Particles 2009 Presentations

Slides from the Particles 2009 Topical Conference

Particles 2009 was held at the McCrone School of Microscopy in April 2009. This page contains an archive of presentations from this event. We are grateful to the presenters for permitting their content to be made available here. Before reusing any of the content contained within the presentations please get permission from the author.

Author	Title
Bob Anderhalt	Improved Quantitative Analysis of Particles with Topography using Multiple EDS Detectors
Ian Anderson	Nanoparticle Characterization by Analytical Electron Microscope
John Armstrong	ZAF Corrections for Particle Analysis
Brian Bierman	Analysis and Classification of Environmental Samples Using ASPEX Automated P-SEM
K. L. Bunker, T. Lersch, J.P. Marquis, B.R. Stohmeier, G.S. Casuccio	Nanoparticles generated by Friction Stir Welding: First EM/EDS results
Paul Carpenter	Electron-Probe Microanalysis of Particles and Heterogeneous Materials
John Fournelle	Evaluating atmospheric particles - using EDS, WDS and EBSD
Kristofor Ingeneri	Observations Regarding Automated SEM and SIMS Analysis of Minerals
Heather Lowers	When worlds collide: Asbestos analysis in the regulatory, health, and mineralogical communities
J. J. McCarthy, F. E. Pfefferkorn, D. Bello, M. Powell, G. Haddad, K. L. Bunker	Nanoparticles generated by Friction Stir Welding: First EM/ EDS results
Dale Newbury	Exploiting the Speed of the Silicon Drift Detector to Open New Measurement Opportunities in Particle Analysis
Nicholas W. M. Ritchie	Using DTSA-II for Particle Analysis
Volker Rose	New Ways to See a Smaller World: The Hard X-ray Nanoprobe at Argonne National Laboratory
Craig Schwandt	Overview
Elaine F. Schumacher	Transmission Electron Microscopy for High Resolution Single-Particle Analysis
Joe Swider	Powder Micro X-ray Diffraction of Particles

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