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MicroNews
November/December 1995 Newsletter of the Microbeam Analysis Society | ||||||
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PRESIDENT'S MESSAGE
Dear Members:
As we begin the new year, it is useful to reflect on the two major changes taking place in the activities of our society. First, as you know from the previous issue of MicroNews, the Journal of Microbeam Analysis has now been incorporated into the Journal of the Microscopy Society of America. The various factors behind this decision have all been discussed before and I want now to look ahead to the next stages of this relationship. A key element in making this new arrangement the great success that it can be will be the position of the MAS Associate Editor of JMSA. I am very pleased that Charles Lyman of Lehigh University has agreed to accept this appointment. Charlie is just finishing his term as Director of MAS, has a long history of contribution to both our societies and in particular has been an important participant in the discussions and decisions regarding publication opportunities for our members. Under the overall leadership of Editor-in-Chief, Jean-Paul Revel, and Co-Editor, Ray Carpenter, and with the important role that Charlie Lyman will play as MAS Associate Editor, The Journal of the Microscopy Society of America, now incorporating Microbeam Analysis, should become one of the premier journals in the field. I urge you to give this journal your full support and particularly to consider it the first choice for publication of your most important publications relating to microscopy and microanalysis. Second, but equally important to the future of our Society, 1996 will be the first year of our long-term joint sponsorship with MSA as well as other societies, of the Microscopy and Microanalysis national meeting. This year Microscopy and Microanalysis 96 will be held in Minneapolis, Minnesota, August 11 to 15, 1996. As in the case of journal publication, the success of this new approach to our participation in the national joint meeting will be critically dependent on the role of a few individuals, in this case the MAS program representatives. Again, we are very fortunate in that Joe Michael (as MAS program chair) and Jon McCarthy (as MAS program co-chair) are providing the strong leadership that will insure that, in the new coordinated single program format, topics of particular interest to MAS will be |
well represented. I hope that you are already incorporating the Microscopy and Microanalysis 96 meeting into your summer plans. Scientifically and technically, I guarantee that you will not be disappointed, and as a native "Minnesotan", I can also assure you that it is a great place to visit, particularly with a family. In the context of the above two major changes, the MAS council is continuing to explore the most effective ways for the Society to be of service to its members. In particular, the future role and varied nature of MAS topical conferences will be an important item of discussion. The first such topical conference, under the leadership of John Mansfield will be held at the Microscopy & Microanalysis 96 meeting and will focus on the role of the World Wide Web in the Microanalytical Sciences. Watch for details in the program announcement. Finally, if you have concerns or observations about the above changes and particularly if you have suggestions regarding the future role of the Society, I strongly urge you to communicate them to me or any of the MAS Council members. This is an important time in the history of the Society. We need your input.
Dale E. Johnson President | |||||
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MAS MEMBERSHIP
VCH publishers no longer handles membership applications and renewals for MAS. Please do not use the old membership forms from 1995 and earlier. Bill Thompson is now handling membership and all applications and renewals should be sent to "Microbeam Analysis, PO Box 502, Fairport NY 14450". Membership services are still available at 1-800-4MASMEM or scott.wight@nist.gov to answer questions and solve problems. | ||||||
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PITTCON '96 March 3 - 8, 1996 Chicago, IL Contact: (412) 825-3220 (412) 825-3224 FAX
ARIZONA IMAGING & MICROANALYSIS SOCIETY (AIMS) ANNUAL MEETING AND 3RD IMAGING WORKSHOP March 12 - 15, 1996 Tucson, AZ Contact: Claire Payne Department of Microbiology and Immunology University of Arizona Tucson, AZ 85724 (520) 626-2870 (520) 626-2100 FAX cpayne@ccit.arizona.edu
MATERIALS RESEARCH SOCIETY (MRS) April 8 - 12, 1996 San Francisco, CA Contact: Materials Research Society 9800 McKnight Road Pittsburgh, PA 15237-6006 (412) 367-4373 FAX
SCANNING 96 April 9 - 12, 1996 Monterey, CA Contact: Mary K. Sullivan Scanning 96 P.O. Box 832 Mahwah, NJ 07430 (201) 818-1010 (201) 818-0086 FAX fams@holonet.net
18TH INTERNATIONAL CONFERENCE ON CEMENT MICROSCOPY (ICMA) April 21 - 25, 1996 Houston, TX Contact: Louis A. Jany (610) 926-1024 (610) 926-1906 FAX
JOINT APPALACHIAN REGIONAL MICROSCOPY SOCIETY (AREMS) / SOUTHEASTERN MICROSCOPY SOCIETY (SEMS) SPRING MEETING April 23 - 26, 1996 Greenville, SC Contact: JoAn Hudson Clemson EM Facility (803) 656-2465 (803) 656-0245 FAX hjoan@clemson.clemson.edu | ||||
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EDITOR'S NOTE
With this issue, I transfer the reigns of MicroNews Editor to Ryna Marinenko. Due to the incorporation of the Journal of Microbeam Analysis into the Journal of the Microscopy Society of America, MicroNews will once again be distributed to MAS members through special mailings 3 times per year. MicroNews can also be accessed on the World Wide Web (http://www-personal.engin.umich.edu/~jfmjfm/mas_folder/mashomepage.html). I have enjoyed being the MicroNews Editor for the past three years and look forward to serving the Microbeam Analysis Society in new ways in the years to come. Please direct your MicroNews comments and contributions to:
Ryna B. Marinenko National Institute of Standards and Technology Bldg. 222, Rm. A113 Gaithersburg, MD 20899 (301)975-3901 FAX: (301)216-1134 ryna.marinenko@nist.gov
Inga Holl Musselman MicroNews Editor | ||||
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MEETING AND SHORT COURSE CALENDAR
Meetings
WINTER WORKSHOP ON ELECTRON DIFFRACTION AND IMAGING OF SURFACES January 3 - 6, 1996 Scottsdale, AZ Contact: Mrs. Sharon Willison Center for Solid State Science Arizon State University Box 871704 Tempe, AZ 85287-1704
14th AUSTRALIAN CONFERENCE ON ELECTRON MICROSCOPY (ACEM-14) & 1ST MEETING OF THE INTERNATIONAL UNION OF MICROBEAM ANALYSIS (IUMAS) February 5 - 9, 1996 Sydney, Australia Contact: Maret Vesk ACEM-14 - microCOSMOPOLITAN E. M. Unit University of Sydney NSW 2006 (+61 2) 351 2351 (+61 2) 552 1967 maret@emu.su.oz.au | ||||
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SCANNING MICROSCOPY 1996 May 11 - 16, 1996 Bethesda, MD Contact: Scanning Microscopy International PO Box 66507 Chicago (A.M.F. O'Hare), IL 60666-0507 (708) 529-6677 (708) 980-6698 73211.647@compuserve.com
40TH INTERNATIONAL CONFERENCE ON ELECTRON, ION, AND PHOTON BEAM TECHNOLOGY AND NANOFABRICATION May 28 - 31, 1996 Atlanta, GA Contact: Don Tennant AT&T Bell Labs Rm. 4D-325 101 Crawford Corner Road Holmdel, NJ 07733 (908) 949-5007 (908) 949-8988 FAX dmt@hogpa.att.com
SURFACE ANALYSIS '96, 18TH SYMPOSIUM ON APPLIED SURFACE ANALYSIS (TOPICAL CONFERENCE) June 12 - 14, 1996 Ann Arbor, MI Contact: Steve Simko General Motors R&D Center Analytical Chemistry, Bldg. 1-6 30500 Mound Road Warren, MI 48090-9055 (810) 989-0810 (810) 986-0817 FAX simko@gmr.com
9TH INTERNATIONAL CONFERENCE ON QUANTITATIVE SURFACE ANALYSIS (TOPICAL CONFERENCE) July 15 - 19, 1996 Surrey, England Contact: Prof. J. E. Castle University of Surrey Dept. of Mtrls. Sci. and Engr. Guildford, Surrey GU2 5XH U.K. (44) 1483-259150 (44) 1483-259508 j.castle@surrey.ac.uk |
MICROSCOPY & MICROANALYSIS 96 Sponsored by MSA, MAS and MSC/SMC August 11 - 15, 1996 Minneapolis, MN Contact: MSA Business Office (508) 540-5594, (800) 538-3672 (508) 548-9053 FAX
AMERICAN VACUUM SOCIETY (AVS) 43RD NATIONAL SYMPOSIUM October 14 - 18, 1996 Philadelphia, PA Contact: AVS 120 Wall Street, 32nd Floor New York, NY 10005 (212) 248-0200 avsnyc@vacuum.org
MICROSCOPY & MICROANALYSIS 97 Cleveland, OH
Short Courses
PRACTICAL ASPECTS OF SCANNING ELECTRON MICROSCOPY (PASEM 96) March 18 - 22 , 1996 Session I March 25 - 29, 1996 Session II College Park, MD Contact: Tim Maugel University of Maryland Department of Zoology College Park, MD 20742 (301) 405-6896 (301) 314-9358 FAX
PROTOCOLS IN MICROSCOPIC IMAGING, IMMUNOCYTOCHEMISTRY AND IMAGE ANALYSIS June 4 - 7, 1996 Washington, DC Contact: Fred G. Lightfoot George Washington University (202) 994-2881 (202) 994-8885 FAX | |||
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LEHIGH MICROSCOPY COURSES SEM, X-RAY ANALYSIS, AEM, AFM June 10 - 14, 1996 SEM and X-Ray Microanalysis June 17 - 20, 1996 Advanced SEM, Quantitative X-Ray Microanalysis, AEM June 18 - 21, 1996 Atomic Force Microscopy and other Scanned Probe Microscopies Bethlehem, PA Contact: Professor David B. Williams Department of Materials Science and Engineering Lehigh University 5 E. Packer Avenue Bethlehem, PA 18015-3195 (610) 758-5133 (610) 758-4244 FAX interSEM@lehigh.edu
12TH ANNUAL SHORT COURSE ON MOLECULAR MICROSPECTROSCOPY June 24 - 28, 1996 Miami, FL Contact: Miami University (513) 529-2874 (513) 529-7284 FAX |
Microbeam Mass Spectrometry (Susan Mackay, Steve Brian)
Scanning Probe Microscoy: Instrumentation and Applications (Inga Musselman, Phil Russell)
Applications of Low Vacuum/Environmental SEM (John Mansfield, Stuart McKernan)
Microscopy and Microanalysis of Ceramics (C. B. Carter, John Bruley)
High Resolution Field Emission SEM in Materials Science (D. C. Joy, Jim Pawley)
Grain Boundary MicroEngineering (David A. Smith, Doug Perovic)
Joe Michael Program Committee | |||
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MAS TOUR SPEAKER SCHEDULE FOR 1995-1996 (as of 12/5/95)
AFFILIATED SPEAKER SPEAKER DATE REGIONAL 1 2 SOCIETY AIMS Mansfield McCarthy 3/14/96 AREMS not this year AusMAS (none) CanMAS (none) CleveMAS ? ? ? CoMAS McCarthy Bigelow Spring '96 IAS Mansfield 12/13/95 LSM 10/20/95 M2S Mansfield 10/25/95 M3S Mansfield Bigelow Spring '96 MAMAS Mansfield Bigelow April '96? MASSOC McCarthy Mansfield Spring '96 MEMS McCarthy Bigelow Spring '96 MIKMAS McCarthy Mansfield 11/10/95 MMS Mansfield* McCarthy Spring '96 MSORV Bigelow 3/22/96 NCSEMMA Mansfield Bigelow 9/96 3rd wk NESEM McCarthy Mansfield 12/6/95 NMMBUG ? ? Spring '96 OMS McCarthy Bigelow 4/5/96 SEMS not this year WestMAS Mansfield Bigelow early May '96 | ||||
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MICROSCOPY AND MICROANALYSIS 96 August 11 - 15, 1996 Microscopy and Microanalysis 96 is the title of the MAS/MSA joint meeting to be held in Minneapolis. The theme of the meeting is Challenges in Microscopy and Microanalysis. The Meeting Executive Committee consists of Nestor Zaluzec - Program Chair, Ruth Dimlich - program co-chair and Joe Michael - MAS Program co-chair. This is the first time that MAS and MSA will hold a joint meeting where there are no symposium specifically designated as MSA or MAS. We hope to present a much more coherent meeting in this way and to reduce the number of parallel sessions.
Here are some of the exciting symposium for the 1996 meeting:
MAS Presidential Symposium - Training the Scientists and Engineers of Tommorrow - The Changing Scene
Recent Advances in AEM for the Physical and Biological Sciences (Jim Bentley, Meredith Bond)
Optical and FT/IR Microscopy in Materials and Life Sciences (John Reffner, E. Neil Lewis)
High Resolution XRD and XRF (Brian York)
Bulk Specimen Microanalysis - Current Status and Prospects for the Future (John Small, Ian Anderson) | ||||
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MICROBEAM ANALYSIS SOCIETY
Budget for 1996* Income and Expense
INCOME Members Dues* (550 Regular, 32 Student, 9 Emeritus) $ 13875 Sustaining Members (41) 14350 Paper Award Reimbursement 1500 Investment Income (Schwab & Rochester Bank) 6000
Transfer from Assets/Investments 8775 _____ Total $ 44500
EXPENSE Computer (WWW Communications) 6000 Student Support at MAS '96 3500 Business and Solicitation Expenses (Thompson) 1000 Executive Council 11000 Winter Council and Annual Meeting Affiliates, Sustaining Members Dues Solicitation and Accounting Functions (Thompson) 1500 Nat'l Conference, Topical Sessions ('96, '97) 4000 Tour Speakers 6000 Paper Presentation Awards, MAS '95 1500 Bank Charges, VISA/MC 300 MicroNews Expenses 4000 IUMAS Tour Speaker & Student Travel 3000 Computer Workshop '96 2000 Insurance 700 _____ Total $ 44500
*Reflects decrease of dues to $25/regular member and other decisions from Council and Annual Business Meetings at MAS '95. ______________________________
NOTE: All dues and correspondence previously sent to VCH should now be directed to William S. Thompson, c/o Microbeam Analysis Society, P.O. Box 502, Fairport, NY 14450-0502. ______________________________ Revised 9/13/95 Harvey A. Freeman, Treasurer
958 Long Pond Road, Brewster, MA 02631 (508) 896-9060 | ||||
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MAS EXECUTIVE COUNCIL | ||||||
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President Dale E. Johnson Graduate School AG-10 University of Washington Seattle, WA 98195 (206)543-5900 FAX: (206)685-3234 dej@u.washington.edu
Past-President Jon McCarthy NORAN Instruments, Inc. 2551 W. Beltline Highway Middleton, WI 53562 (608)831-6511 FAX: (608)831-2313 jonm@noran.com |
Treasurer Harvey A. Freeman 958 Long Pond Road Brewster, MA 02631-1898 (508)896-9060 FAX: (508)432-8951 harvey.freeman@um.cc.umich.edu
Secretary David S. Simons National Institute of Standards and Technology Bldg. 222, Rm. A113 Gaithersburg, MD 20899 (301)975-3903 FAX: (301)216-1134 david.simons@nist.gov | |||||
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DIRECTORS | ||||||
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Joanna L. Batstone (1993-1995) IBM T. J. Watson Research Center P. O. Box 704 Yorktown Heights, NY 10598 (914)784-7674 FAX: (914)784-6324 joanna@watson.ibm.com
Charles E. Lyman (1993-1995) Department of Materials Science and Engineering 5 East Packer Avenue Lehigh University Bethlehem, PA 18015 (610)758-4249 FAX: (610)258-4244 cel1@lehigh.edu
Paul F. Hlava (1994-1996) Sandia National Laboratories Department 1822, MS-1405 Albuquerque, NM 87185-1405 (505)844-1890 FAX: (505)844-2974 pfhlava@sandia.gov |
Carol Swyt (1994-1996) National Institute of Standards and Technology Bldg 222, Rm. A113 Gaithersburg, MD 20899 (301) 975-3926 FAX: (301)216-1134 swyt@gapnet.nist.gov
Joseph D. Geller (1995-1997) 426e Boston Street Topsfield, MA 01983-1212 (508)887-7000 FAX: (508)887-7000 geller@world.std.com
John F. Mansfield (1995-1997) University of Michigan, North Campus EMAL, 413 SRB 2455 Hayward Ann Arbor, MI 48109-2143 (313)936-3352 FAX: (313)936-3352 jfmjfm@umich.edu | |||||
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ADDITIONAL MAS REPRESENTATIVES | ||||||
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Accountant, Dues and Mailing List William S. Thompson c/o Microbeam Analysis Society P.O. Box 502 Fairport, NY 14450-0502 (716)586-4985
Affiliated Regional Societies Paul Hlava (see Directors) (505)844-1890 FAX: (505)844-2974
Awards Committee for MAS 1996 Paul F. Hlava (see Directors) (505)844-1890 FAX: (505)844-2974 Carol Swyt (see Directors) (301) 975-3926 FAX: (301)216-1134 |
Computer Activities Committee John F. Mansfield (see Directors) (313)936-3352 FAX: (313)763-5567 Paul Carpenter paulc@arms.gps.caltech.edu (818)395-6126 FAX: (818)568-0935
Conference Proceedings Inventory C. Susskind San Francisco Press, Inc. Box 6800 San Francisco, CA 94101-6800 (510)524-1000 | |||||
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Corporate Liason Committee Thomas G. Huber JEOL (USA) Inc. 11 Dearborn Road Peabody, MA 01960 (508)535-5900 FAX:(508)536-2205
Education Committee Phillip E. Russell Department of Materials Science and Engineering P.O. Box 7916 North Carolina State University Raleigh, NC 27695-7916 (919)515-7501 FAX: (919)515-2932
Finance Committee, Archivist Gordon Cleaver GE Vallecitos Nuclear Center P. O. Box 460, MC V08 Pleasanton, CA 94566 (510)862-4320 FAX: (510)862-4244
Historian Art Chodos 302 Acorn Circle Monrovia, CA 91016-1807 (818)237-0183 artc@cco.caltech.edu
International Liaison David B. Williams Department of Materials Science and Engineering 5 East Packer Avenue Lehigh University Bethlehem, PA 18015-3195 (610)758-4224 FAX: (610)758-4244
Long Range Planning Committee John A. Small National Institute of Standards and Technology Bldg 222, Rm. A113 Gaithersburg, MD 20899 (301)975-3900 FAX: (301)216-1134 |
MAS-MSA Liason, Nominations and Presidents Award Dale Johnson (see President) (206)543-5900 FAX: (206)685-3234
Membership Services Scott Wight P.O. Box 3552 Gaithersburg, MD 20885 1-800-4-MASMEM scott.wight@nist.gov
Microbeam Analysis Journal Richard W. Linton, Editor-in-Chief Department of Chemistry - CB3290 University of North Carolina Chapel Hill, NC 27599-3290 (919)962-4619 FAX: (919)962-0488 rwl@ga.unc.edu
MicroNews Editor Inga Holl Musselman Chemistry Program, BE 26 University of Texas at Dallas P. O. Box 830688 Richardson, TX 75083-0688 (214)883-2706 FAX: (214)883-2925 imusselm@utdallas.edu
Sustaining Membership Committee Jack L. Worrall CEMMA 103 University of Southern California Los Angeles, CA 90089-0101 (213)740-1990 | |||
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HONORARY MEMBERS | ||||
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L. S. Birks (Deceased) I. B. Borovskii (Deceased) Raimond Castaing Arthur A. Chodos V. E. Cosslett (Deceased) Peter Duncumb Charles E. Fiori (Deceased) Theodore Hall K. F. J. Heinrich |
James Hillier L. L. Marton (Deceased) Robert E. Ogilvie Jean Philibert Stephen J. B. Reed Gunji Shinoda (Deceased) David B. Wittry Georges Slodzian | |||
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AFFILIATED REGIONAL SOCIETIES | ||||
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Full Name (Acronym) Contact Address Phone/FAX MAS Liaison Director
Appalachian Region Electron Microscopy Society (AREMS) Tom Richards (President) 3724 Merrifield Rd. Charlotte, NC 28211 (704)364-8219 totom@aol.com Swyt
Arizona Imaging and Microanalysis Society (AIMS) Claire Payne (President) Department of Micbiology & Immunology Room 6111 College of Medicine University of Arizona Tucson, AZ 85724 (520)626-2870 FAX: (520)626-2100 cpayne@ccit.arizona.edu Lyman
Canadian Microbeam Analysis Society (CanMAS) Rod Packwood MTL - Canmet - EMR 555 Booth Street Ottawa, Ontario K1A 091, Canada (613)992-2288 FAX: (613)992-8735 Swyt
Cleveland Microbeam Analysis Society (CleveMAS) James D. Eisner The Geon Co. Avon Lake Technical Center P. O. Box 122 Avon Lake, OH 44012 (216)930-1605 FAX: (216)930-1644 Swyt
Colorado Microbeam Analysis Society (CoMAS) Greg Meeker (MAS Rep) US Geological SurveyMS903 Denver Federal Center Box 25046 Denver, CO 80225 (303)236-1081 FAX: (303)236-1414 (303)236-3187 Probe Lab gmeeker@usgsprobe.cr.usgs.gov Geller |
Instrumental Analysis Society (IAS) Liz Goodwin (Secretary) R. J. Lee Instruments 515 Pleasant Valley Road Trafford, PA 15085 (412)744-0100 FAX: (412)744-0506 Lyman
Louisiana Society for Microscopy (LSM) Joe Mascorro (President) Department of Anatomy Tulane University - School of Medicine 1430 Tulane Avenue New Orleans, LA 70112 (504)584-2747 FAX: (504)584-1687 jmascor@mailhost.tcs.tulane.edu Lyman
Metropolitan Microscopy Society (M2S) Phillip L. Flaitz (Co-Chairman) IBM Analytical Services Group 1580 Route 52 - Z/E40 Hopewell Junction, NY 12533 (914)892-3094 FAX: (914)892-2555 pflaitz@vnet.ibm.com Batstone
Michigan Electron Microscopy Society (MEMS) John Blackson (President) MEMS President The Dow Chemical Company Building 1897 Midland MI 48667 (517)636-6316 FAX: (517)638-6443 blacksonjohn@dow.com Mansfield
Microbeam Analysis Society of Australia (AusMAS) Clive Nockolds Electron Microscope Unit University of Sydney Sydney, NSW, Australia 61-02-351-2351 FAX: 61-02-552-1967 clive@emu.su.oz.au Swyt
Microbeam Analysis Society of Southern California (MASSoC) Paul K. Carpenter (Treasurer) Department of Geology 170-25 Caltech Pasadena, CA 91125 (818)395-6126 FAX: (818)568-0935 paulc@arms.gps.caltech.edu Hlava | |||
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Microscopy Society of the Ohio River Valley (MSORV) Scott D. Walck Materials Directorate 2941 P St Ste 1 WL/MLBT, BLDG 654 Wright Patterson Air Force Base, OH 45433-7750 (513)255-5791 FAX: (513)255-2176 walcksd@ml.wpafb.af.mil Batstone
Mid-Atlantic Microbeam Analysis Society (MAMAS) Ryna Beth Marinenko National Institutes of Science and Technology Bldg. 222, Room A113 Gaithersburg, MD 20899 (301)975-3901 FAX: (301)216-1134 marinenko@gapnet.nist.gov Batstone
Midwest Microscopy and Microanalysis Society (M3S) Nestor J. Zaluzec Electron Microscopy for Materials Research Argonne National Laboratory Material Science Division - Bldg. 212 9700 South Cass Ave. Argonne, IL 60439 (708)252-5075 FAX: (708)252-4798 zaluzec@aaem.amc.anl.gov Mansfield
Minnesota Microscopy Society (MMS) Michael Coscio (MAS Representataive) C/O Medtronic Inc./Promeon Division 6700 Shingle Creek Drive Brooklyn Center, MN 55430 (612)569-1331 FAX: (612)569-1284 mike.coscio@medtronic.com Mansfield
Missouri-Illinois-Kansas Microbeam Analysis Society (MIKMAS) Donald Parker (Chairman) Monsanto Company 800 N. Lindbergh Blvd. Mail Zone U1E St. Louis, MO 63167 (314)694-4974 FAX: (314)694-6727 dlpark1@ccmail.monsanto.com Mansfield |
New England Society for Electron Microscopy (NESEM) Ms. Rebecca Stearns (President-Elect) New England Society for Electron Microscopy P. O. Box 5067 Billerica, MA 01822 (617)432-1667 FAX: (617)432-0014 stearreb@hsphsun2.harvard.edu Geller
New Mexico Microbeam Users Group (NMMBUG) Paul Frank Hlava Department 1822, MS-1405 Sandia National Laboratories Albuquerque, NM 87185-1405 (505)844-1890 FAX: (505)844-2974 pfhlava@sandia.gov Geller
North Carolina Society for Electron Microscopy and Microbeam Analysis (NCSEMMA) Phillip Russell Department of Materials Science and Engineering Campus Box 7916 North Carolina State University Raleigh, NC 27695-7916 (919)515-7501 FAX: (919)515-6965 prussell@ncsu.edu Swyt
Oklahoma Microscopy Society (OMS) Ginger Baker (Secretary-Treasurer) Department of PHSI 264 Veterinary Medicine Oklahoma State University Stillwater, OK 74078-0353 (405)744-6765 FAX: (405)744-8263 lizard@vms.ucc.okstate.edu Hlava
SouthEastern Microscopy Society (SEMS) W. Gray "Jay" Jerome (President) Department of Pathology Bowman Gray Medical School Wake Forest University Winston-Salem, NC 27157 (910)716-4972 FAX: (910)716-6174 jjerome@isnet.is.wfu.edu Swyt
West Coast Microbeam Analysis Society (WestMAS) Charles Gordon Cleaver, Jr. GE Vallecitos Nuclear Center PO Box 460 MC V08 Pleasanton, CA 94566 (510)862-4320 FAX: (510)862-4516 Hlava | |||
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SUSTAINING MEMBERS Our Sustaining Members Contribute Substantial Support to MAS | ||||
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4pi Analysis, Inc. 3500 Westgate Drive, Suite 403 Durham, NC 27707 (919)489-1757 FAX: (919)489-1487 Contact: Michael Czysz / Scott Davilla Mac-based EDS & Imaging, Hard- and Software
Advanced MicroBeam, Inc. 4217 C Kings-Graves Road, P. O. Box 610 Vienna, OH 44473 (216)394-1255 FAX: (216)394-1834 Contact: Donald P. Lesher Microprobe Service, Automation, Image Analysis
Amray, Inc. 160 Middlesex Turnpike Bedford, MA 01730 (617)275-1400 FAX: (617)275-0740 Contact: Kenneth Benoit / Sheldon Moll Manufacturer of Scanning Electron Microscopes
Cameca Instruments, Inc. 204 Spring Hill Road Trumbull, CT 06611-1356 (203)459-0623 FAX: (203)261-5506 Contact: Andrew Davis / Claude Conty EPMA, SIMS, Analytical SEM, and FE/Auger
Charles Evans & Associates 301 Chesapeake Drive Redwood City, CA 94063 (415)369-4567 Contact: Jeff Kingsley / Mike Edgell Service Analysis Lab., Mass Spec., RBS
Dapple Systems 355 West Olive, Suite 100 Sunnyvale, CA 94086 (408)733-3283 FAX: (408)736-2350 Contact: William Stewart EDS Systems, Image Capture and Analysis
Denton Vacuum, Inc. 1259 North Church Street Moorestown, NJ 08057 (609)439-9100 FAX: (609)439-9111 Contact: George Lutz / James L. Campbell Vacuum Coaters and Critical Point Dryers
EDAX International 91 McKee Drive Mahwah, NJ 07430 (210)529-6277 FAX: (201)529-3156 Contact: Tony Williams / Paul Oravetz Microanalysis Systems Utilizing PC or MAC |
Electron Microscopy Sciences / Diatome US 321 Morris Road, P. O. Box 251 Fort Washington, PA 19034 (800)523-5874 (215)646-1566 FAX: (215)646-8931 Contact: Carole March / Stacie Kirsch EM and LM Supplies and Diamond Knives
ETP-USA / Electron Detectors, Inc. 1650 Holmes Street, Building C Livermore, CA 94550 (510)449-8534 FAX: (510)449-8996 Contact: Robert J. Ruscica Robinson BSE Det. & Infrared Chamberview Sys.
FEI Company 7451 N.E. Evergreen Parkway Hillsboro, OR 97124-5830 (503)640-7500 FAX: (503)640-7509 Contact: Andree Kraker / Doug Rathkey LaB6 & CeB6 Tips, FIB & FIB/SEM Workstations
Fisons Instruments 24911 Avenue Stanford Valencia, CA 91355 (805)295-0019 FAX: (805)295-8714 Contact: Joe Robinson / Mike Davidson Energy-dispersive X-ray Analysis Systems
Gatan, Inc. 6678 Owens Drive Pleasanton, CA 94588-3334 (510)463-0200 FAX: (510)463-0204 Contact: Peter Swann / Christopher Byrne TEM Accessories and Specimen Prep. Equipment
Geller MicroAnalytical Laboratory 426E Boston Street Topsfield, MA 01983-1200 (800)MICRO-LL (508)887-7000 FAX: (508)887-6671 Contact: Joseph D. Geller / Charles Herrington EPMA,SEM/EDS,& Auger Services-EM Standards
Hessler Technical Services 44 Strawberry Hill Avenue, Suite 8G Stamford, CT 06902 (203)358-0266 FAX: (203)358-0266 Contact: Robert Hessler Sales and Marketing Representative
JEOL USA, Inc. 11 Dearborn Road Peabody, MA 01960 (508)535-5900 FAX: (508)536-2205 Contact: Robert Santorelli / Charles Nielsen EPMA, Auger, SEM, TEM, NMR, Mass Spec | |||
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RJ Lee Instruments Ltd. 515 Pleasant Valley Road Trafford, PA 15085 (412)744-0100 FAX:(412)744-0506 Contact: David Crawford / Dr. Fred Schamber PERSONAL SEM for failure analysis, QA, etc.
Lehigh University Materials Science Department 5 East Packer Avenue Bethlehem, PA 18015 (610)758-4249 FAX:(610)758-4244 Contact: David Williams / Charles Lyman Education in SEM, AEM, AFM, & Microanalysis
Leica, Inc. 111 Deer Lake Road Deerfield, IL 60015 (800)248-0123 (708)405-0123 FAX: (708)317-7268 Contact: Kevin Dauwalter / Norm Burns SEM, Optical, & Scanning Confocal Microscopes
Materials Analytical Services, Inc. 3597 Parkway Lane, Suite 250 Norcross, GA 30092 (800)421-8451 (404)448-3200 FAX: (404)368-8256 Contact: Mark Rigler / Bill Longo FTIR,EDXRF,S(TEM),SEM,FIB,STM&XRD Serv.
McCrone Associates, Inc. 850 Pasquinelli Drive Westmont, IL 60559 (708)887-7100 FAX: (708)887-7417 Contact: Kent L. Rhodes / John Gavrilovic Materials Characterization & Surface Analysis
Micron, Inc. 3815 Lancaster Pike Wilmington, DE 19805-1599 (302)998-1184 FAX: (302)998-1836 Contact: James F. Ficca, Jr. Analytical Services OM, SEM/EDS, TEM, & EPMA
Microspec Corporation 45950 Hotchkiss Street Fremont, CA 94539 (510)656-8820 FAX: (510)656-8944 Contact: Joseph Carr / William D. Donnelly Wavelength-Dispersive Spectrometers for SEMs
Nissei Sangyo America, Ltd. Hitachi Scientific Instruments 775 Ravendale Drive Mountain View, CA 94043 (415)969-1100 FAX: (415)961-0368 Contact: Donna Armanino / Hideo Naito SEM, TEM, & Field-Emission SEM and TEM |
NORAN Instruments, Inc. 2551 W. Beltline Highway Middleton, WI 53562 (608)831-6511 FAX: (608)836-7224 Contact: Gary Hawkinson / Mary Ales Microanalysis Systems & Confocal Microscopes
Osmic, Inc. 1788 Northwood Troy, MI 48084 (800)366-1299 (810)362-1290 FAX: (810)362-4043 Contact: Nick Grupido / George Gutman Multilayer Crystals for WDS Spectrometers
Oxford Instruments, Inc. Microanalysis Group 130 A Baker Avenue Ext. Concord, MA 01742-2204 (508)369-9933 FAX: (508)369-8287 Contact: Helen Corry / John Benson Link EDS Systems, EM Cryo Access., CL & BSD
Park Scientific Instruments 1171 Borregas Avenue Sunnyvalle, CA 94089 (408)747-1600 FAX: (408)747-1601 Contact: Dave Campbell / John Yarboro A Complete Line of Scanning Probe Microscopes
Physical Electronics Inc. 6509 Flying Cloud Drive Eden Prairie, MN 55344 (800)328-7515 (612)828-6100 FAX: (612)828-6322 Contact: Greg Carpenter Surface Analysis Inst., Auger, XPS, & SIMS
Philips Electronic Instruments 85 McKee Drive Mahwah, NJ 07430 (201)529-3800 Contact: Nathan Little / John S. Fahy XL Series SEMs and CM Series TEMs
Princeton Gamma-Tech 1200 State Road Princeton, NJ 08540 (609)924-7310 FAX: (609)924-1729 Contact: Doug Skinner EDS & Image Analysis for EM and OM
SEM / TEC Laboratories, Inc. 4824 South 35th Street Phoenix, AZ 85040 (602)276-6138 FAX: (602)276-4558 Contact: Sam Giallanza / Ed Holdsworth Materials & Failure Analysis Service Lab. | |||
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Small World P.O. Box 25284 San Mateo, CA 94402 (415)345-8013 FAX: (415)345-8013 Contact: Don Chernoff Electron Flight Simulator, EDS standards
Soft-Imaging Software Corporation 2102 Beach Court Goldon, CO 80401 (303)274-0341 FAX:(303)274-0341 Contact: Dr. Michael Bode Software & Hardware for Image Acquisition
Spectra-Tech / Nicolet 652 Glenbrook Road, P. O. Box 2190-G Stamford, CT 06906 (203)357-7055 FAX: (203)357-1713 Contact: Jerry Hare / John A. Reffner FT-IR Microscopes, Spectrometers, & Access.
SPI Supplies / Structure Probe, Inc. 569 E. Gay Street, P. O. Box 656 West Chester, PA 19381-0656 (800)242-4774 (610)436-5400 FAX: (610)436-5755 Contact: Kim Royer / Andrew Blackwood EM Prep. Equipment and Supplies / Service Lab
C. M. Taylor Co. 1140 Blair Avenue Sunnyvale, CA 94087 (408)245-4229 FAX: (408)732-1104 Contact: Ferren De Kildow / Dr. C. M. Taylor Microprobe Analysis, Taylor Multi-Element Std. |
Topcon Technologies, Inc. 65 West Century Road Paramus, NJ 07652 (201)261-9450 FAX: (201)387-2710 Contact: Michael McCarthy / Frank Mannino Digital SEM and UHR Digital SEM & TEM
Topometrix Corporation 5403 Betsy Ross Drive Santa Clara, CA 95054 (408)982-9700 FAX: (408)982-9751 Contact: Tony Abbis / Paul West Complete Line of Scanning Probe Microscopes
XEI Scientific 3124 Wesex Way Redwood City, CA 94061 (415)369-0133 Contact: Ronald Vane SEM-CLEAN Anti-contamination System for EM's
Carl Zeiss, Inc. Electron Optical Division One Zeiss Drive Thornwood, NY 10594 (800)356-1090 FAX: (914)681-7443 Contact: Paul Henry / Frank Coccla Transmission & Scanning Electron Microscopes | |||