ensemble, INCA, and concluding with the trip to Knott's Berry Farm. For the attendees, Jack served as our "beacon in the night" always outwardly calm and smiling even in the midst of the storm. If this was not enough, Jack has agreed to serve MAS once more as chairperson of the Sustaining Members Committee.
In looking back on the first half of my tenure as your president, I would like to say that I am particularly impressed with the core of dedicated volunteers who make MAS unique among the professional societies. These individuals donate their time, talent, and often their own resources to our society. It is primarily through their efforts that MAS maintains a sound financial base and is able to provide its members with a broad range of programs centered around scientific excellence in microbeam analysis.
John A. Small, President |
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PRESIDENT'S MESSAGE
Dear Members,
The 1994 Winter Council Meeting was held in Boston the second weekend of January. I would like to take this opportunity to officially welcome our new council Directors Paul Hlava and Carol Swyt and to thank our two outgoing directors Phil Russell and John Porter. I would also like to welcome Dave Simons back as our Secretary.
During the meeting, council decided on several issues of interest to our membership. The following three, I felt were of particular importance.
1) Council accepted a proposal by Scott Wight (one of our members from the D.C. area) to establish an 800 number and a P.O. Box to answer questions and provide information related to MAS membership and membership lists. The phone will be answered by phone mail and Scott has agreed to return all calls within one day. The full address and number are listed on the first page of the journal.
2) Council voted to accept a document "Issues for Speaker Support" that was prepared by J. Porter, J. Batstone, and J. Friel. This document provides a framework for the distribution of program funds at MAS meetings.
3) Council established a long-range planning committee that will be addressing, among other things, our relationship with MSA and the structure of our joint meetings.
In addition to the business agenda, I had the privilege of presenting to council my selections for the 1994 Presidential Awards. The 1994 MAS Presidential Award for Outstanding Scientific Contributions is given to Prof. David C. Joy, Director of the Electron Microscope Facility at the University of Tennessee (Knoxville). For the last 25 years, David has made contributions to all aspects of our field, from microscopy to microanalysis, that are distinguished both by their extraordinary numbers and their quality. His work spans the gamut from the basic physics of microscopy/microanalysis (e.g., stopping power measurements, Monte Carlo simulations), to the development of instrumentation (electron energy loss spectrometers), to microanalysis procedures (e. g., EDS and EELS in analytical electron microscopy), to the application of these methods to specific problems in the physical and biological sciences. Most importantly, David has striven to present his research in papers and talks that are lucid and readily |
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MEETING AND SHORT COURSE CALENDAR
MEETINGS
SCANNING 94 / SEEMS 94 May 17 - 20, 1994 Charleston, SC Contact: Mary K. Sullivan FAMS, Inc. Box 832 Mahwah, NJ 07430-0832, USA (201) 818-1010; 0086 FAX
38TH INTERNATIONAL SYMPOSIUM ON ELECTRON, ION, AND PHOTON BEAMS (EMPD TOPICAL CONFERENCE) May 31 - June 3, 1994 New Orleans, LA Contact: Prof. Harold Craighead Cornell Univ. National Nanofabrication Facility Ithaca, NY 14853 (607) 255-2329; 8601 FAX
16TH SYMPOSIUM ON APPLIED SURFACE ANALYSIS (ASSD) June 15 - 17, 1994 Burlington, MA Contact: Joseph Geller Geller Microanalytical One Intercontinental Way Peabody, MA 01960 (508) 535-5595; 7653 FAX
XIII INTERNATIONAL CONGRESS ON ELECTRON MICROSCOPY July 17 - 22, 1994 Paris, France Contact: B. Jouffrey SFME, 67 rue Maurice Gunsbourg 94205 Ivry sur Seine cedex France 33-1-46702844 33-1-46708846 FAX
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MAS / MSA 1994 July 31 - August 5, 1994 New Orleans, LA Contact: Meeting Office P.O. Box EM Woods Hole, MA 02543 (800) 538-3672; (508) 548-9053 FAX
AVS 41ST NATIONAL SYMPOSIUM October 24 - 28, 1994 Denver, CO Contact: AVS 120 Wall Street, 32nd Floor New York, NY 10005 (212) 248-0200
MAS 1995, Denver, CO MAS / MSA 1996, Minneapolis, MN
SHORT COURSES
COMPUTER-ASSISTED IMAGE ANALYSIS AND MEASUREMENT May 17 - 19, 1994 Raleigh, NC Contact: Joni Tanner Office of Continuing Education North Carolina State University Raleigh, NC 27695 (919) 515-2261
LEHIGH MICROSCOPY SHORT COURSES June 13 - 24, 1994 Bethlehem, PA Contact: Professor David B. Williams Department of Materials Science and Engineering Lehigh University 5 East Packer Avenue Bethlehem, PA 18015-3195 (610) 758-5133; 4244 FAX |
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MAS / MSA Joint Meeting Ernest N. Morial Convention Center New Orleans, Louisiana July 31 - August 5, 1994
LAC Chair: Joe A. Mascorro (504) 584-2747; (504) 584-1687 FAX
LAC Co-chair, MAS Liaison G. W. Bailey (504) 275-8581; (504) 275-8581 FAX
Program Co-chairs: John J. Friel, PGT MAS Program Chair (609) 924-7310; (609) 924-1729 FAX
Tony Garratt Reed, MIT MSA Program Chair (617) 253-4622; (617) 253-2112 FAX
The 1994 meeting of the Microscopy Society of America and the Microbeam Analysis Society will be held in New Orleans from July 31st through August 5th. The scientific program and commercial exhibition will take place in the Ernest N. Morial Convention Center located at the foot of Canal Street in the "hub" of activity in downtown New Orleans. On Sunday morning, July 31st, you may participate in the Annual 5K Run/Walk or in the Annual Golf Tournament at the Audubon Golf Course located in uptown New Orleans, immediately across the street from Tulane University. The Sunday Opening Reception will be held at the New Orleans Aquarium of the Americas which is adjacent to Woldenberg Park, a beautiful green space overlooking the Mississippi River. The evening will include leisure tours of the aquarium, spicy NewOrleans food, and great jazz music. The Exhibitor's Mixer will take place on Wednesday afternoon, August 3rd, in the exhibit hall of the convention center. Many possibilities exist for special excursions including: Afternoon at City Park and New Orleans Museum of Art; Antebellum Delight - A Visit to Oak Alley Plantation; Taste of New Orleans - General Tour of New Orleans with Lunch at Arnaud's; Trip to New Orleans Zoo by Riverboat. |
MAS/MSA Cruise Social
Please see next page.
Meeting Registration
Please see registration clarification on next page.
If you would like to attend the MSA/MAS Meeting in New Orleans, and have not received a Registration Bulletin, please contact the office below.
Meeting Office P.O. Box EM Woods Hole, MA 02543 (800)538-3672 (508)548-9053 FAX
Preliminary Technical Program (Chairs and Invited Speakers)
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Joint MAS / MSA Symposia: Computational Methods in Microscopy Chairs: J. McCarthy, NORAN Instruments / W. Carrington, U. Mass. Medical School A. Romig (Sandia) - Monte Carlo Methods Scanned Probe Microscopies Chairs: I. Musselman, UT-Dallas / J. Hoh, Johns Hopkins School of Medicine E. Betzig (AT&T Bell Labs) - Applications of Near-Field Scanning Optical Microscopy D. Bonnell (U. of Penn.) - Atomic Scale Imaging of Wide Bandgap Oxides H. Gaub (Tech. U. of Munich) - Force Modulation and Biomechanical Measurements with the AFM E. Henderson (Iowa State U.) - Biological AFM: Chromatin and Neural Synapses J. Hoh (Johns Hopkins School of Medicine) - Forces Near Biological Membranes M. Tortonese (Park Scientific Instruments) - Atomic Force Microscopy with Piezo Resistive Cantilevers Z. Shao (U. of Virginia) - Atomic Force Microscopy of Phospholipid Membranes: from Domains to Ripples to Interdigital States Low-Voltage and FEG-SEM Chairs: M. Rosenfield, IBM / R. Apkarian, Emory O. Wells (IBM) - Low-Voltage Low-Loss Imaging of Poorly Conducting Samples R. P. Apkarian - Imaging of Isolated Molecules, Viruses, Organelles and Cell Membrane Domains Using In-Lens FESEM T. D. Allen R. Albrecht R. Hermann Analytical Electron Microscopy Chairs: J. Michael, Sandia / M. Libera, Stevens Institute J. Howe C. Lyman D. Newbury L. Reimer J. Silcox L. Swanson R. Vincent P. Crozier M. Rhuele
MAS Techniques Sessions: Presidential Symposium on Chemical Microanalysis Chair: J. Small, NIST G. Gillen (NIST) - Chemical Imaging with Secondary Ion Mass Spectrometry J. Armstrong (Cal Tech) - Electron Probe Microanalysis P. Russell (North Carolina State U.) - Scanning Probe Microscopies J. Hunt (Gatan) - Parallel Electron Energy Loss J. Reffner (Spectra-Tech) - FTIR/Optical Microanalysis B. York (IBM) - Micro-Diffraction Quantitative Microanalysis Chair: E. Lifshin, GE Optical Microanalysis Chair: J. Reffner, Spectra-Tech |
Environmental SEM Chair: R. Bolon, GE / J. Mansfield, U. Mich. / S. McKernan, U. Minn. Microbeam Mass Spectrometry Chair: S. Novak, Evans East M. Geva (AT&T Bell Labs) - Using SIMS in the Microelectronics Industry R. Odom (Charles Evans) - New Developments in TOF-SIMS for Surface Analysis D. Leta (Exxon) - SIMS Imaging of Catalysts and other Insulating Materials Quality Assurance of Microanalytical Methods Chair: D. Newbury, NIST / E. Steel, NIST
Cathode Technology Today and Tomorrow Chair: F. Schamber, RJ Lee Group C. Crawford (Kimball Physics) - Thermionic Cathode Technology J. Wall (Brookhaven) - Cold Field-Emission Sources L. Swanson (FEI Co.) - Schottky Sources J. Spence (Arizona State U.) - Low Voltage Nanometer-Scale Sources N. MacDonald (Cornell U.) - Micro-Fabricated Field Emitter Arrays Instrumentation Chair: F. Schamber, RJ Lee Group Micro XRD / XRF Chair: B. York, IBM
MAS Applications Sessions: Materials Applications Chair: B. Carter, U. Minn. Geological Applications Chair: S. Mehta, Arco / P. Hlava, Sandia P. Carpenter (Cal Tech) - EPMA Analysis of Gemstones S. Bergman (Arco) - Apatite Composition and Fission Track Geochronology Biological Applications Chair: M. Bond, Cleveland Clinic C. Moravec (Cleveland Clinic) - Measurement of Calcium During the Contractile Cycle in the Failing and Non-Failing Heart W. G. Wier (U. of Maryland) - Measuring Ca2+ in Living Cells with Fluorescent Ca2+ Indicators J. Fernandez (Mayo Clinic) - Pulsed Laser Imaging of Rapid Calcium Signaling in Excitable Cells P. Ingram (Research Triangle Institute) - Interactive Multi-Spectral X-Ray Imaging: Application to Ca2+ Quantitation S. B. Andrews (NIH) - Imaging and Analysis in the Field Emission STEM G. Legge (U. Melbourne) - Potential and Performance of Proton Microprobes A. Marshall (La Trobe U. Australia) - Light Element Microanalysis in Biology
MAS Topical Sessions: X-ray and Image Analysis in the Petroleum Industry Chair: E. Prestridge, PGT W. Lamberti (Exxon) - Microanalytical Methods in the Petroleum Research Laboratory M. Leonowicz (Mobil) - Electron Diffraction and X-ray Microanalysis of Zeolite Catalysts Microanalysis of Coatings and Interfaces Chair: J. Goldstein, U. Mass. C. Drewien (Sandia) - AEM/SEM of Coatings K. Barmak (Lehigh U.) - Thin Film Interfaces B. Smith (Lehigh U.) - Ternary Diffusion Profiles in Coatings |
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MSA General Symposia: Presidential Symposium: Microscopy Towards the 21st Century Chair: R. Cardell, U. Cincinnati W. R. Brinkley - Funding of Microscopy in the 21st Century M. Isaacson - Optical Microscopy in the 21st Century K. A. Fisher - Scanning Probe Microscopy in the 21st Century S. L. Erlandsen - The Role of Field-Emission SEM in the 21st Century M. H. Ellisman - The Merger of Microscopy and Advanced Computing: a New Frontier for the 21st Century X-ray Microscopy Chair: C. Jacobsen, SUNY Stony Brook H. Ade - Polymer Science Problems Investigated by NEXAFS Microscopy C. Buckley - The Remodelling of Bone in the Region of Bioactive Implants L. DaSilva - X-ray Laser Microscopy of Labeled Sperm Nuclei G. Ice - Materials Science Microprobe M. Moronne - Development of Fluorescent Probes for X-ray Microscopy M. Rivers - X-ray Microprobe for Geology J. Thieme - X-ray Microscopy Studies with the Gottingen Microscopes at BESSY S. Williams - Structural and Compositional Conservation in Mitotic Chromosomes B. York - Laboratory X-ray Microprobe X. Zhang - XANES: Chemical Mapping in Biological System using STXM |
Direct Digital Imaging Chair: G. Fan K-H Herrmann - On-Line Image Readout in CTEM D. Shindo - Applications of the Imaging Plate D. C. Joy - Monte Carlo Simulations of Resolution and Efficiency of Electron Scintillators M. O'Keefe - On-Line Digital Imaging at 1MeV M. Pan - Low-Dose High Resolution Imaging with Slow Scan CCD Camera J. Yang P. Mooney - Practical Aspects of Slow-Scan CCD Camera Design G. Fan - High Performance Transmission Scintillating Screen for TEM Energy Filtered Imaging and EELS Chair: R. Carpenter, Arizona State U.
Advances in Instrumentation for Light Microscopy F. Lanni - Applications of Standing Wave Fluorescence Microscopy in Biological Research E. Gratton - Fluorescence Lifetime Microscopy L. Harris - Automated Interactive Microscope P. Treado - New Frontiers in Multispectral Chemical Imaging Computational Methods in Microscopy Chair: B. Carrington / N. Zaluzec, Argonne C. S. Potter - Towards a Neuroscope: Evaluating Brain Function with MRI D. L. Taylor - Dynamic Imaging of the Structure of Living Cells O. Saxton Computer Software Exchange Chair: N. Zaluzec, Argonne
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MSA Physical Symposia: Atom Probe and 3-D Atom Probe Microscopy Chair: T. Kelley / P. Camus, U. Wisconsin G. D. W. Smith - Position Sensitive Atom Probe M. K. Miller - APFIM of Materials P. P. Camus - The Theoretical Underpinnings of Atom Probe/Field Ion Microscopy B. Deconihot - The Tomographic Atom Probe UHR SEM Chair: L. Allard, ORNL / D. Joy, U. Tennessee S. Erlandsen - Digital Imaging in the Hitachi S-900 FESEM and Detection of Radiation Damage J. Butler - Ultra-High Resolution Low Voltage Imaging of Polymers D. Vezie - Comparison of Low Voltage Ultra-High Resolution SEM to Other Polymer Morphological Characterization Techniques M. Scheinfein - Secondary Electron Generation in the SEM D. C. Joy - Image Simulation for Ultra-High Resolution SEM A. K. Datye - UHR-SEM of Catalytic Materials R. Wepf Self-assembled Materials Chair: R. Spontak, North Carolina State U. M. Sarikaya J. Zasadzinski D. Siegel M. Disko B. R. Heywood R. J. Spontak Microscopy of Ferro-electric Materials Chair: J. Speck, UCSB L. E. Cross - Interesting Problems in Ferroelectric Systems G. Thomas - Electron Microscopy and Microanalysis of Ferroelectric and Multilayer Oxides M. Harmer - Investigation of Ferroelectrics Using Conventional and in situ Electron Microscopy W. Mader - Determining Crystal Polarity in the Electron Microscope C. Randall - Mesoscopic Crystallography in Ferroelectrics and Related Materials D. Viehland - Electron Microscopy Studies of La-modified and Sn-modified Lead Zirconate Titanate Ceramics T. Egami - Atomic Pair Correlation Function Approach to Relaxor Ferroelectrics Using Neutrons and X-rays S. McKinstry - Spectroscopic Ellipsometry of Ferroelectric Surfaces and Thin Films A. Kingon - A TEM Study of Microstructures in Ferroelectric Pb(Zr,Ti)O3 and KNbO3 Thin Films T. J. Headley - Microstructural Development in Sol-Gel Derived PZT Thin Films M. McCartney - Microstructural Development of Sol-Gel Derived Thin Film Oxide Ferroelectrics E. Goo - Epitaxial Ferroelectric Thin Films |
D. C. Joy - Electron Holography of Ferroelectric Materials A. Tonomura - Applications of Holography V. Dravid J. Cowley - Reflection Electron Microscopy of Ferroelectric Domain Boundaries F. Tsai - Reflection Electron Microscopy of Ferroelectric Domain Boundaries W. Cao - Theory of Domains and Microdomains in Ferroelectrics Crystallographic and Texture Analysis Chair: J. Sutliffe, GE D. Joy - Channelling in and Channelling Out - the Origin of EBSP and ECP Contrast D. Slavik - Identifying Fracture Mechanisms using the EBSP Technique H. Weiland - Application of Microtexture Analysis for Materials Characterization using SEM and TEM Techniques T. Furu - Electron Backscattering Pattern (EBSP) as a Powerful Tool in Studying Basic Mechanisms of Recrystallization of Metals J. Sutliffe - Electron Diffraction in the SEM: A New Requirement for Materials Research J. Michael - Developments in Crystallographic Phase Identification in the SEM: Backscattered Electron Kikuchi Patterns B. Adams - Orientation Imaging of Microstructures D. Dingley - Advances in Strain Measurement using EBSP V. Randle - Mesotexture: the Texture Between Grains and Surfaces J. Venables - Diffraction Techniques in UHV-SEM and STEM
M. Vaudin - Texture and Microtexture in Ceramics S. Wright - A Review of Automatic Indexing of Electron Backscatter Diffraction Patterns D. J. Jensen Watanabe - The Application of Electron Channelling Pattern (ECP) Technique to Grain Boundary Studies Using Electron Diffraction in the SEM Developments and Applications of HREM A. Ourmazd - Measuring Projected Potential, Composition and Surface Roughness by HREM J. Howe - HREM Analysis of Mechanisms and Kinetics of Interfacial Motion F-R Chen - Atomic Faceting of NiSi2 Interfaces Studied by HREM M. Ruhle - Quantitative HREM at High Voltage: Recent Progress and Future Opportunities W. King D. J. Smith W. Coene - Focal Series HREM for Quantitative Analysis of Materials K. Merkle - Measuring Rigid Shifts at Interfaces by HREM S. Pennycook - Applications of Z-contrast HREM to Interfaces in Materials
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MSA Biological Symposia: Advances in Macromolecular Microscopy Chair: W. Chiu, Baylor U. M. Van Heel - 3-D Reconstruction of Large Oligomeric Oxygen Carriers M. F. Schmid - Acrosomal Bundle Filament Structure B. Jap - Structural Refinement in Electron Crystallography P. L. Stewart - Bridging the Resolution Gap Between X-ray Crystallography and Electron Microscopy E. Egelman - Universal Structures in Genetic Recombination W. Chiu - High Resolution Studies of Biological Assemblies with 400kV Cryomicroscopy Advances in Fluorescence Probes for Microscopy Chair: M. Poenie, UT-Austin M. Poenie R. Tsien E. Etter L. Loew Advances in Diagnostic Imaging Chair: B. Herman H. Tenke - Image Analysis of FISH Stained Specimen: a New Diagnostic Tool in Genetics and Oncology B. Trask - Organization of Interphase and Metaphase Chromosomes Studied by Fluorescence In Situ Hybridization J. Gray - Digital Imaging Microscopy for Molecular Cytogenetics B. Herman - Automated Fluorescence Imaging Cytometry for the Diagnosis of Cervical Cancer |
Tomographic Methods in Biological Microscopy Chair: M. Ellisman Organization of the Cell Nucleus Chair: D. Spector, CSHL T. Allen - The Nuclear Pore-Complex J. W. Sedat - 3-D Organization of Chromosomes D. L. Spector - Nuclear Subcompartments Involved in Transcription and Pre-mRNA Processing K. Brasch - The Nucleolus and Nuclear Bodies Microanalytical Approaches to Systems Neurobiology Chair: C. Greer, Yale C. Greer J. Price J. Kinnamon M. Whitehead B. Menco Cellular Neurobiology Chair: M. Martone, UCSD P. Guthrie - Dynamics of Calcium Control in Local Compartments A. Cornell-Bell - Neurotransmitters, Astrocytes and Calcium Waves M. Martone - Organization of Calcium Regulatory Proteins in the Endoplasmic Reticulum S. Brady - Molecular Motors and Fast Axonal Transport D. Kelly - Androgen Induces Plasticity at a Vocal Neuromuscular Synapse C. Wolley |
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MOUSIN' AROUND
New Network Newsgroups.
On the tail of the last Mousin' Around, which covered The Microscopy Mailing List, the news for this issue is The News. The News I am referring to is Usenet News. Some of you may be asking: "What is Usenet News?" Well, for those of you who are unfamiliar with it, Usenet News is essentially an electronic conferencing/discussion network. News messages are passed around the network from one computer system to another. Many of these systems are on the Internet, but many are not. The Usenet network extends further than the physical network of the Internet. There are many computers that participate in Usenet News that are connected by dial-up modem connections. It is not necessary to have an Internet connection to have access to Usenet.
Usenet is not a new system, it has been in place for many years. In contrast to email, Usenet News is not distributed to an individuals account, but rather to a server at a particular institution (be it a government lab, university or private company) that can then be accessed by individuals who are at that institution (or are permitted to dial in). On Usenet, messages are posted to newsgroups that are designed to cover a particular topic. There are a number of rather general subject categories into which the newsgroups are divided, e.g. comp for computer, rec for recreational and sci for scientific. The newsgroups within each subject category cover a wide variety of fields and serve as forums for questions and answers and general informational postings. There are many hundreds of worldwide newsgroups, i.e. groups that are distributed around the world, and then there also are groups that are only distributed locally. Examples of specific newsgroups are rec.windsurfing, comp.sys.mac.digest (an Apple Macintosh question and answer digest), sci.physics (a physicists forum).
What makes Usenet News worth mentioning here is that there are five new newsgroups in the sci hierarchy that may be of considerable interest to MAS members. These are sci.techniques.microscopy, sci.techniques.xtallography, sci.techniques.spectroscopy, sci.materials and sci.polymers. Since their inception in the latter part of 1993, these newsgroups have rapidly become excellent places to ask questions, post answers, discuss problems, announce conferences, post journal abstracts listings and post vacant positions. Society news and information will also be posted to sci.techniques.microscopy and so MAS members are encouraged to read this newsgroup and join in the discussions and information exchanges.
Postings to each newsgroup are stored on the institution's local NNTP (sorry guys I don't what this acronym is short for, unless it is Network News Transport Protocol!) server and distributed to other sites. So, if you want to use Usenet News you need access to an NNTP server and news reading/posting software to run on your local computer, workstation or terminal. You should contact your local network administrator and ask them if you have access to a Usenet feed and which net-news software they recommend for the machine you use. If they do not have access, ask them why not! The functionality of each news program is best explained by a local expert. I cannot possibly go into all of the details of even one news program here. Suffice it to say, however, if you have access to a news posting and reading program and access to the accompanying NNTP server, you can post articles, questions and information to be read by people around the world.
Some questions remain: Why News and not just Email? After all, we have the Microscopy Mailing List, so why not just email the messages to interested parties? Well, this assumes that the addresses of all the interested parties are known. Mailing lists are a common way of maintaining a discussion group and the main advantage of News over email mailing lists is the messages reside on a remote machine and do not fill up your mailbox. Some people have severely restricted mailbox size allocations and the output from a mailing list can swamp them and prevent them from receiving other mail. With Usenet you only download the News you want to read. You can subscribe to a small subset of the total newsgroups and selectively scan through those. You may view all of the subjects of the articles in a group before you read any of them.
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For those of you who have a strong preference for email or Usenet and would like to use just one of them, the author and Nestor Zaluzec (who maintains the Microscopy Mailing List) are working on a modification of the list that will forward each message posted to it to Usenet and take messages posted to Usenet News and forward them to the mailing list. This modification should be in place by the middle of this year. Until then, the author will forward conference and course information and journal abstract postings between the two systems. If you have questions about sci.techniques.microscopy, send email to John.F.Mansfield@umich.edu.
Sidebar I can't get to the Internet, what do I do? The one major complaint about Net News is that it is not accessible unless you have a connection to the Internet. This is not true. Some of the dial-up bulletin board systems have Usenet feeds. You should check with your local computer users group to find out how you can get access to Usenet. You might find it most cost effective and flexible to pay for a dial-up Internet connection. A connection used to be an expensive proposition, however, these days it can be as reasonably priced as Compuserve or the other dial-up network services. For example, "The World" (1-617-739-0202) charges $20 per month for 20 hours of connect time to Internet services. Another provider "The WELL" (Whole Earth 'Lectronic Link - 1-415-332-4335) charges $15 per month and $2 per hour for use. For a local provider please call the InterNIC Information Services at 1-800-444-4345.
MAS TOUR SPEAKER PROGRAM
So far, I have had very little response from the Affiliated Societies to my letter of September 1, 1993 and the announcements in Microbeam Analysis. I am asking the rest of the societies to contact me as soon as possible, even if they don't plan to host a tour speaker. I need to know from those Affiliated Societies who plan to host a speaker, which tour speaker they desire and when. As soon as I get enough societies to respond I will be able to arrange Tour Speaker trips. The three or four I've heard from just isn't enough. Below is listed the slate of Tour Speakers available, with their affiliations and the titles of their talks. It would be nice if the contact people would call and tell me that they are planning a meeting on XX and the date and speaker will be chosen then.
Dave Bright, NIST Image Processing and Free Software for the Microscopist
Jon McCarthy, NORAN The Effect of Detector Dead Layer on Light Element Detection
Cindy Zeissler, NIST Preparation Methods for Particle Analysis (Picking Particle Preparation Procedures to Prevent Painful Problems) |
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CLASSIFIED ADVERTISEMENTS IN MICRONEWS
VCH Publishers, Inc. is pleased to announce the availability of classified advertising in the MicroNews section of Microbeam Analysis. The rates will be $50.00 per line, 54 characters per line with a 4 line minimum. The deadline for submittal is the first of the month preceding the publication of the next issue (e.g. June 1st for July/August issue, etc.). To place an ad please call: Michael Croy, Advertising Sales Department, VCH Publishers, Inc., 220 E. 23rd Street, New York, NY 10010 Tel. (212) 683-8333, Fax (212) 481-0897.
CLASSIFIED ADVERTISEMENTS
Four ARL-SEMQ Electron Microprobes Reconditioned like new, 4-6 WDS scanning spectrometers, 52.5 degree takeoff. G. W. Electronics BSE system, Kevex EDS detector, Updated with our Micro-3WD automation system which includes WDS, EDS, Digital Imaging, Image Analysis, and high speed optical servo motors. Includes 1 year warranty. Call for demo disks, prices and more information. Advanced MicroBeam, Inc. Phone: 216-394-1255, Fax: 216-394-1834. |
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MAS EXECUTIVE COUNCIL |
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President John A. Small National Institute of Standards and Technology Bldg. 222, Rm. A113 Gaithersburg, MD 20899 (301)975-3900 FAX: (301)216-1134
Past-President Thomas G. Huber JEOL (USA) Inc. 11 Dearborn Road Peabody, MA 01960 (508)535-5900 FAX:(508)536-2205
President-Elect Jon McCarthy NORAN Instruments, Inc. 2551 W. Beltline Highway Middleton, WI 53562 (608)831-6511 FAX: (608)831-2313 |
Treasurer Harvey A. Freeman 958 Long Pond Road Brewster, MA 02631-1898 (508)896-9060
Secretary David S. Simons National Institute of Standards and Technology Bldg. 222, Rm. A113 Gaithersburg, MD 20899 (301)975-3903 FAX: (301)216-1134 |
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DIRECTORS |
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Dale E. Johnson (1992-1994) Graduate School AG-10 University of Washington Seattle, WA 98195 (206)543-5900 FAX: (206)685-3234
Joseph R. Michael (1992-1994) Sandia National Laboratories Div. 1822, M. S. 0342 Albuquerque, NM 87185-0342 (505)844-9115 FAX: (505)844-1778 or 7910
Joanna L. Batstone (1993-1995) IBM T. J. Watson Research Center P. O. Box 218 Yorktown Heights, NY 10598 (914)784-7674 FAX: (914)784-6324 |
Charles E. Lyman (1993-1995) Department of Materials Science and Engineering Whitaker Lab 5 East Packer Avenue Lehigh University Bethlehem, PA 18015 (215)758-4249 FAX: (215)258-4244
Paul F. Hlava (1994-1996) Sandia National Laboratories Div. 1822, M. S. 0342 Albuquerque, NM 87185-0342 (505)844-1890 FAX: (505)844-1778 or 7910 Carol Swyt (1994-1996) 3E66 Building 13 BEIP / NCRR NIH Bethesda, MD 20892 (301) 975-3926 FAX: (301)216-1134 |
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ADDITIONAL MAS REPRESENTATIVES |
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Accountant, Dues and Mailing List VCH Publishers, Inc. 303 NW 12th Avenue Deerfield Beach, FL 33422-8824 (800)367-8249 FAX: (305)428-8201 |
Affiliated Groups V. E. Shull (517)355-2252 Paul Hlava (Vice-Chair) (see Directors) (505)844-1890 FAX: (505)844-1778 or 7910 |
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Awards Committee for MAS 1994 Dale E. Johnson (see Directors) (206)543-5900 FAX: (206)685-3234 Joseph R. Michael (see Directors) (505)844-9115 FAX: (505)844-1778
Computer Activities Committee John F. Mansfield University of Michigan, North Campus 2455 Hayward Ann Arbor, MI 48109-2143 (313)936-3352 FAX: (313)763-5567 Email: John.F.Mansfield@umich.edu. Paul Carpenter Email: PaulC@legs.caltech.edu (818)356-6126 FAX: (818)568-0935
Conference Proceedings Inventory C. Susskind San Francisco Press, Inc. Box 6800 San Francisco, CA 94101-6800 (510)524-1000
Corporate Liason Committee Thomas G. Huber JEOL (USA) Inc. 11 Dearborn Road Peabody, MA 01960 (508)535-5900 FAX:(508)536-2205
Education Committee Phillip E. Russell Department of Materials Science and Engineering P.O. Box 7916 North Carolina State University Raleigh, NC 27695-7916 (919)515-7501 FAX: (919)515-2932
Finance Committee, Archivist Gordon Cleaver GE Vallecitos Nuclear Center P. O. Box 460, MC V08 Pleasanton, CA 94566 (510)862-4320 FAX: (510)862-4244
Historian Art Chodos P. O. Box 1014 Monrovia, CA 91017-1014 (818)357-0183 FAX: (818)568-0935 (for Federal Express or UPS) 302 Acorn Circle Monrovia, CA 91016-1807 |
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International Liaison David B. Williams Department of Materials Science and Engineering Whitaker Laboratory 5 East Packer Avenue Lehigh University Bethlehem, PA 18015-3195 (215)758-4224 FAX: (215)758-4244
Long Range Planning Committee Alton D. Romig, Jr. Material and Process Sciences Sandia National Laboratories Albuquerque, NM 87185-5800 (505)844-8558
MAS-MSA Liason, Nominations and Presidents Award John A. Small (see President) (301)975-3900 FAX: (301)216-1134
Microbeam Analysis Journal Richard W. Linton, Editor-in-Chief Department of Chemistry - CB3290 University of North Carolina Chapel Hill, NC 27599-3290 (919)962-2152 FAX: (919)962-1547
MicroNews Editor Inga Holl Musselman Chemistry Program, BE 26 University of Texas at Dallas P. O. Box 830688 Richardson, TX 75083-0688 (214)690-2706 FAX: (214)690-2925
(for Federal Express or UPS) Chemistry Program, BE 26 University of Texas at Dallas 2601 North Floyd Road Richardson, TX 75083
Sustaining Membership Committee Jack L. Worrall CEMMA 103 University of Southern California Los Angeles, CA 90089-0101 (213)740-1990
Tour Speakers Coordinator Paul Hlava (see Directors) (505)844-1890 FAX: (505)844-1778 or 7910 |
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HONORARY MEMBERS |
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L. S. Birks (Deceased) I. B. Borovskii (Deceased) Raimond Castaing Arthur A. Chodos V. E. Cosslett (Deceased) Peter Duncumb Charles E. Fiori (Deceased) Theodore Hall K. F. J. Heinrich James Hillier |
L. L. Marton (Deceased) Robert E. Ogilvie Jean Philibert Stephen J. B. Reed Gunji Shinoda (Deceased) David B. Wittry Georges Slodzian |
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EMERITUS MEMBERS |
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G. W. Bailey Harvey Freeman William Fricke |
Paul Lublin J. Williams |
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MAS AFFILIATED GROUPS |
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CoMAS Greg Meeker US Geological SurveyMS903 Denver Federal Center Box 25046 Denver, CO 80225 (303)236-1081 FAX: (303)236-1414
HoustonMAS Ted Anastas Anastas Technical Services 17300 Mercury Houston, TX 77058 (713)488-9736 FAX: (713)488-8543
IAS Thomas Parayil Allegheny Ludlum Steel Technical Center Alabama and Pacific Avenues Brackenridge, PA 15014 (412)226-6290 FAX: (412)226-6452
M2S Jerry L. Lehman Express Systems 78 E. Putnam Avenue Greenwich, CT 06830 (203)629-2211 FAX: (203)629-2711 |
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ASEMMA David L. Bentley ARL EM Core Facility University of Arizona Tucson, AZ 85721 (602)621-5097 FAX: (602)621-1364
AusMAS Clive Nockolds Electron Microscope Unit University of Sydney Sydney, NSW, Australia, 2006 61-02-692-2351 FAX: 61-02-692-4671
CanMAS Rod Packwood MTL - Canmet - EMR 555 Booth Street Ottawa, Ontario K1A 091, Canada (613)992-2288 FAX: (613)992-8735
CleveMAS James D. Isner The Geon Co. Avon Lake Technical Center P. O. Box 122 Avon Lake, OH 44012 (216)933-1605 FAX: (216)933-0563 |
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NCSEMMA Phillip E. Russell Department of Materials Science and Engineering Campus Box 7916 North Carolina State University Raleigh, NC 27695-7916 (919)515-7501 FAX: (919)515-6965
NESEM Linda Melanson Rosenstiel Basic Medical Sciences Research Center P. O. Box 9110 Brandeis University Waltham, MA 02254-9110 (617)736-2469 FAX: (617)736-2405
NMMBUG Paul Frank Hlava Division 1822 Sandia National Laboratories Albuquerque, NM 87185 (505)844-1890 FAX: (505)844-1778
OKSEM Scott Russell Department of Botany and Microbiology University of Oklahoma 770 Van Vleet Oval Norman, OK 73019 (405)325-6234 FAX: (405)325-7619
SEEMS Sandra H. Silvers EM Complex, USDA, ARS, RRC P. O. Box 5677 Athens, GA 30613 (706)546-3471 FAX: (706)546-3452
WestMAS Charles Gordon Cleaver, Jr. GE Vallecitos Nuclear Center P. O. Box 460 MC V08 Pleasanton, CA 94566 (415)862-4320 FAX: (415)862-4516 |
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MAMAS Ryna Beth Marinenko National Institute of Standards and Technology Bldg. 222, Rm. A113 Gaithersburg, MD 20899 (301)975-3901 FAX: (301)216-1134
MASSoC Paul Carpenter Department of Geology Caltech Pasadena, CA 91125 (818)356-6126 FAX: (818)568-0935
MEMS Michael Coscio Medtronics, Inc. / Promeon Division 6700 Shingle Creek Drive Brooklyn Center, MN 55430 (612)569-1331 FAX: (612)569-1284
MIKMAS Lou Ross Department of Geological Sciences University of Missouri - Columbia 101 Geological Sciences Building Columbia, MO 65211 (314)882-4777 FAX: (314)882-5458
MIMAS John Mansfield University of Michigan North Campus-E.M.A.L. 2455 Hayward Street Ann Arbor, MI 48109-2143 (313)936-3352 FAX: (313)763-5567
MSORV Scott Walck Wright Patterson Air Force Base Ohio (513)255-5791 FAX: (513)255-9019 |
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SUSTAINING MEMBERS Our Sustaining Members Contribute Substantial Support to MAS |
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Electron Microscopy Sciences / Diatome US 321 Morris Road, P. O. Box 251 Fort Washington, PA 19034 (800)523-5874 (215)646-1566 FAX: (215)646-8931 Contact: Carole March / Stacie Kirsch EM and LM Supplies and Diamond Knives
ElectroScan Corporation 66 Concord Street Wilmington, MA 01887 (508)988-0055 FAX: (508)988-0062 Contact: Marshall W. Bates, Jr. / Tom Hardt
Energy Beam Sciences P. O. Box 468, 11 Bowles Road Agawam, MA 01001 (800)992-9037 (413)786-9322 FAX: (413)789-2786 Contact: Jeffrey A. Ballou / Steven E. Slap W & LaB6 Filaments, Apertures and EM Supplies
ETP-USA / Electron Detectors, Inc. 1650 Holmes Street, Building C Livermore, CA 94550 (510)449-8534 FAX: (510)449-8996 Contact: Robert J. Ruscica
FEI Company 7451 N.E. Evergreen Parkway Hillsboro, OR 97124-5830 (503)640-7500 FAX: (503)640-7509 Contact: Andree Kraker / Doug Rathkey
Fisons Instruments P. O. Box 1409 San Carlos, CA 94070-1409 (415)591-3600 (508)524-1000 Contact: Joe Robinson / Mike Weiss
Gatan, Inc. 6678 Owens Drive Pleasanton, CA 94588-3334 (510)463-0200 FAX: (510)463-0204 Contact: Larry Kolodziejski / Christopher Byrne
Geller Microanalytical Laboratory One Intercontinental Way Peabody, MA 01960 (508)535-5595 FAX: (508)535-7653 Contact: Joseph D. Geller |
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4pi Analysis, Inc. 3500 Westgate Drive, Suite 403 Durham, NC 27707 (919)489-1757 FAX: (919)489-1487 Contact: Michael Czysz / Scott Davilla Mac-based EDS & Imaging, Hardware and Software
Advanced MicroBeam, Inc. 4217 C Kings-Graves Road Vienna, OH 44473 (216)394-1255 FAX: (216)394-1834 Contact: Donald P. Lesher Microprobe Service and Acc., Image Analysis
Amray, Inc. 160 Middlesex Turnpike Bedford, MA 01730 (617)275-1400 FAX: (617)275-0740 Contact: Kenneth Benoit / Sheldon Moll Manufacturer of Scanning Electron Microscopes
Cameca Instruments, Inc. 2001 West Main Street Stamford, CT 06902-4853 (203)348-5252 FAX: (203)348-5516 Contact: Andrew Davis / Claude Conty EPMA, SIMS, Analytical SEM, and FE/Auger
Charles Evans & Associates 301 Chesapeake Drive Redwood City, CA 94063 (415)369-4567 Contact: Donald H. Wayne / David A. Reed Service Analysis Lab, Mass Spec., RBS
Dapple Systems 355 West Olive, Suite 100 Sunnyvale, CA 94086 (408)733-3283 FAX: (408)736-2350 Contact: William Stewart EDS Systems, Image Capture and Analysis
Denton Vacuum, Inc. 2 Pin Oak Avenue Cherry Hill, NJ 08003 (609)424-1012 FAX: (609)424-0395 Contact: George Lutz / James L. Campbell Vacuum Coaters and Critical Point Dryers |
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HNU X-ray Systems, Inc. 160 Charlemont Street Newton, MA 02161-9987 (800)724-5600 (617)964-6690 FAX: (617)965-5812 Contact: Therese Hipple / Eugene Martin
Horiba Instruments, Inc. Micro-Analytical Division 1080 East Duane, Suite A Sunnyvale, CA 94086 (408)730-4772 FAX: (408)730-8975 Contact: Nancy A. Wolfe
JEOL USA, Inc. 11 Dearborn Road Peabody, MA 01960 (508)535-5900 FAX: (508)536-2205 Contact: Robert Santorelli / Charles Nielsen EPMA, Auger, SEM, TEM, NMR, Mass Spectrometer
Kratos Analytical, Inc. 535 E. Crescent Avenue Ramsey, NJ 07446 (201)825-7500 FAX: (201)825-8659 Contact: David Surman
R. J. Lee Group, Inc. 350 Hochberg Road Monroeville, PA 15146 (412)325-1776 FAX: (412)733-1799 Contact: David Crawford / Albert H. Beebe
Leica Instruments, Inc. 111 Deer Lake Road Deerfield, IL 60015 (800)248-0123 (708)405-0123 FAX: (708)405-8139 Contact: Larry Bruder / Robert Brandom
Materials Analytical Services, Inc. 3597 Parkway Lane, Suite 250 Norcross, GA 30092 (800)421-8451 (404)448-3200 FAX: (404)368-8256 Contact: Mark Rigler / Bill Longo FT-IR, EDXRF, SEM, SIMS, STM, XRD, & STEM Services
McCrone Associates, Inc. 850 Pasquinelli Drive Westmont, IL 60559 (708)887-7100 FAX: (708)887-7417 Contact: Kent L. Rhodes / John Gavrilovic Materials Characterization & Surface Analysis |
Micron, Inc. 3815 Lancaster Pike Wilmington, DE 19805 (302)998-1184 FAX: (302)998-1836 Contact: James F. Ficca, Jr. Analytical Services OM, SEM/EDS, TEM, & EPMA
Microspec Corporation 45950 Hotchkiss Street Fremont, CA 94539 (510)656-8820 FAX: (510)656-8944 Contact: Joseph Carr / William D. Donnelly Wavelength-Dispersive Spectrometers for SEMs
Nissei Sangyo America, Ltd. Hitachi Scientific Instruments 460 E. Middlefield Road Mountain View, CA 94043 (415)969-1100 FAX: (415)961-7259 Contact: Donna Armanino / Hideo Naito SEM, TEM, & Field-Emission SEM and TEM
NORAN Instruments, Inc. 2551 W. Beltline Highway Middleton, WI 53562 (608)831-6511 FAX: (608)836-7224 Contact: Karen Roscoe / Mary Ales
Ovonic Synthetic Materials Co., Inc. 1788 Northwood Troy, MI 48084 (800)366-1299 (313)362-1290 FAX: (313)362-4043 Contact: Susan Mamros / Nick Grupido
Oxford Instruments, Inc. Microanalysis Group 601 Oak Ridge Turnpike Oak Ridge, TN 37830 (800)769-3673 (615)483-8405 FAX: (615)483-5891 Contact: Graham Bird / Ron Sartin
Ted Pella, Inc. P. O. Box 492477 Redding, CA 96049-2477 (916)243-2200 Contact: Robert B. Evans
Perkin-Elmer Physical Electronics Division 6509 Flying Cloud Drive Eden Prairie, MN 55344 (800)328-7515 (612)828-6100 FAX: (612)828-6322 Contact: Greg Carpenter |
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Philips Electronic Instruments 85 McKee Drive Mahwah, NJ 07430 (201)529-3800 Contact: Nathan Little / John S. Fahy
Princeton Gamma-Tech 1200 State Road Princeton, NJ 08540 (609)924-7310 FAX: (609)924-1729 Contact: Doug Skinner EDS & Image Analysis for EM and OM
SEM / TEC Laboratories, Inc. 4824 South 35th Street Phoenix, AZ 85040 (602)276-6138 FAX: (602)276-4558 Contact: Sam Giallanza / Ed Holdsworth Materials & Failure Analysis Service Lab.
Spectra-Tech / Nicolet 652 Glenbrook Road, P. O. Box 2190-G Stamford, CT 06906 (203)357-7055 Contact: Jerry Hare / John A. Reffner FT-IR Microscopes, Spectrometers, & Access.
SPI Supplies / Structure Probe, Inc. 569 E. Gay Street, P. O. Box 656 West Chester, PA 19381-0656 (800)242-4774 (215)436-5400 FAX: (215)436-5755 Contact: Kim Royer / Andrew Blackwood |
C. M. Taylor Co. 1140 Blair Avenue Sunnyvale, CA 94087 (408)245-4229 FAX: (408)732-1104 Contact: Ferren De Kildow / Dr. C. M. Taylor Microprobe Analysis, Taylor Multi-Element Std
Topcon Technologies, Inc. 6940 Koll Center Parkway Pleasanton, CA 94566-3100 (800)538-6850 (510)462-2212 FAX: (510)846-2803 Contact: Michael McCarthy / Frank Mannino Digital SEM and UHR Digital SEM & TEM
Topometrix Corporation 5403 Betsy RossDrive Santa Clara, CA 95054 (408)982-9700 FAX: (408)982-9751 Contact: Tony Abbis / Paul West Complete Line of Scanning Probe Microscopes
Carl Zeiss, Inc. Electron Optical Division One Zeiss Drive Thornwood, NY 10594 (800)356-1090 FAX: (800)681-7443 Contact: Paul Henry / Frank Coccla Transmission & Scanning Electron Microscopes |
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